JPH0637350Y2 - デイジタル回路試験装置 - Google Patents

デイジタル回路試験装置

Info

Publication number
JPH0637350Y2
JPH0637350Y2 JP12693786U JP12693786U JPH0637350Y2 JP H0637350 Y2 JPH0637350 Y2 JP H0637350Y2 JP 12693786 U JP12693786 U JP 12693786U JP 12693786 U JP12693786 U JP 12693786U JP H0637350 Y2 JPH0637350 Y2 JP H0637350Y2
Authority
JP
Japan
Prior art keywords
test
setting means
circuit
condition setting
determination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP12693786U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6333477U (enrdf_load_stackoverflow
Inventor
政徳 森
伸一 青木
Original Assignee
安藤電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 安藤電気株式会社 filed Critical 安藤電気株式会社
Priority to JP12693786U priority Critical patent/JPH0637350Y2/ja
Publication of JPS6333477U publication Critical patent/JPS6333477U/ja
Application granted granted Critical
Publication of JPH0637350Y2 publication Critical patent/JPH0637350Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP12693786U 1986-08-20 1986-08-20 デイジタル回路試験装置 Expired - Lifetime JPH0637350Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12693786U JPH0637350Y2 (ja) 1986-08-20 1986-08-20 デイジタル回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12693786U JPH0637350Y2 (ja) 1986-08-20 1986-08-20 デイジタル回路試験装置

Publications (2)

Publication Number Publication Date
JPS6333477U JPS6333477U (enrdf_load_stackoverflow) 1988-03-03
JPH0637350Y2 true JPH0637350Y2 (ja) 1994-09-28

Family

ID=31021212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12693786U Expired - Lifetime JPH0637350Y2 (ja) 1986-08-20 1986-08-20 デイジタル回路試験装置

Country Status (1)

Country Link
JP (1) JPH0637350Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6333477U (enrdf_load_stackoverflow) 1988-03-03

Similar Documents

Publication Publication Date Title
JPH027434B2 (enrdf_load_stackoverflow)
US4490673A (en) Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
JP2000193702A (ja) 基板の絶縁検査装置及びその絶縁検査方法
JP3527814B2 (ja) 集積回路
JPH0637350Y2 (ja) デイジタル回路試験装置
JPH10240560A (ja) 波形信号処理装置
JP3918344B2 (ja) 半導体試験装置
JP2001051023A (ja) エンジン制御装置
JPH05297061A (ja) 半導体集積回路
JP2000304805A (ja) 半導体試験装置におけるコンパレータ回路
JPH1026655A (ja) Lsiの試験装置
JP2002277517A (ja) 電源ノイズ耐性評価方法およびそれに用いるプローブ並びに半導体素子
JPH05249190A (ja) Lsi用テスタ
JP2002131380A (ja) 半導体試験装置、半導体試験システム、及び半導体装置の試験方法
JP2633692B2 (ja) 半導体試験方法
JPH0744415A (ja) 半導体集積回路装置
JPS6217727Y2 (enrdf_load_stackoverflow)
JPH09304485A (ja) ブリッジ検出方法及びブリッジ検出回路
JPH10221405A (ja) Lsi試験装置
JPH09211075A (ja) 半導体集積回路およびその試験方法
JP2723676B2 (ja) 半導体集積回路
JPH08212097A (ja) デジタル信号の論理レベルの品質をテストするための装置
JPS6324502Y2 (enrdf_load_stackoverflow)
JPH042000A (ja) Ramテストモードを備えた半導体集積回路
JPH02290573A (ja) 半導体集積回路