JPH0576176B2 - - Google Patents
Info
- Publication number
- JPH0576176B2 JPH0576176B2 JP57036881A JP3688182A JPH0576176B2 JP H0576176 B2 JPH0576176 B2 JP H0576176B2 JP 57036881 A JP57036881 A JP 57036881A JP 3688182 A JP3688182 A JP 3688182A JP H0576176 B2 JPH0576176 B2 JP H0576176B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- silicon
- semiconductor device
- manufacturing
- oxidation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57036881A JPS58154270A (ja) | 1982-03-09 | 1982-03-09 | 半導体装置の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57036881A JPS58154270A (ja) | 1982-03-09 | 1982-03-09 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58154270A JPS58154270A (ja) | 1983-09-13 |
| JPH0576176B2 true JPH0576176B2 (cs) | 1993-10-22 |
Family
ID=12482113
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57036881A Granted JPS58154270A (ja) | 1982-03-09 | 1982-03-09 | 半導体装置の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58154270A (cs) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA1252227A (en) * | 1984-07-09 | 1989-04-04 | Fairchild Camera And Instrument Corporation | Self-aligned silicide base contact for bipolar transistor |
| JPS6156460A (ja) * | 1984-08-28 | 1986-03-22 | Nec Corp | 半導体装置及びその製造方法 |
| SE453547B (sv) * | 1985-03-07 | 1988-02-08 | Stiftelsen Inst Mikrovags | Forfarande vid framstellning av integrerade kretsar der pa en substratplatta ledare och s k gate-strukturer uppbygges |
| JPS61284963A (ja) * | 1985-06-10 | 1986-12-15 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置とその製造方法 |
| JPS62122173A (ja) * | 1985-11-20 | 1987-06-03 | Fujitsu Ltd | 半導体装置 |
| JPS635566A (ja) * | 1986-06-25 | 1988-01-11 | Nec Corp | 半導体装置の製造方法 |
| JPS63204654A (ja) * | 1987-02-19 | 1988-08-24 | Sanyo Electric Co Ltd | Mos半導体装置の製造方法 |
| NL8800222A (nl) * | 1988-01-29 | 1989-08-16 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting waarbij op zelfregistrerende wijze metaalsilicide wordt aangebracht. |
| JP2691258B2 (ja) * | 1988-09-26 | 1997-12-17 | 日本電信電話株式会社 | Mis型電界効果トランジスタの製法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55125649A (en) * | 1979-03-22 | 1980-09-27 | Nec Corp | Production of semiconductor integrated circuit |
-
1982
- 1982-03-09 JP JP57036881A patent/JPS58154270A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58154270A (ja) | 1983-09-13 |
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