JPH06503855A - 回転マグネトロンスパッタリングシステムにおけるアーク抑制のためのシールディング - Google Patents
回転マグネトロンスパッタリングシステムにおけるアーク抑制のためのシールディングInfo
- Publication number
- JPH06503855A JPH06503855A JP3515608A JP51560891A JPH06503855A JP H06503855 A JPH06503855 A JP H06503855A JP 3515608 A JP3515608 A JP 3515608A JP 51560891 A JP51560891 A JP 51560891A JP H06503855 A JPH06503855 A JP H06503855A
- Authority
- JP
- Japan
- Prior art keywords
- tubular member
- sleeve
- cathode body
- collar
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001755 magnetron sputter deposition Methods 0.000 title claims description 3
- 230000001629 suppression Effects 0.000 title description 3
- 239000000463 material Substances 0.000 claims description 55
- 239000013077 target material Substances 0.000 claims description 37
- 238000004544 sputter deposition Methods 0.000 claims description 31
- 238000000576 coating method Methods 0.000 claims description 25
- 239000011248 coating agent Substances 0.000 claims description 21
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
- 238000002844 melting Methods 0.000 claims description 10
- 230000008018 melting Effects 0.000 claims description 10
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 10
- 229910052715 tantalum Inorganic materials 0.000 claims description 10
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 10
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 8
- 239000000758 substrate Substances 0.000 claims description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 7
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 7
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 7
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000010703 silicon Substances 0.000 claims description 7
- 229910052719 titanium Inorganic materials 0.000 claims description 7
- 239000010936 titanium Substances 0.000 claims description 7
- 229910052726 zirconium Inorganic materials 0.000 claims description 7
- 239000003086 colorant Substances 0.000 claims description 6
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 5
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 5
- 229910052804 chromium Inorganic materials 0.000 claims description 5
- 239000011651 chromium Substances 0.000 claims description 5
- 229910017052 cobalt Inorganic materials 0.000 claims description 5
- 239000010941 cobalt Substances 0.000 claims description 5
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 5
- 238000000151 deposition Methods 0.000 claims description 5
- 229910052735 hafnium Inorganic materials 0.000 claims description 5
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 claims description 5
- 229910052741 iridium Inorganic materials 0.000 claims description 5
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 claims description 5
- 229910052750 molybdenum Inorganic materials 0.000 claims description 5
- 239000011733 molybdenum Substances 0.000 claims description 5
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 229910052697 platinum Inorganic materials 0.000 claims description 5
- 229910052703 rhodium Inorganic materials 0.000 claims description 5
- 239000010948 rhodium Substances 0.000 claims description 5
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims description 5
- 229910052706 scandium Inorganic materials 0.000 claims description 5
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 claims description 5
- 229910052720 vanadium Inorganic materials 0.000 claims description 5
- 230000008021 deposition Effects 0.000 claims description 4
- 229910052742 iron Inorganic materials 0.000 claims description 4
- 238000010943 off-gassing Methods 0.000 claims description 4
- 239000010409 thin film Substances 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 239000010937 tungsten Substances 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims 4
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 claims 4
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims 4
- 229910001128 Sn alloy Inorganic materials 0.000 claims 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims 2
- 229910001297 Zn alloy Inorganic materials 0.000 claims 2
- 239000011701 zinc Substances 0.000 claims 2
- YPFNIPKMNMDDDB-UHFFFAOYSA-K 2-[2-[bis(carboxylatomethyl)amino]ethyl-(2-hydroxyethyl)amino]acetate;iron(3+) Chemical compound [Fe+3].OCCN(CC([O-])=O)CCN(CC([O-])=O)CC([O-])=O YPFNIPKMNMDDDB-UHFFFAOYSA-K 0.000 claims 1
- 239000003292 glue Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 239000007789 gas Substances 0.000 description 17
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 15
- 239000010408 film Substances 0.000 description 15
- 238000005546 reactive sputtering Methods 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 235000012239 silicon dioxide Nutrition 0.000 description 7
- 239000000377 silicon dioxide Substances 0.000 description 7
- 239000000498 cooling water Substances 0.000 description 6
- 238000007789 sealing Methods 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000012212 insulator Substances 0.000 description 5
- 238000009825 accumulation Methods 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000003628 erosive effect Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 239000000615 nonconductor Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000004677 Nylon Substances 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 229920001778 nylon Polymers 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- 229910001928 zirconium oxide Inorganic materials 0.000 description 2
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- 241000287462 Phalacrocorax carbo Species 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 239000005328 architectural glass Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 238000009395 breeding Methods 0.000 description 1
- 230000001488 breeding effect Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011572 manganese Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000011120 plywood Substances 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 235000021419 vinegar Nutrition 0.000 description 1
- 239000000052 vinegar Substances 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/0203—Protection arrangements
- H01J2237/0206—Extinguishing, preventing or controlling unwanted discharges
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (27)
- 1.ガス放出を使用して、基板上に選択されたコーティング材料の薄膜をスパッ タするための回転円筒状マグネトロンスパッタ装置であって、排気可能なコーテ ィングチャンバと、その表面にターゲット材料の層を有しかつその長さ方向に沿 ってかつその円周的に比較的狭い領域に沿って延びるスパッタ領域を有する長尺 の円筒状管状部材を含むカソードを含み、前記スパッタ領域が前記管状部材の周 りにかつその長さ方向に沿って浸食領域を規定し、前記コーティングチャンバ内 で前記管状部材を回転自在に支持するための手段と、スパッタされた材料を受け るべくスパッタ領域をすぎて物体を輸送するための手段と、前記管状部材の少な くとも一方端上にアークを抑制するための手段を含む、装置。
- 2.前記アーク抑制手段が前記管状部材の一方端の周りに導電性材料からなる少 なくとも1つのカラーを含み、前記カラーが前記管状部材の一方端と実質的に同 じ高さの端部と、前記管状部材の一方端上およびその支持構造上のコーティング 材料の堆積を最小限にするのに十分な距離浸食領域に延びる他方端を有する、請 求項1に記載の装置。
- 3.アーク抑制手段が少なくとも1つの円筒状スリーブと、前記スリーブが、カ ソード暗黒部の長さより短い空隙を間に有して前記カラーの周りに実質的に同心 的に配置されるように前記スリーブを装着するための手段とをさらに含み、前記 スリーブが少なくとも1つの暗黒部の長さにわたって前記カソードに沿って延び る、請求項2に記載の装置。
- 4.前記スリーブがカソードのための支持手段上に装着される、請求項3に記載 の装置。
- 5.前記スリーブが前記支持手段から電気的に分離されている、請求項4に記載 の装置。
- 6.前記スリーブがカソード上に装着されかつそこから電気的に分離されている 、請求項3に記載の装置。
- 7.前記カラーがその円周に盛り上がった部分を有して前記スリーブ上へのコー ティング材料の堆積を最小限にする、請求項3に記載の装置。
- 8.前記管状部材の直径が前記スリーブにより覆われる端部で縮小されてその間 の空隙におけるコーティング材料の堆積を最小限にする、請求項3に記載の装置 。
- 9.スパッタされる材料がシリコン、アルミニウム、ジルコニウム、タンタル、 ならびに錫および亜鉛の合金から本質的になるグループから選択される、請求項 2に記載の装置。
- 10.カラー材料がスカンジウム、チタン、バナジウム、クロム、マンガン、鉄 、コバルト、ニッケル、ジルコニウム、モリブデン、ハフニウム、タンタル、タ ングステン、ロジウム、プラチナ、およびイリジウムから本質的になるグループ から選択される、請求項9に記載の装置。
- 11.管状部材がその各端部にカラーを有する、請求項2に記載の装置。
- 12.スパッタされる材料が低融点材料である、請求項1または2に記載の装置 。
- 13.カラー材料がスカンジウム、チタン、バナジウム、クロム、マンガン、鉄 、コバルト、ニッケル、ジルコニウム、モリブデン、ハフニウム、タンタル、タ ングステン、ロジウム、プラチナ、およびイリジウムから本質的になるグループ から選択される、請求項12に記載の装置。
- 14.マグネトロンがカソード体の長さ方向に沿ってかつ円周をその比較的狭い 領域に沿って延びるスパッタ領域を提供し、その外側表面にターゲット材料を有 する長尺の管状部材と、前記管状部材の少なくとも一方端上にその前記一方端か ら前記スパッタ領域内へ前記管状部材の長さ方向に沿って延びる導電性材料のカ ラーとを含む、回転円筒状マグネトロンのためのカソード体。
- 15.カラーがその円周に盛り上がったセクションを有する、請求項14に記載 のカソード体。
- 16.前記管状部材がその少なくとも一方端で縮小された直径を有する、請求項 14に記載のカソード体。
- 17.管状部材がその各端部で縮小された直径を有する、請求項14に記載のカ ソード体。
- 18.前記カラーが縮小された直径の形に沿う、請求項16または17に記載の カソード体。
- 19.前記カラーが前記管状部材の各端部に位置する、請求項14または15に 記載のカソード体。
- 20.前記ターゲット材料がシリコン、アルミニウム、ジルコニウム、タンタル 、ならびに錫および亜鉛の合金から本質的に構成されるグループから選択される 、請求項14、15、16、または17に記載のカソード体。
- 21.前記カラーがスカンジウム、チタン、バナジウム、クロム、マンガン、鉄 、コバルト、ニッケル、ジルコニウム、モリブデン、ハフニウム、タンタル、タ ングステン、ロジウム、プラチナ、およびイリジウムから本質的になるグループ から選択される材料から形成される、請求項20に記載のカソード体。
- 22.前記ターゲット材料が約700℃を下回る融点を有する金属である、請求 項14、15、16、または17に記載のカソード体。
- 23.前記カラーが、スカンジウム、チタン、バナジウム、クロム、マンガン、 鉄、コバルト、ニッケル、ジルコニウム、モリブデン、ハフニウム、タンタル、 タングステン、ロジウム、プラチナ、およびイリジウムから本質的になるグルー プから選択される材料で製作される、請求項22に記載のカソード体。
- 24.排気可能なコーティングチャンバ内にカソード体を回転自在に装着するた めの手段をさらに含む、請求項14に記載のカソード体。
- 25.前記管状部材端部の一方がスリーブ内に適合する、請求項14に記載のカ ソード体。
- 26.選択されたコーティング材料の薄膜をスパッタするための回転円筒状マグ ネトロンであって、その長さ方向および円周を比較的狭い領域に沿って延びるス パッタ領域を規定するための磁気手段を含む長尺の管状部材と、前記管状部材の 少なくとも一方端上にありかつ前記管状部材の円周に延びる導電性材料からなる カラーとを含み、前記カラーが前記一方端から前記スパッタ領域内に延びる、マ グネトロン。
- 27.前記管状部材の少なくとも一方端の円周に延びる導電性材料からなるスリ ーブをさらに含み、前記スリーブが少なくとも1つの暗黒部の長さにわたって前 記管状部材に沿って延びる請求項26に記載の回転円筒状マグネトロン。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US56592190A | 1990-08-10 | 1990-08-10 | |
US565,921 | 1990-08-10 | ||
PCT/US1991/005304 WO1992002659A1 (en) | 1990-08-10 | 1991-07-31 | Shielding for arc suppression in rotating magnetron sputtering systems |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06503855A true JPH06503855A (ja) | 1994-04-28 |
JP3516949B2 JP3516949B2 (ja) | 2004-04-05 |
Family
ID=24260647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51560891A Expired - Lifetime JP3516949B2 (ja) | 1990-08-10 | 1991-07-31 | 回転マグネトロンスパッタリングシステムにおけるアーク抑制のためのシールディング |
Country Status (5)
Country | Link |
---|---|
US (2) | US5470452A (ja) |
EP (1) | EP0543931A4 (ja) |
JP (1) | JP3516949B2 (ja) |
CA (1) | CA2089149C (ja) |
WO (1) | WO1992002659A1 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008517150A (ja) * | 2004-10-18 | 2008-05-22 | ベーカート・アドヴァンスト・コーティングス | 回転可能なスパッタリングターゲットを支持する平面エンドブロック |
JP2008533297A (ja) * | 2005-03-11 | 2008-08-21 | ベーカート・アドヴァンスト・コーティングス | 単一の直角エンドブロック |
JP2009513818A (ja) * | 2003-07-04 | 2009-04-02 | ベーカート・アドヴァンスト・コーティングス | 回転管状スパッタターゲット組立体 |
JP2013100568A (ja) * | 2011-11-07 | 2013-05-23 | Ulvac Japan Ltd | スパッタ装置、ターゲット装置 |
JP2017515000A (ja) * | 2014-05-09 | 2017-06-08 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 回転カソードアセンブリ用のシールド装置、及び堆積機器中の暗部のシールド方法 |
Families Citing this family (65)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5922176A (en) * | 1992-06-12 | 1999-07-13 | Donnelly Corporation | Spark eliminating sputtering target and method for using and making same |
ATE227783T1 (de) * | 1993-01-15 | 2002-11-15 | Boc Group Inc | Zylindrische mikrowellenabschirmung |
US5567289A (en) * | 1993-12-30 | 1996-10-22 | Viratec Thin Films, Inc. | Rotating floating magnetron dark-space shield and cone end |
US5620577A (en) * | 1993-12-30 | 1997-04-15 | Viratec Thin Films, Inc. | Spring-loaded mount for a rotatable sputtering cathode |
US5527439A (en) * | 1995-01-23 | 1996-06-18 | The Boc Group, Inc. | Cylindrical magnetron shield structure |
US6264803B1 (en) * | 1997-02-07 | 2001-07-24 | Steven V. Morgan | Apparatus and method for sputtering |
EP0969238A1 (en) * | 1998-06-29 | 2000-01-05 | Sinvaco N.V. | Vacuum tight coupling for tube sections |
US6440220B1 (en) * | 1998-10-23 | 2002-08-27 | Goodrich Corporation | Method and apparatus for inhibiting infiltration of a reactive gas into porous refractory insulation |
US6352430B1 (en) | 1998-10-23 | 2002-03-05 | Goodrich Corporation | Method and apparatus for cooling a CVI/CVD furnace |
US6162298A (en) * | 1998-10-28 | 2000-12-19 | The B. F. Goodrich Company | Sealed reactant gas inlet for a CVI/CVD furnace |
EP1063319B1 (en) | 1999-06-04 | 2005-12-07 | Goodrich Corporation | Method and apparatus for cooling a CVI/CVD furnace |
DE60013208T2 (de) | 1999-06-04 | 2005-08-11 | Goodrich Corp. | Suzeptordeckel sowohl für Gasphaseninfiltration bzw. -Beschichtung als auch Wärmebehandlung |
EP1065294B1 (en) | 1999-06-04 | 2003-10-15 | Goodrich Corporation | Method and apparatus for pressure measurement in a CVI/CVD furnace |
US6436252B1 (en) | 2000-04-07 | 2002-08-20 | Surface Engineered Products Corp. | Method and apparatus for magnetron sputtering |
DE10102493B4 (de) * | 2001-01-19 | 2007-07-12 | W.C. Heraeus Gmbh | Rohrförmiges Target und Verfahren zur Herstellung eines solchen Targets |
SE521095C2 (sv) * | 2001-06-08 | 2003-09-30 | Cardinal Cg Co | Förfarande för reaktiv sputtring |
US7399385B2 (en) * | 2001-06-14 | 2008-07-15 | Tru Vue, Inc. | Alternating current rotatable sputter cathode |
JP3849008B2 (ja) * | 2001-09-20 | 2006-11-22 | 独立行政法人産業技術総合研究所 | 高性能自動調光窓コーティング材料 |
US6736948B2 (en) * | 2002-01-18 | 2004-05-18 | Von Ardenne Anlagentechnik Gmbh | Cylindrical AC/DC magnetron with compliant drive system and improved electrical and thermal isolation |
JP4470429B2 (ja) * | 2002-09-30 | 2010-06-02 | 日本ビクター株式会社 | マグネトロンスパッタリング装置 |
US20040129561A1 (en) * | 2003-01-07 | 2004-07-08 | Von Ardenne Anlagentechnik Gmbh | Cylindrical magnetron magnetic array mid span support |
US20050051422A1 (en) | 2003-02-21 | 2005-03-10 | Rietzel James G. | Cylindrical magnetron with self cleaning target |
US7014741B2 (en) | 2003-02-21 | 2006-03-21 | Von Ardenne Anlagentechnik Gmbh | Cylindrical magnetron with self cleaning target |
DE10312631A1 (de) * | 2003-03-21 | 2004-10-07 | Interpane Entwicklungs- Und Beratungsgesellschaft Mbh & Co.Kg | Magnetron mit Kühlmittelschutz |
KR100568131B1 (ko) * | 2004-01-19 | 2006-04-10 | 주식회사 유니벡 | 마그네트론 스퍼터링 타겟장치 |
US20050224343A1 (en) * | 2004-04-08 | 2005-10-13 | Richard Newcomb | Power coupling for high-power sputtering |
US20060049043A1 (en) * | 2004-08-17 | 2006-03-09 | Matuska Neal W | Magnetron assembly |
US20060065524A1 (en) * | 2004-09-30 | 2006-03-30 | Richard Newcomb | Non-bonded rotatable targets for sputtering |
US20060096855A1 (en) † | 2004-11-05 | 2006-05-11 | Richard Newcomb | Cathode arrangement for atomizing a rotatable target pipe |
US20060278519A1 (en) * | 2005-06-10 | 2006-12-14 | Leszek Malaszewski | Adaptable fixation for cylindrical magnetrons |
US20060278524A1 (en) * | 2005-06-14 | 2006-12-14 | Stowell Michael W | System and method for modulating power signals to control sputtering |
US20060278521A1 (en) * | 2005-06-14 | 2006-12-14 | Stowell Michael W | System and method for controlling ion density and energy using modulated power signals |
US20060289304A1 (en) * | 2005-06-22 | 2006-12-28 | Guardian Industries Corp. | Sputtering target with slow-sputter layer under target material |
KR100674005B1 (ko) * | 2005-07-01 | 2007-01-24 | 주식회사 에스에프에이 | 스퍼터링 소스 및 이를 구비한 스퍼터 |
DE502005005634D1 (de) * | 2005-09-15 | 2008-11-20 | Applied Materials Gmbh & Co Kg | Beschichtungsanlage und Verfahren zum Betrieb einer Beschichtungsanlage |
US8123919B2 (en) * | 2005-09-20 | 2012-02-28 | Guardian Industries Corp. | Sputtering target with bonding layer of varying thickness under target material |
US7560011B2 (en) * | 2005-10-24 | 2009-07-14 | Guardian Industries Corp. | Sputtering target and method/apparatus for cooling the target |
US8435388B2 (en) | 2005-11-01 | 2013-05-07 | Cardinal Cg Company | Reactive sputter deposition processes and equipment |
US20070095281A1 (en) * | 2005-11-01 | 2007-05-03 | Stowell Michael W | System and method for power function ramping of microwave liner discharge sources |
US7842355B2 (en) * | 2005-11-01 | 2010-11-30 | Applied Materials, Inc. | System and method for modulation of power and power related functions of PECVD discharge sources to achieve new film properties |
US8679302B2 (en) | 2005-11-14 | 2014-03-25 | Guardian Industries Corp. | Silicon titanium oxide coating, coated article including silicon titanium oxide coating, and method of making the same |
US20070108043A1 (en) * | 2005-11-14 | 2007-05-17 | Guardian Industries Corp. | Sputtering target including titanium silicon oxide and method of making coated article using the same |
US8043488B2 (en) * | 2006-06-02 | 2011-10-25 | Bekaert Advanced Coatings | Rotatable sputter target |
US20080011599A1 (en) | 2006-07-12 | 2008-01-17 | Brabender Dennis M | Sputtering apparatus including novel target mounting and/or control |
US20080047831A1 (en) * | 2006-08-24 | 2008-02-28 | Hendryk Richert | Segmented/modular magnet bars for sputtering target |
EP2066594B1 (en) * | 2007-09-14 | 2016-12-07 | Cardinal CG Company | Low-maintenance coatings, and methods for producing low-maintenance coatings |
DE102008048785B4 (de) | 2007-09-24 | 2014-04-17 | Von Ardenne Anlagentechnik Gmbh | Magnetronanordnung mit abgeschirmter Targethalterung |
US8182662B2 (en) * | 2009-03-27 | 2012-05-22 | Sputtering Components, Inc. | Rotary cathode for magnetron sputtering apparatus |
CN102395700A (zh) * | 2009-04-14 | 2012-03-28 | 有限公司美国迅力光能公司 | 应用于真空镀膜的密封磁辊 |
US20100300877A1 (en) * | 2009-06-02 | 2010-12-02 | Applied Materials, Inc. | High utilization rotatable target using ceramic titanium oxide ring |
WO2011056581A2 (en) | 2009-10-26 | 2011-05-12 | General Plasma, Inc. | Rotary magnetron magnet bar and apparatus containing the same for high target utilization |
CZ304905B6 (cs) | 2009-11-23 | 2015-01-14 | Shm, S.R.O. | Způsob vytváření PVD vrstev s pomocí rotační cylindrické katody a zařízení k provádění tohoto způsobu |
EP2365515A1 (en) * | 2010-03-09 | 2011-09-14 | Applied Materials, Inc. | Rotatable target, backing tube, sputtering installation and method for producing a rotatable target |
DE102010031205A1 (de) * | 2010-07-09 | 2012-01-12 | Von Ardenne Anlagentechnik Gmbh | Magnetroneinrichtung mit Rohrtarget |
DE102010043114B4 (de) * | 2010-10-29 | 2015-02-12 | Von Ardenne Gmbh | Magnetroneinrichtung mit Rohrtarget |
AT12292U3 (de) * | 2011-10-18 | 2013-03-15 | Plansee Se | Rohrtarget |
GB201200574D0 (en) * | 2012-01-13 | 2012-02-29 | Gencoa Ltd | In-vacuum rotational device |
US9255323B2 (en) * | 2012-06-18 | 2016-02-09 | Apollo Precision Fujian Limited | Sputtering target including a feature to reduce chalcogen build up and arcing on a backing tube |
US9809876B2 (en) * | 2014-01-13 | 2017-11-07 | Centre Luxembourgeois De Recherches Pour Le Verre Et La Ceramique (C.R.V.C.) Sarl | Endblock for rotatable target with electrical connection between collector and rotor at pressure less than atmospheric pressure |
US10371244B2 (en) | 2015-04-09 | 2019-08-06 | United Technologies Corporation | Additive manufactured gear for a geared architecture gas turbine engine |
DE102015117885A1 (de) * | 2015-10-21 | 2017-04-27 | Von Ardenne Gmbh | Sputterverfahren zur Abscheidung einer dielektrischen Schicht, Target und Sputtervorrichtung |
WO2018093985A1 (en) | 2016-11-17 | 2018-05-24 | Cardinal Cg Company | Static-dissipative coating technology |
US20180327897A1 (en) * | 2017-05-12 | 2018-11-15 | Applied Materials, Inc. | Re-deposition free sputtering system |
KR102535667B1 (ko) * | 2018-08-08 | 2023-05-26 | 어플라이드 머티어리얼스, 인코포레이티드 | 스퍼터링 디바이스, 증착 장치, 및 스퍼터링 디바이스를 작동시키는 방법 |
CN109504948B (zh) * | 2018-12-28 | 2021-01-29 | 北京大学深圳研究生院 | 一种筒形溅射阴极及离子引出系统 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3897325A (en) * | 1972-10-20 | 1975-07-29 | Nippon Electric Varian Ltd | Low temperature sputtering device |
US4166018A (en) * | 1974-01-31 | 1979-08-28 | Airco, Inc. | Sputtering process and apparatus |
US4132613A (en) * | 1974-12-23 | 1979-01-02 | Telic Corporation | Glow discharge method and apparatus |
JPS51117933A (en) * | 1975-04-10 | 1976-10-16 | Tokuda Seisakusho | Spattering apparatus |
JPS5512732A (en) * | 1978-07-14 | 1980-01-29 | Anelva Corp | Sputtering apparatus for making thin magnetic film |
US4519985A (en) * | 1980-03-12 | 1985-05-28 | Calgon Carbon Corporation | Use of activated carbon to remove dissolved organics from uranium leachate |
US4422916A (en) * | 1981-02-12 | 1983-12-27 | Shatterproof Glass Corporation | Magnetron cathode sputtering apparatus |
US4356073A (en) * | 1981-02-12 | 1982-10-26 | Shatterproof Glass Corporation | Magnetron cathode sputtering apparatus |
US4362611A (en) * | 1981-07-27 | 1982-12-07 | International Business Machines Corporation | Quadrupole R.F. sputtering system having an anode/cathode shield and a floating target shield |
DD217964A3 (de) * | 1981-10-02 | 1985-01-23 | Ardenne Manfred | Einrichtung zum hochratezerstaeuben nach dem plasmatronprinzip |
US4486289A (en) * | 1982-02-05 | 1984-12-04 | University Of British Columbia, Canada | Planar magnetron sputtering device |
JPS59200761A (ja) * | 1983-04-28 | 1984-11-14 | Toshiba Corp | スパツタリングタ−ゲツト支持装置 |
US4445997A (en) * | 1983-08-17 | 1984-05-01 | Shatterproof Glass Corporation | Rotatable sputtering apparatus |
US4443318A (en) * | 1983-08-17 | 1984-04-17 | Shatterproof Glass Corporation | Cathodic sputtering apparatus |
US4545882A (en) * | 1983-09-02 | 1985-10-08 | Shatterproof Glass Corporation | Method and apparatus for detecting sputtering target depletion |
US4466877A (en) * | 1983-10-11 | 1984-08-21 | Shatterproof Glass Corporation | Magnetron cathode sputtering apparatus |
US4519885A (en) * | 1983-12-27 | 1985-05-28 | Shatterproof Glass Corp. | Method and apparatus for changing sputtering targets in a magnetron sputtering system |
CH665057A5 (de) * | 1984-07-20 | 1988-04-15 | Balzers Hochvakuum | Targetplatte fuer kathodenzerstaeubung. |
DE3427587A1 (de) * | 1984-07-26 | 1986-02-06 | Leybold-Heraeus GmbH, 5000 Köln | Zerstaeubungseinrichtung fuer katodenzerstaeubungsanlagen |
US4668358A (en) * | 1986-05-14 | 1987-05-26 | Motor Wheel Corporation | Method and apparatus for use in surface treatment of conveyor supported workholders |
DE3721373A1 (de) * | 1987-06-29 | 1989-01-12 | Leybold Ag | Beschichtungsvorrichtung |
US4904362A (en) * | 1987-07-24 | 1990-02-27 | Miba Gleitlager Aktiengesellschaft | Bar-shaped magnetron or sputter cathode arrangement |
JP2693960B2 (ja) * | 1988-02-24 | 1997-12-24 | プロメトロンテクニクス株式会社 | マグネトロンスパッタリングカソード装置 |
US5047131A (en) * | 1989-11-08 | 1991-09-10 | The Boc Group, Inc. | Method for coating substrates with silicon based compounds |
-
1991
- 1991-07-31 EP EP19910916432 patent/EP0543931A4/en not_active Withdrawn
- 1991-07-31 CA CA002089149A patent/CA2089149C/en not_active Expired - Lifetime
- 1991-07-31 JP JP51560891A patent/JP3516949B2/ja not_active Expired - Lifetime
- 1991-07-31 WO PCT/US1991/005304 patent/WO1992002659A1/en not_active Application Discontinuation
-
1993
- 1993-11-29 US US08/158,729 patent/US5470452A/en not_active Expired - Lifetime
-
1995
- 1995-03-21 US US08/408,022 patent/US5725746A/en not_active Expired - Lifetime
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009513818A (ja) * | 2003-07-04 | 2009-04-02 | ベーカート・アドヴァンスト・コーティングス | 回転管状スパッタターゲット組立体 |
JP2008517150A (ja) * | 2004-10-18 | 2008-05-22 | ベーカート・アドヴァンスト・コーティングス | 回転可能なスパッタリングターゲットを支持する平面エンドブロック |
JP2014194086A (ja) * | 2004-10-18 | 2014-10-09 | Soleras Advanced Coatings Bvba | 回転可能なスパッタリングターゲットを支持する平面エンドブロック |
JP2008533297A (ja) * | 2005-03-11 | 2008-08-21 | ベーカート・アドヴァンスト・コーティングス | 単一の直角エンドブロック |
JP2013100568A (ja) * | 2011-11-07 | 2013-05-23 | Ulvac Japan Ltd | スパッタ装置、ターゲット装置 |
JP2017515000A (ja) * | 2014-05-09 | 2017-06-08 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 回転カソードアセンブリ用のシールド装置、及び堆積機器中の暗部のシールド方法 |
Also Published As
Publication number | Publication date |
---|---|
JP3516949B2 (ja) | 2004-04-05 |
US5470452A (en) | 1995-11-28 |
EP0543931A1 (en) | 1993-06-02 |
CA2089149A1 (en) | 1992-02-11 |
WO1992002659A1 (en) | 1992-02-20 |
EP0543931A4 (en) | 1993-09-08 |
US5725746A (en) | 1998-03-10 |
CA2089149C (en) | 2002-11-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH06503855A (ja) | 回転マグネトロンスパッタリングシステムにおけるアーク抑制のためのシールディング | |
US5106474A (en) | Anode structures for magnetron sputtering apparatus | |
KR100325969B1 (ko) | 스퍼터링장치와원통형단부보호장치형성방법및스퍼터에칭방법 | |
JP3281371B2 (ja) | 広面コーティング用の円筒状回転マグネトロン | |
US5108574A (en) | Cylindrical magnetron shield structure | |
US5213672A (en) | Sputtering apparatus with a rotating target | |
AU690388B2 (en) | Cylindrical magnetron shield structure | |
US4444643A (en) | Planar magnetron sputtering device | |
US5200049A (en) | Cantilever mount for rotating cylindrical magnetrons | |
JP5395255B2 (ja) | 電子デバイスの製造方法およびスパッタリング方法 | |
US5538609A (en) | Cathodic sputtering system | |
US9809876B2 (en) | Endblock for rotatable target with electrical connection between collector and rotor at pressure less than atmospheric pressure | |
KR980011183A (ko) | 스퍼터링 시스템 | |
EP0537012A1 (en) | Sputtering processes and apparatus | |
JPS6116346B2 (ja) | ||
JP2002212723A (ja) | 真空成膜装置 | |
JP3810132B2 (ja) | スパッタリング装置 | |
JPH0565634A (ja) | スパツタ装置 | |
US20240290593A1 (en) | Magnetron Design for Improved Bottom Coverage and Uniformity | |
JP3901365B2 (ja) | スパッタ装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20031224 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20040122 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080130 Year of fee payment: 4 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090130 Year of fee payment: 5 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090130 Year of fee payment: 5 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100130 Year of fee payment: 6 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100130 Year of fee payment: 6 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100130 Year of fee payment: 6 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110130 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110130 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120130 Year of fee payment: 8 |
|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120130 Year of fee payment: 8 |