JPH0816684B2 - 波形表示装置 - Google Patents

波形表示装置

Info

Publication number
JPH0816684B2
JPH0816684B2 JP62254525A JP25452587A JPH0816684B2 JP H0816684 B2 JPH0816684 B2 JP H0816684B2 JP 62254525 A JP62254525 A JP 62254525A JP 25452587 A JP25452587 A JP 25452587A JP H0816684 B2 JPH0816684 B2 JP H0816684B2
Authority
JP
Japan
Prior art keywords
data
waveform
signal
address
mpu
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62254525A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63108267A (ja
Inventor
ブライアン・エバンス・バトソン
Original Assignee
テクトロニックス・インコーポレイテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by テクトロニックス・インコーポレイテッド filed Critical テクトロニックス・インコーポレイテッド
Publication of JPS63108267A publication Critical patent/JPS63108267A/ja
Publication of JPH0816684B2 publication Critical patent/JPH0816684B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/28—Circuits for simultaneous or sequential presentation of more than one variable

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Controls And Circuits For Display Device (AREA)
  • Electrophonic Musical Instruments (AREA)
  • Digital Computer Display Output (AREA)
JP62254525A 1986-10-09 1987-10-08 波形表示装置 Expired - Fee Related JPH0816684B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/917,629 US4809189A (en) 1986-10-09 1986-10-09 Equivalent time waveform data display
US917,629 1986-10-09

Publications (2)

Publication Number Publication Date
JPS63108267A JPS63108267A (ja) 1988-05-13
JPH0816684B2 true JPH0816684B2 (ja) 1996-02-21

Family

ID=25439080

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62254525A Expired - Fee Related JPH0816684B2 (ja) 1986-10-09 1987-10-08 波形表示装置

Country Status (4)

Country Link
US (1) US4809189A (de)
EP (1) EP0264162B1 (de)
JP (1) JPH0816684B2 (de)
DE (1) DE3779718T2 (de)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5081592A (en) * 1987-08-05 1992-01-14 Tektronix, Inc. Test system for acquiring, calculating and displaying representations of data sequences
US4924307A (en) * 1988-06-03 1990-05-08 Allen-Bradley Company, Inc. Image processor
US4979122A (en) * 1989-02-01 1990-12-18 Ge Fanuc Automation North America Inc. Apparatus and method for monitoring power
US5065147A (en) * 1989-05-17 1991-11-12 Hewlett-Packard Company Method and apparatus for simulating analog display in digital display test instrument
US5066909A (en) * 1990-01-30 1991-11-19 Hewlett-Packard Company Apparatus for testing an electronic circuit having an arbitrary output waveform
JPH0727447B2 (ja) * 1990-07-05 1995-03-29 富士ゼロックス株式会社 ハイパーメディア装置
JP2555786Y2 (ja) * 1990-11-02 1997-11-26 株式会社ケンウッド 多チャンネルデータ同時転送表示装置
JPH04175662A (ja) * 1990-11-08 1992-06-23 Kenwood Corp デジタルストレージオシロスコープ
US5254983A (en) * 1991-02-05 1993-10-19 Hewlett-Packard Company Digitally synthesized gray scale for raster scan oscilloscope displays
US5283596A (en) * 1991-02-05 1994-02-01 Hewlett-Packard Company Digitally synthesized gray scale for raster scan oscilloscope color display of overlapping multichannel waveforms
US5115189A (en) * 1991-02-06 1992-05-19 Hewlett-Packard Company Anti-aliasing dithering method and apparatus for low frequency signal sampling
US5337403A (en) * 1991-09-18 1994-08-09 Klingman Edwin E Digital signal processing method and apparatus including a graphic template display
US5321799A (en) * 1992-04-17 1994-06-14 Proxim, Inc. Signalling transition control in a modulated-signal communications system
US5471401A (en) * 1992-09-09 1995-11-28 Basic Measuring Instruments, Inc. Waveform library for characterizing an AC power line spectrum
US5412579A (en) * 1993-04-05 1995-05-02 Tektronix, Inc. Slow display method for digital oscilloscope with fast acquisition system
US5446650A (en) * 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction
JP2959960B2 (ja) * 1994-06-08 1999-10-06 シャープ株式会社 複数グラフ表示機能付き情報処理装置
US5684508A (en) * 1995-11-21 1997-11-04 Fluke Corporation Method of displaying continuously acquired data as multiple traces on a fixed length display
US5949399A (en) * 1996-02-12 1999-09-07 Snap-On Technologies, Inc. Electronic signal measurement apparatus for the acquisition and display of short-duration analog signal events
US6181320B1 (en) 1998-08-19 2001-01-30 International Business Machines Corporation Method for converting timing diagram into timing graph and vice versa
JP2002014124A (ja) * 2000-06-29 2002-01-18 Ando Electric Co Ltd 掃引同調試験装置及びその最適制御設定値シミュレーション方法。
US6895349B2 (en) * 2000-11-09 2005-05-17 Tektronix, Inc. Gate comparator
US6885953B2 (en) * 2000-11-17 2005-04-26 Lecroy Corporation Oscilloscope panel capture and implementation
GB0031596D0 (en) * 2000-12-22 2001-02-07 Barbara Justin S A system and method for improving accuracy of signal interpretation
US6952655B2 (en) * 2001-12-11 2005-10-04 Lecroy Corporation User defined processing function
JP2005189215A (ja) * 2003-12-26 2005-07-14 Fanuc Ltd 波形表示装置
TW200734878A (en) * 2006-03-06 2007-09-16 Realtek Semiconductor Corp Data access apparatus with multiple buses and method thereof
US20080243406A1 (en) * 2007-03-27 2008-10-02 Lecroy Corporation Temporally aligned waveform processing
JP2010019772A (ja) * 2008-07-14 2010-01-28 Yokogawa Electric Corp Ｌｓｉテスタ
AR073128A1 (es) * 2008-08-26 2010-10-13 Spx Corp Modulo de osciloscopio digital
AR073129A1 (es) * 2008-08-26 2010-10-13 Spx Corp Modulo de osciloscopio digital con deteccion de fallas en la recepcion de la senal.
JP2011203070A (ja) * 2010-03-25 2011-10-13 Yokogawa Electric Corp 波形測定装置および半導体試験装置
US10228394B2 (en) * 2016-02-29 2019-03-12 Keysight Technologies, Inc. Measurement system that stores pre- and post-qualification signal data

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3772679A (en) * 1970-06-15 1973-11-13 Honeywell Inc Precessing analog trace display
US4319339A (en) * 1976-06-11 1982-03-09 James Utzerath Line segment video display apparatus
US4041468A (en) * 1976-10-07 1977-08-09 Pfizer Inc. Method and system for analysis of ambulatory electrocardiographic tape recordings
FR2414235A1 (fr) * 1978-01-10 1979-08-03 Aerazur Const Electro Procede de depouillement sur oscilloscope de trains de signaux normalement repetitifs
US4225940A (en) * 1978-10-02 1980-09-30 Tektronix, Inc. Oscilloscope system for acquiring, processing, and displaying information
US4283713A (en) * 1979-01-15 1981-08-11 Tektronix, Inc. Waveform acquisition circuit
US4507740A (en) * 1981-09-08 1985-03-26 Grumman Aerospace Corporation Programmable signal analyzer
US4510571A (en) * 1981-10-08 1985-04-09 Tektronix, Inc. Waveform storage and display system
IT1159785B (it) * 1982-04-23 1987-03-04 Breton Spa Telaio portalame con pacco di lame estraibile in blocco nelle macchine per segare marmi, graniti o pietre dure
US4495586A (en) * 1982-07-29 1985-01-22 Tektronix, Inc. Waveform acquisition apparatus and method
US4540938A (en) * 1983-01-21 1985-09-10 Tektronix, Inc. Displaying waveforms
US4578667A (en) * 1984-03-23 1986-03-25 Tektronix, Inc. Digital acquisition system including a high-speed sampling gate
JPS60212797A (ja) * 1984-04-06 1985-10-25 株式会社アドバンテスト 画像情報発生装置
US4701863A (en) * 1984-12-14 1987-10-20 Honeywell Information Systems Inc. Apparatus for distortion free clearing of a display during a single frame time
EP0206518A3 (de) * 1985-06-20 1988-01-07 Tektronix, Inc. Vertikaler Raster-Abtastregler
US4654584A (en) * 1985-12-12 1987-03-31 Analogic Corporation High-speed precision equivalent time sampling A/D converter and method
US4694244A (en) * 1986-02-21 1987-09-15 Hewlett Packard Company Apparatus for random repetitive sampling
US4678345A (en) * 1986-05-01 1987-07-07 Tektronix, Inc. Equivalent time pseudorandom sampling system
US4719416A (en) * 1986-11-10 1988-01-12 Hewlett Packard Company Method for determining the minimum number of acquisition sweeps to meet the risetime specifications of a digital oscilloscope

Also Published As

Publication number Publication date
DE3779718T2 (de) 1993-02-04
EP0264162B1 (de) 1992-06-10
US4809189A (en) 1989-02-28
DE3779718D1 (de) 1992-07-16
JPS63108267A (ja) 1988-05-13
EP0264162A1 (de) 1988-04-20

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