JPH0580992B2 - - Google Patents

Info

Publication number
JPH0580992B2
JPH0580992B2 JP61287565A JP28756586A JPH0580992B2 JP H0580992 B2 JPH0580992 B2 JP H0580992B2 JP 61287565 A JP61287565 A JP 61287565A JP 28756586 A JP28756586 A JP 28756586A JP H0580992 B2 JPH0580992 B2 JP H0580992B2
Authority
JP
Japan
Prior art keywords
transistor
supply voltage
circuit
voltage
current source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61287565A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62134576A (ja
Inventor
Ungaa Berunharuto
Rausheruto Rainaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of JPS62134576A publication Critical patent/JPS62134576A/ja
Publication of JPH0580992B2 publication Critical patent/JPH0580992B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G01R31/3161—Marginal testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP61287565A 1985-12-03 1986-12-01 集積モジユ−ルの試験方法および回路装置 Granted JPS62134576A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3542731 1985-12-03
DE3542731.0 1985-12-03

Publications (2)

Publication Number Publication Date
JPS62134576A JPS62134576A (ja) 1987-06-17
JPH0580992B2 true JPH0580992B2 (enExample) 1993-11-11

Family

ID=6287496

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61287565A Granted JPS62134576A (ja) 1985-12-03 1986-12-01 集積モジユ−ルの試験方法および回路装置

Country Status (5)

Country Link
US (1) US4947105A (enExample)
EP (1) EP0226887B1 (enExample)
JP (1) JPS62134576A (enExample)
AT (1) ATE57579T1 (enExample)
DE (1) DE3674990D1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE68926414D1 (de) * 1988-08-17 1996-06-13 Ibm Verfahren und Gerät zur Fehlererkennung in differentialen Stromschaltlogikschaltkreisen
US5097144A (en) * 1990-04-30 1992-03-17 International Business Machines Corporation Driver circuit for testing bi-directional transceiver semiconductor products
EP0623997B1 (en) * 1993-05-07 1998-08-12 STMicroelectronics S.r.l. Hysteresis comparator working with a low voltage supply
US6005406A (en) * 1995-12-07 1999-12-21 International Business Machines Corporation Test device and method facilitating aggressive circuit design
US6173427B1 (en) * 1997-06-20 2001-01-09 Nec Corporation Immunity evaluation method and apparatus for electronic circuit device and LSI tester
DE102005013450A1 (de) * 2005-03-23 2006-09-28 Robert Bosch Gmbh Sicherheitssystem
FR2887089B1 (fr) * 2005-06-09 2007-09-07 France Etat Dispositif formant porte logique adaptee pour detecter une faute logique

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3577073A (en) * 1969-02-18 1971-05-04 Control Data Corp Apparatus for automated computer maintenance comprising means for varying the input signal switching threshold voltage for any of a plurality of electronic circuits
DE2106163A1 (de) * 1971-02-10 1972-12-28 Siemens Ag Verfahren zum Prüfen von Einheiten eines programmgesteuerten Verarbeitungssystems
JPS5377150A (en) * 1976-12-20 1978-07-08 Hitachi Ltd Margin measuring unit for large scale integrated circuit
DE2849153C2 (de) * 1978-11-13 1982-08-19 Siemens AG, 1000 Berlin und 8000 München Schaltungsanordnung zur Erzeugung einer konstanten Hilfsgleichspannung
JPS566535A (en) * 1979-06-28 1981-01-23 Nec Corp Integrated circuit
DE3040733A1 (de) * 1980-10-29 1982-05-13 Siemens AG, 1000 Berlin und 8000 München Verfahren zur untersuchung einer auf einem halbleiterplaettchen integrierten schaltungsanordnung
JPS5853775A (ja) * 1981-09-26 1983-03-30 Fujitsu Ltd Ｉｃメモリ試験方法
US4575647A (en) * 1983-07-08 1986-03-11 International Business Machines Corporation Reference-regulated compensated current switch emitter-follower circuit
JPS60174527A (ja) * 1984-02-21 1985-09-07 Nec Corp 論理回路

Also Published As

Publication number Publication date
ATE57579T1 (de) 1990-11-15
US4947105A (en) 1990-08-07
EP0226887A1 (de) 1987-07-01
DE3674990D1 (de) 1990-11-22
EP0226887B1 (de) 1990-10-17
JPS62134576A (ja) 1987-06-17

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