TW324059B - Spectroscopic apparatus - Google Patents

Spectroscopic apparatus

Info

Publication number
TW324059B
TW324059B TW084105893A TW84105893A TW324059B TW 324059 B TW324059 B TW 324059B TW 084105893 A TW084105893 A TW 084105893A TW 84105893 A TW84105893 A TW 84105893A TW 324059 B TW324059 B TW 324059B
Authority
TW
Taiwan
Prior art keywords
detector
spectrum
optical path
light
optical input
Prior art date
Application number
TW084105893A
Other languages
English (en)
Inventor
John Edward Smith Brian
Neville Batchelser David
Justin Baldwin Kurt
Original Assignee
Renishaw Plc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw Plc filed Critical Renishaw Plc
Application granted granted Critical
Publication of TW324059B publication Critical patent/TW324059B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36—Investigating two or more bands of a spectrum by separate detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW084105893A 1994-05-24 1995-06-09 Spectroscopic apparatus TW324059B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9410395A GB9410395D0 (en) 1994-05-24 1994-05-24 Spectroscopic apparatus

Publications (1)

Publication Number Publication Date
TW324059B true TW324059B (en) 1998-01-01

Family

ID=10755636

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084105893A TW324059B (en) 1994-05-24 1995-06-09 Spectroscopic apparatus

Country Status (9)

Country Link
US (1) US5638173A (zh)
EP (1) EP0711408B1 (zh)
JP (1) JP3660680B2 (zh)
KR (1) KR960704216A (zh)
DE (1) DE69514485T2 (zh)
GB (1) GB9410395D0 (zh)
TW (1) TW324059B (zh)
WO (1) WO1995032408A1 (zh)
ZA (1) ZA954234B (zh)

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DE19735205A1 (de) * 1997-08-14 1999-02-25 Gustav Prof Dr Techn Schweiger Verfahren zur spektroskopischen Rußmessung
DE19902625A1 (de) * 1998-01-28 1999-09-30 Leica Microsystems Vorrichtung zur gleichzeitigen Detektion mehrerer Spektralbereiche eines Lichtstrahls
US6885445B2 (en) 1998-05-09 2005-04-26 Renishaw Plc Electron microscope and spectroscopy system
WO1999058939A1 (en) * 1998-05-09 1999-11-18 Renishaw Plc Electron microscope and spectroscopy system
US6337472B1 (en) * 1998-10-19 2002-01-08 The University Of Texas System Board Of Regents Light imaging microscope having spatially resolved images
JP2000283960A (ja) * 1999-03-31 2000-10-13 Shimadzu Corp マイクロチップ電気泳動装置
US6351306B1 (en) 1999-10-19 2002-02-26 Kaiser Optical Systems, Inc. Optical measurement probe calibration configurations
US6690467B1 (en) 2000-05-05 2004-02-10 Pe Corporation Optical system and method for optically analyzing light from a sample
US6967717B1 (en) * 2000-06-14 2005-11-22 The United States Of America As Represented By The Secretary Of The Navy Thermo-electrically cooled surface enhanced Raman spectroscopy sensor system
US6958811B2 (en) 2000-06-29 2005-10-25 Carl Zeiss Jena Gmbh Method for the detection of dyes in fluorescence microscopy
US6747737B2 (en) 2000-06-29 2004-06-08 Carl Zeiss Jena Gmbh Method for optical detection of an illuminated specimen in a plurality of detection channels
US6858852B2 (en) 2000-08-08 2005-02-22 Carl Zeiss Jena Gmbh Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy
US6947133B2 (en) * 2000-08-08 2005-09-20 Carl Zeiss Jena Gmbh Method for increasing the spectral and spatial resolution of detectors
US6670087B2 (en) * 2000-11-07 2003-12-30 Canon Kabushiki Kaisha Toner, image-forming apparatus, process cartridge and image forming method
JP2003121361A (ja) * 2001-10-11 2003-04-23 Mitsubishi Heavy Ind Ltd レーザ光を用いた微量成分測定方法及びその装置
US6788407B1 (en) 2002-03-18 2004-09-07 Itt Manufacturing Enterprises, Inc. Laser interrogation of surface agents
US20050182328A1 (en) * 2002-08-09 2005-08-18 Hamamatsu Photonics K.K. System enabling chromaticity measurement in the visible and invisible ranges
DE102004026373B4 (de) * 2004-05-29 2008-04-17 Eads Astrium Gmbh Verfahren und Vorrichtung zur Detektierung optischer Spektren
US7667882B2 (en) * 2004-10-12 2010-02-23 Georgia Tech Research Corp. Fourier transform volume holographic spectrometer
EP3505052A1 (en) * 2005-04-25 2019-07-03 University of Massachusetts Systems and methods for correcting optical reflectance measurements
JP4642621B2 (ja) * 2005-09-29 2011-03-02 株式会社フォトンデザイン 分光装置
US7397561B2 (en) * 2005-11-07 2008-07-08 Wafermasters, Incorporated Spectroscopy system
US7564547B2 (en) 2005-11-07 2009-07-21 Wafermasters, Inc. Spectroscopy system
IL173025A0 (en) * 2006-01-09 2007-03-08 Oren Aharon A method and apparatus for high resolution spectroscopy
WO2008005525A2 (en) * 2006-07-06 2008-01-10 Thomas Richard A High speed spectrum analyzer
DE102006047913B4 (de) * 2006-10-06 2013-08-08 Carl Zeiss Microscopy Gmbh Hochempfindliche spektralanalytische Einheit
WO2008054908A2 (en) * 2006-10-30 2008-05-08 Georgia Tech Research Corporation Tandem fabry-perot etalon cylindrical beam volume hologram for high resolution/large spectral range diffuse light spectroscopy
US8077309B2 (en) * 2007-01-29 2011-12-13 Applied Instrument Technologies, Inc. Chemical analyzer for industrial process control
JP2010169493A (ja) * 2009-01-22 2010-08-05 National Institute Of Advanced Industrial Science & Technology 分光放射計
US8922768B2 (en) * 2010-10-04 2014-12-30 Wasatch Photonics, Inc. Multi-path spectrometer
FR2969282B1 (fr) * 2010-12-21 2014-07-18 Horiba Jobin Yvon Sas Dispositif et procede de visualisation et de mesure de diffusion raman
JP5787151B2 (ja) * 2011-08-26 2015-09-30 株式会社ニコン 分光ユニット及び走査型顕微鏡
US8334975B1 (en) * 2011-09-26 2012-12-18 Raytheon Company Integrated 3-channel gas detection and measurement spectrometer
JP6311267B2 (ja) * 2013-05-10 2018-04-18 株式会社リコー 分光特性取得装置、画像評価装置、画像形成装置
JP6248577B2 (ja) * 2013-11-26 2017-12-20 日本電気株式会社 スリット幅変更装置及び方法並びにスペクトル出力装置
US20150346102A1 (en) * 2014-06-03 2015-12-03 Innovative Photonic Solutions, Inc. Compact Raman Probe Integrated with Wavelength Stabilized Diode Laser Source
GB201415238D0 (en) * 2014-08-28 2014-10-15 Renishaw Plc Spectroscopy apparatus
DE112014007080B4 (de) * 2014-12-22 2021-09-09 Spectro Analytical Instruments Gmbh Gitterspektrometer mit umschaltbarem Lichtweg
WO2017184109A1 (en) * 2016-04-18 2017-10-26 Hewlett-Packard Development Company, L.P. Simultaneous detection of multiple spectra of scattered radiation
WO2020174239A1 (en) 2019-02-27 2020-09-03 Renishaw Plc Spectroscopic apparatus
US11280675B2 (en) * 2019-06-18 2022-03-22 Ruolin Li Method, system and apparatus for a Raman spectroscopic measurement system
JP2022071291A (ja) * 2020-10-28 2022-05-16 キヤノン株式会社 識別装置

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US2453164A (en) * 1945-05-19 1948-11-09 Lane Wells Co Plural grating spectrograph
US3791737A (en) * 1971-06-18 1974-02-12 A Johansson Spectrometer in which a desired number of spectral lines are focused at one fixed output slit
US3733131A (en) * 1971-08-05 1973-05-15 Perkin Elmer Ltd Optical beam switching devices utilizing a pair of plane mirrors
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FI90289C (fi) * 1992-04-08 1994-01-10 Valtion Teknillinen Optinen komponentti
DE4223212C2 (de) * 1992-07-15 1999-03-18 Bodenseewerk Perkin Elmer Co Gitter-Polychromator
US5442439A (en) * 1993-04-21 1995-08-15 Kaiser Optical Systems, Inc. Spectrograph with multiplexing of different wavelength regions onto a single opto-electric detector array
US5424826A (en) * 1993-07-30 1995-06-13 Control Development, Inc. Wideband optical micro-spectrometer system

Also Published As

Publication number Publication date
DE69514485D1 (de) 2000-02-17
EP0711408B1 (en) 2000-01-12
DE69514485T2 (de) 2000-08-24
EP0711408A1 (en) 1996-05-15
JPH09500970A (ja) 1997-01-28
JP3660680B2 (ja) 2005-06-15
GB9410395D0 (en) 1994-07-13
US5638173A (en) 1997-06-10
ZA954234B (en) 1996-01-22
WO1995032408A1 (en) 1995-11-30
KR960704216A (ko) 1996-08-31

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