JPH0633429Y2 - 電子装置用温度試験装置 - Google Patents
電子装置用温度試験装置Info
- Publication number
- JPH0633429Y2 JPH0633429Y2 JP6644386U JP6644386U JPH0633429Y2 JP H0633429 Y2 JPH0633429 Y2 JP H0633429Y2 JP 6644386 U JP6644386 U JP 6644386U JP 6644386 U JP6644386 U JP 6644386U JP H0633429 Y2 JPH0633429 Y2 JP H0633429Y2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- air
- electronic device
- unit
- nozzle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010438 heat treatment Methods 0.000 claims description 17
- 238000001816 cooling Methods 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 8
- 238000007664 blowing Methods 0.000 claims description 2
- 238000007599 discharging Methods 0.000 claims description 2
- 230000002159 abnormal effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6644386U JPH0633429Y2 (ja) | 1986-05-01 | 1986-05-01 | 電子装置用温度試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6644386U JPH0633429Y2 (ja) | 1986-05-01 | 1986-05-01 | 電子装置用温度試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62178380U JPS62178380U (enExample) | 1987-11-12 |
| JPH0633429Y2 true JPH0633429Y2 (ja) | 1994-08-31 |
Family
ID=30904454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6644386U Expired - Lifetime JPH0633429Y2 (ja) | 1986-05-01 | 1986-05-01 | 電子装置用温度試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0633429Y2 (enExample) |
-
1986
- 1986-05-01 JP JP6644386U patent/JPH0633429Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62178380U (enExample) | 1987-11-12 |
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