JPH0585451B2 - - Google Patents
Info
- Publication number
- JPH0585451B2 JPH0585451B2 JP27038285A JP27038285A JPH0585451B2 JP H0585451 B2 JPH0585451 B2 JP H0585451B2 JP 27038285 A JP27038285 A JP 27038285A JP 27038285 A JP27038285 A JP 27038285A JP H0585451 B2 JPH0585451 B2 JP H0585451B2
- Authority
- JP
- Japan
- Prior art keywords
- section
- semiconductor device
- semiconductor devices
- test
- claw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims description 82
- 238000012360 testing method Methods 0.000 claims description 66
- 210000000078 claw Anatomy 0.000 claims description 54
- 239000011295 pitch Substances 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 14
- 230000033001 locomotion Effects 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 9
- 230000032258 transport Effects 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 238000012840 feeding operation Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Landscapes
- Reciprocating Conveyors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27038285A JPS62128540A (ja) | 1985-11-29 | 1985-11-29 | 半導体装置の試験用搬送方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27038285A JPS62128540A (ja) | 1985-11-29 | 1985-11-29 | 半導体装置の試験用搬送方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62128540A JPS62128540A (ja) | 1987-06-10 |
| JPH0585451B2 true JPH0585451B2 (enrdf_load_stackoverflow) | 1993-12-07 |
Family
ID=17485479
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27038285A Granted JPS62128540A (ja) | 1985-11-29 | 1985-11-29 | 半導体装置の試験用搬送方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62128540A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03206637A (ja) * | 1990-01-09 | 1991-09-10 | Rohm Co Ltd | 電子部品の検査方法及びレーザー標印方法 |
-
1985
- 1985-11-29 JP JP27038285A patent/JPS62128540A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62128540A (ja) | 1987-06-10 |
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