JPH0590006A - Composition for thick-film resistor formation - Google Patents

Composition for thick-film resistor formation

Info

Publication number
JPH0590006A
JPH0590006A JP3278773A JP27877391A JPH0590006A JP H0590006 A JPH0590006 A JP H0590006A JP 3278773 A JP3278773 A JP 3278773A JP 27877391 A JP27877391 A JP 27877391A JP H0590006 A JPH0590006 A JP H0590006A
Authority
JP
Japan
Prior art keywords
glass
composition
film resistor
resistance value
thick
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3278773A
Other languages
Japanese (ja)
Inventor
Fujio Makuta
富士雄 幕田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal Mining Co Ltd
Original Assignee
Sumitomo Metal Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Mining Co Ltd filed Critical Sumitomo Metal Mining Co Ltd
Priority to JP3278773A priority Critical patent/JPH0590006A/en
Publication of JPH0590006A publication Critical patent/JPH0590006A/en
Pending legal-status Critical Current

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  • Non-Adjustable Resistors (AREA)
  • Conductive Materials (AREA)

Abstract

PURPOSE:To provide a composition, for thick-film resistor formation wherein a change in its resistance value is small in a reheating process when a glass coating operation or the like is performed after a resistor has been formed on a ceramic substrate and a thick-film resistor cab formed at good yield. CONSTITUTION:A composition for thick-film resistor formation is composed mainly of the following: a conductive powder which contains RuO2 and at least either Ag or Pd; a glass powder; and an organic vehicle. The composition contains 40 to 70wt.% of either Ag or Pd or both of them in its solid portion and 30 to 60wt.% of RuO2 and glass. The weight ratio of RuO2 to glass is set within a range of 2:8 to 4:6.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えば各種電子機器の
電子回路部品等においてセラミック基体等の上に厚膜抵
抗体、特に低抵抗値抵抗体を形成するための組成物に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a composition for forming a thick film resistor, particularly a low resistance resistor, on a ceramic substrate or the like in electronic circuit parts of various electronic devices.

【0002】[0002]

【従来の技術】従来、導電性粉末とガラス粉末を所要の
抵抗値になるように混合し、これを有機ビヒクルに分散
したペーストをアルミナ等のセラミック基体上にスクリ
ーン印刷法等により所要形状に塗布し、700〜900
℃で焼成して、基体上に電子回路部品としての厚膜抵抗
体を形成することが行われている。特に、低抵抗値抵抗
体の導電粉末としてAgやPdの他にRuO2 を使用す
ることにより抵抗値の安定性を改善したりすることは知
られている。
2. Description of the Related Art Conventionally, a conductive powder and a glass powder are mixed so as to have a required resistance value, and a paste prepared by dispersing this in an organic vehicle is applied onto a ceramic substrate such as alumina by a screen printing method or the like in a desired shape. Then 700-900
A thick film resistor as an electronic circuit component is formed on a substrate by firing at a temperature of ℃. In particular, it is known that the stability of the resistance value is improved by using RuO 2 in addition to Ag and Pd as the conductive powder of the low resistance value resistor.

【0003】上記のような厚膜抵抗体を使った例えばチ
ップ抵抗器などの製造工程では、通常抵抗体の抵抗値を
調整した後に、ガラスコート等の目的のために600℃
程度の再加熱が行われる。この再加熱工程での抵抗値変
化を考慮に入れて、トリミングによる抵抗値調整を行っ
ている。
In the manufacturing process of, for example, a chip resistor using the thick film resistor as described above, the resistance value of the resistor is usually adjusted and then 600 ° C. for the purpose of glass coating or the like.
A degree of reheating is performed. The resistance value is adjusted by trimming in consideration of the resistance value change in the reheating process.

【0004】[0004]

【発明が解決しようとする課題】ところが、上記の再加
熱工程での抵抗値の変化が大きいと最終の抵抗値を目標
の範囲内に収めることが困難となり、歩留りを悪化させ
る大きな原因となっている。本発明は上記の問題点に鑑
みて提案されたもので、再加熱工程での抵抗値変化が少
なく、歩留りよく厚膜抵抗体の得られる主として低抵抗
値を有する厚膜抵抗体形成用組成物を提供することを目
的とする。
However, if there is a large change in the resistance value in the above reheating step, it becomes difficult to keep the final resistance value within the target range, which is a major cause of deterioration of the yield. There is. The present invention has been proposed in view of the above problems, there is little resistance value change in the reheating step, thick film resistor forming composition having mainly low resistance value that yields thick film resistors with good yield The purpose is to provide.

【0005】[0005]

【課題を解決するための手段】上記の目的を達成するた
めに、本発明による厚膜抵抗体形成用組成物は、以下の
構成としたものである。即ち、AgとPdの少なくとも
一方とRuO2 とを含む導電性粉末と、ガラス粉末およ
び有機ビヒクルとを主成分とする厚膜抵抗体形成用組成
物において、固形分中AgとPdのいずれか一方または
両方を合わせて40〜70重量%、RuO2 およびガラ
スを30〜60重量%含有し、RuO2 とガラスの重量
比が2:8〜4:6の範囲内になるようにしたことを特
徴とする。
In order to achieve the above object, the composition for forming a thick film resistor according to the present invention has the following constitution. That is, in a thick film resistor forming composition containing a conductive powder containing at least one of Ag and Pd and RuO 2 , a glass powder and an organic vehicle as main components, one of Ag and Pd in solid content Alternatively, both of them are contained together in an amount of 40 to 70% by weight, RuO 2 and glass in an amount of 30 to 60% by weight, and the weight ratio of RuO 2 and glass is within the range of 2: 8 to 4: 6. And

【0006】[0006]

【作用】上記のAgとPdは、いずれか一方または両方
の単体粉末あるいは両者の合金粉末等を用いることがで
き、AgとPdの比率は特に限定されるものではない
が、コストと抵抗値の温度係数等の点からは、AgとP
dとの重量比が80:20〜40:60の範囲内になる
ようにするのが好ましい。また上記の各粉末の粒径は、
10μm以下、望ましくは5μm以下が好適である。R
uO2 粉末は通常厚膜抵抗体に用いられるものでよく、
粒径は1μm以下、好ましくは0.2μm以下が望まし
い。ガラス粉末も通常の厚膜抵抗体に用いられるホウケ
イ酸鉛系、アルミホウケイ酸鉛系等でよく、粒径は10
μm以下、好ましくは5μm以下が望ましい。
The above Ag and Pd may be either one or both of the single powders or the alloy powders of the both, and the ratio of Ag and Pd is not particularly limited, but the cost and the resistance are not limited. In terms of temperature coefficient, etc., Ag and P
It is preferable that the weight ratio to d is within the range of 80:20 to 40:60. The particle size of each of the above powders is
10 μm or less, preferably 5 μm or less is suitable. R
uO 2 powder may be one normally used for thick film resistors,
The particle size is 1 μm or less, preferably 0.2 μm or less. The glass powder may be lead borosilicate type, lead aluminum borosilicate type, etc., which are used for ordinary thick film resistors, and the particle size is 10
It is desirable that the thickness is less than or equal to μm, preferably less than or equal to 5 μm.

【0007】上記のAg、Pd、RuO2 及びガラス粉
末以外に、従来からTCR(抵抗温度係数)を小さくす
るために用いられているMnO2、Nb2 5 、Sb2
3 、TiO2 、CuO等を添加することは何ら差し支
えない。有機ビヒクルは、従来と同様にエチルセルロー
ス、メタクリレート等をターピネオール、ブチルカルビ
トールなどに溶解したものでよい。
In addition to the above-mentioned Ag, Pd, RuO 2 and glass powder, MnO 2 , Nb 2 O 5 and Sb 2 conventionally used for reducing the TCR (temperature coefficient of resistance) are used.
There is no problem in adding O 3 , TiO 2 , CuO or the like. The organic vehicle may be one in which ethyl cellulose, methacrylate or the like is dissolved in terpineol, butyl carbitol or the like as in the conventional case.

【0008】本発明において、固形分すなわちAg、P
d、RuO2 およびガラス粉末とを合わせた全固形分の
うち、AgとPdのいずれか一方または両方を合せて4
0〜70重量%としたのは、40重量%未満では抵抗値
が高くなりすぎ、70重量%を超えると抵抗値が低くな
り過ぎるためである。またRuO2 とガラスの比率は、
本発明の目的である再加熱時の抵抗値変化を小さくする
のに重要であり、RuO2 とガラスの重量比を2:8〜
4:6の範囲内としたのは、RuO2 とガラスの重量比
が4:6よりもRuO2 が多くなると、再加熱時の抵抗
値変化が大きくなり、RuO2 とガラスの重量比が2:
8よりもRuO2 が少なくなると、抵抗値が高くなり過
ぎるためである。
In the present invention, the solid content, namely Ag, P
Of the total solid content of d, RuO 2 and glass powder, one or both of Ag and Pd are combined and 4
The reason why the content is 0 to 70% by weight is that the resistance value becomes too high when it is less than 40% by weight, and the resistance value becomes too low when it exceeds 70% by weight. The ratio of RuO 2 and glass is
It is important for reducing the change in resistance value at the time of reheating, which is the object of the present invention, and the weight ratio of RuO 2 and glass is 2: 8 to.
4: was a 6 range, the weight ratio of RuO 2 and glass 4: When the RuO 2 larger than 6, the resistance value changes at the time of re-heating increases, RuO 2 and the weight ratio of the glass 2 :
This is because when the RuO 2 content is less than 8, the resistance value becomes too high.

【0009】[0009]

【実施例】平均粒径が、それぞれ1.0μm、0.3μ
m、0.1μm以下のAg粉末、Pd粉末、RuO2
末と、平均粒径が1.5μmのガラス粉末(PbOが5
5重量%、SiO2 が30重量%、B2 3 が10重量
%、Al2 3 が5重量%)とを用い、エチルセルロー
スのターピネオール溶液を添加して3本ロールで混練し
て下記表1に示す組成のペスートを調整した。
Example: Average particle diameters are 1.0 μm and 0.3 μm, respectively.
m, Ag powder of 0.1 μm or less, Pd powder, RuO 2 powder, and glass powder having an average particle size of 1.5 μm (PbO is 5
5% by weight, 30% by weight of SiO 2 , 10% by weight of B 2 O 3 and 5% by weight of Al 2 O 3 ) and added with a terpineol solution of ethyl cellulose and kneaded with a three-roll mill. A pesto having the composition shown in 1 was prepared.

【0010】そして、予めAgPdペーストを850℃
で焼成してAgPd電極を形成した96%アルミナ基板
に、上記の抵抗ペーストをスクリーン印刷して150℃
で乾燥した後、ピーク温度(最高温度)850℃を9分
間保つようにしてトータル50分間ベルト炉で焼成し、
大きさ1mm角、厚さ8〜10μmの抵抗体を形成し
た。その焼成後の初期抵抗値をデジタルマルチメータで
測定した。
Then, the AgPd paste is preheated at 850 ° C.
The resistance paste is screen-printed on a 96% alumina substrate on which an AgPd electrode is formed by baking at 150 ° C.
After drying in, the peak temperature (maximum temperature) is kept at 850 ° C. for 9 minutes and baked in a belt furnace for a total of 50 minutes,
A resistor having a size of 1 mm square and a thickness of 8 to 10 μm was formed. The initial resistance value after firing was measured with a digital multimeter.

【0011】次に、上記の抵抗体の上に黒色のガラスペ
ーストを、抵抗体をコートするように印刷して乾燥し、
ピーク温度600℃を5分間保つようにしてトータル4
0分間ベルト炉で焼成した。この焼成後の抵抗値を測定
し、前記の初期抵抗値に対する変化率を求めた。その結
果を下記表1に示す。
Next, a black glass paste is printed on the above resistor so as to coat the resistor and dried,
Keep the peak temperature of 600 ℃ for 5 minutes for a total of 4
Baking in a belt furnace for 0 minutes. The resistance value after firing was measured, and the rate of change with respect to the initial resistance value was obtained. The results are shown in Table 1 below.

【0012】 [0012]

【0013】上記のように、本発明に基づく上記各実施
例によれば、再加熱による抵抗値変化率を、±2%の範
囲内に収めることができた。
As described above, according to the above-described embodiments of the present invention, the rate of change in resistance value due to reheating could be kept within the range of ± 2%.

【0014】[0014]

【発明の効果】以上説明したように本発明による厚膜抵
抗体形成用組成物は、再加熱による抵抗値変化を極力小
さくすることができるから、再加熱後の抵抗値を所定の
範囲内に収めるのが容易となり、またトリミング等で抵
抗値を調整する場合にも極めて簡単に調整することがで
きるもので、製品の歩留りを大幅に向上させることがで
きる等の効果がある。
As described above, since the composition for forming a thick film resistor according to the present invention can minimize the change in resistance value due to reheating, the resistance value after reheating should be within a predetermined range. It is easy to store, and when the resistance value is adjusted by trimming or the like, the resistance value can be adjusted very easily, and the yield of products can be greatly improved.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 AgとPdの少なくとも一方とRuO2
とを含む導電性粉末と、ガラス粉末および有機ビヒクル
とを主成分とする厚膜抵抗体形成用組成物において、固
形分中AgとPdのいずれか一方または両方を合せて4
0〜70重量%、RuO2 およびガラスを30〜60重
量%含有し、RuO2 とガラスの重量比が2:8〜4:
6の範囲内であることを特徴とする厚膜抵抗体形成用組
成物。
1. At least one of Ag and Pd and RuO 2
In a composition for forming a thick film resistor, which contains a conductive powder containing and a glass powder and an organic vehicle as the main components, one or both of Ag and Pd in the solid content are combined to obtain 4
0 to 70% by weight, RuO 2 and glass 30 to 60% by weight, and the weight ratio of RuO 2 and glass is 2: 8 to 4:
The composition for forming a thick film resistor is characterized in that it is in the range of 6.
JP3278773A 1991-09-30 1991-09-30 Composition for thick-film resistor formation Pending JPH0590006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3278773A JPH0590006A (en) 1991-09-30 1991-09-30 Composition for thick-film resistor formation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3278773A JPH0590006A (en) 1991-09-30 1991-09-30 Composition for thick-film resistor formation

Publications (1)

Publication Number Publication Date
JPH0590006A true JPH0590006A (en) 1993-04-09

Family

ID=17601987

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3278773A Pending JPH0590006A (en) 1991-09-30 1991-09-30 Composition for thick-film resistor formation

Country Status (1)

Country Link
JP (1) JPH0590006A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110797135A (en) * 2019-11-22 2020-02-14 湖南嘉业达电子有限公司 Thick-film resistor paste suitable for porous ceramic and preparation method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110797135A (en) * 2019-11-22 2020-02-14 湖南嘉业达电子有限公司 Thick-film resistor paste suitable for porous ceramic and preparation method thereof

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