JPH0639349Y2 - 誤り率測定器 - Google Patents

誤り率測定器

Info

Publication number
JPH0639349Y2
JPH0639349Y2 JP7194887U JP7194887U JPH0639349Y2 JP H0639349 Y2 JPH0639349 Y2 JP H0639349Y2 JP 7194887 U JP7194887 U JP 7194887U JP 7194887 U JP7194887 U JP 7194887U JP H0639349 Y2 JPH0639349 Y2 JP H0639349Y2
Authority
JP
Japan
Prior art keywords
circuit
signal
output signal
under test
supplied
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP7194887U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63181978U (enrdf_load_html_response
Inventor
利郎 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP7194887U priority Critical patent/JPH0639349Y2/ja
Publication of JPS63181978U publication Critical patent/JPS63181978U/ja
Application granted granted Critical
Publication of JPH0639349Y2 publication Critical patent/JPH0639349Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP7194887U 1987-05-14 1987-05-14 誤り率測定器 Expired - Lifetime JPH0639349Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7194887U JPH0639349Y2 (ja) 1987-05-14 1987-05-14 誤り率測定器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7194887U JPH0639349Y2 (ja) 1987-05-14 1987-05-14 誤り率測定器

Publications (2)

Publication Number Publication Date
JPS63181978U JPS63181978U (enrdf_load_html_response) 1988-11-24
JPH0639349Y2 true JPH0639349Y2 (ja) 1994-10-12

Family

ID=30914957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7194887U Expired - Lifetime JPH0639349Y2 (ja) 1987-05-14 1987-05-14 誤り率測定器

Country Status (1)

Country Link
JP (1) JPH0639349Y2 (enrdf_load_html_response)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6262306B1 (ja) * 2016-08-31 2018-01-17 アンリツ株式会社 判定帰還型等化器及び判定帰還型等化方法と誤り率測定装置及び誤り率測定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6137582B2 (ja) 2013-03-13 2017-05-31 インテル・コーポレーション 電子デバイス、メモリコントローラ、装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6137582B2 (ja) 2013-03-13 2017-05-31 インテル・コーポレーション 電子デバイス、メモリコントローラ、装置

Also Published As

Publication number Publication date
JPS63181978U (enrdf_load_html_response) 1988-11-24

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