JPH0573416B2 - - Google Patents
Info
- Publication number
- JPH0573416B2 JPH0573416B2 JP60147172A JP14717285A JPH0573416B2 JP H0573416 B2 JPH0573416 B2 JP H0573416B2 JP 60147172 A JP60147172 A JP 60147172A JP 14717285 A JP14717285 A JP 14717285A JP H0573416 B2 JPH0573416 B2 JP H0573416B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- image
- reconstruction
- processing
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Image Analysis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Image Processing (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60147172A JPS628740A (ja) | 1985-07-04 | 1985-07-04 | 断層検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60147172A JPS628740A (ja) | 1985-07-04 | 1985-07-04 | 断層検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS628740A JPS628740A (ja) | 1987-01-16 |
| JPH0573416B2 true JPH0573416B2 (enrdf_load_stackoverflow) | 1993-10-14 |
Family
ID=15424209
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60147172A Granted JPS628740A (ja) | 1985-07-04 | 1985-07-04 | 断層検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS628740A (enrdf_load_stackoverflow) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002541897A (ja) * | 1999-04-15 | 2002-12-10 | ゼネラル・エレクトリック・カンパニイ | 最適化ctプロトコル |
| JP2008279279A (ja) * | 2008-08-18 | 2008-11-20 | Toshiba Corp | X線コンピュータ断層撮影装置 |
| JP2010066157A (ja) * | 2008-09-11 | 2010-03-25 | Shimadzu Corp | コーンビームx線ct装置 |
| JP2011069650A (ja) * | 2009-09-24 | 2011-04-07 | Shimadzu Corp | 放射線断層像撮影装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6771732B2 (en) * | 2002-02-28 | 2004-08-03 | The Board Of Trustees Of The University Of Illinois | Methods and apparatus for fast divergent beam tomography |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59155237A (ja) * | 1983-02-25 | 1984-09-04 | 株式会社日立製作所 | Ct画像処理方式 |
-
1985
- 1985-07-04 JP JP60147172A patent/JPS628740A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002541897A (ja) * | 1999-04-15 | 2002-12-10 | ゼネラル・エレクトリック・カンパニイ | 最適化ctプロトコル |
| JP2008279279A (ja) * | 2008-08-18 | 2008-11-20 | Toshiba Corp | X線コンピュータ断層撮影装置 |
| JP2010066157A (ja) * | 2008-09-11 | 2010-03-25 | Shimadzu Corp | コーンビームx線ct装置 |
| JP2011069650A (ja) * | 2009-09-24 | 2011-04-07 | Shimadzu Corp | 放射線断層像撮影装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS628740A (ja) | 1987-01-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |