JPS628740A - 断層検査装置 - Google Patents
断層検査装置Info
- Publication number
- JPS628740A JPS628740A JP60147172A JP14717285A JPS628740A JP S628740 A JPS628740 A JP S628740A JP 60147172 A JP60147172 A JP 60147172A JP 14717285 A JP14717285 A JP 14717285A JP S628740 A JPS628740 A JP S628740A
- Authority
- JP
- Japan
- Prior art keywords
- data
- image
- reconstruction processing
- ray
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012545 processing Methods 0.000 claims description 48
- 230000005855 radiation Effects 0.000 claims description 28
- 230000005540 biological transmission Effects 0.000 claims description 11
- 238000007689 inspection Methods 0.000 claims description 2
- 230000015654 memory Effects 0.000 description 26
- 238000007781 pre-processing Methods 0.000 description 16
- 238000010521 absorption reaction Methods 0.000 description 9
- 238000012937 correction Methods 0.000 description 8
- 238000001514 detection method Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 5
- 238000013480 data collection Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 230000009466 transformation Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- CVOFKRWYWCSDMA-UHFFFAOYSA-N 2-chloro-n-(2,6-diethylphenyl)-n-(methoxymethyl)acetamide;2,6-dinitro-n,n-dipropyl-4-(trifluoromethyl)aniline Chemical compound CCC1=CC=CC(CC)=C1N(COC)C(=O)CCl.CCCN(CCC)C1=C([N+]([O-])=O)C=C(C(F)(F)F)C=C1[N+]([O-])=O CVOFKRWYWCSDMA-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 230000003902 lesion Effects 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60147172A JPS628740A (ja) | 1985-07-04 | 1985-07-04 | 断層検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60147172A JPS628740A (ja) | 1985-07-04 | 1985-07-04 | 断層検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS628740A true JPS628740A (ja) | 1987-01-16 |
JPH0573416B2 JPH0573416B2 (enrdf_load_stackoverflow) | 1993-10-14 |
Family
ID=15424209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60147172A Granted JPS628740A (ja) | 1985-07-04 | 1985-07-04 | 断層検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS628740A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005518892A (ja) * | 2002-02-28 | 2005-06-30 | ザ、ボード、オブ、トラスティーズ、オブ、ザ、ユニバシティー、オブ、イリノイ | 高速発散ビーム断層撮影のための方法及び装置 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000062675A1 (en) * | 1999-04-15 | 2000-10-26 | General Electric Company | Optimized ct protocol |
JP4665019B2 (ja) * | 2008-08-18 | 2011-04-06 | 株式会社東芝 | X線コンピュータ断層撮影装置 |
JP2010066157A (ja) * | 2008-09-11 | 2010-03-25 | Shimadzu Corp | コーンビームx線ct装置 |
JP5458771B2 (ja) * | 2009-09-24 | 2014-04-02 | 株式会社島津製作所 | 放射線断層像撮影装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59155237A (ja) * | 1983-02-25 | 1984-09-04 | 株式会社日立製作所 | Ct画像処理方式 |
-
1985
- 1985-07-04 JP JP60147172A patent/JPS628740A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59155237A (ja) * | 1983-02-25 | 1984-09-04 | 株式会社日立製作所 | Ct画像処理方式 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005518892A (ja) * | 2002-02-28 | 2005-06-30 | ザ、ボード、オブ、トラスティーズ、オブ、ザ、ユニバシティー、オブ、イリノイ | 高速発散ビーム断層撮影のための方法及び装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0573416B2 (enrdf_load_stackoverflow) | 1993-10-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |