JPH0571145B2 - - Google Patents
Info
- Publication number
- JPH0571145B2 JPH0571145B2 JP60057815A JP5781585A JPH0571145B2 JP H0571145 B2 JPH0571145 B2 JP H0571145B2 JP 60057815 A JP60057815 A JP 60057815A JP 5781585 A JP5781585 A JP 5781585A JP H0571145 B2 JPH0571145 B2 JP H0571145B2
- Authority
- JP
- Japan
- Prior art keywords
- region
- output
- mosfet
- gate electrode
- protection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 claims description 16
- 239000002184 metal Substances 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Protection Of Static Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60057815A JPS61216477A (ja) | 1985-03-22 | 1985-03-22 | 半導体装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60057815A JPS61216477A (ja) | 1985-03-22 | 1985-03-22 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61216477A JPS61216477A (ja) | 1986-09-26 |
JPH0571145B2 true JPH0571145B2 (de) | 1993-10-06 |
Family
ID=13066412
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60057815A Granted JPS61216477A (ja) | 1985-03-22 | 1985-03-22 | 半導体装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61216477A (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5060048A (en) * | 1986-10-22 | 1991-10-22 | Siemens Aktiengesellschaft & Semikron GmbH | Semiconductor component having at least one power mosfet |
KR940004449B1 (ko) * | 1990-03-02 | 1994-05-25 | 가부시키가이샤 도시바 | 반도체장치 |
JP3237110B2 (ja) * | 1998-03-24 | 2001-12-10 | 日本電気株式会社 | 半導体装置 |
JP2000357695A (ja) | 1999-06-16 | 2000-12-26 | Nec Corp | 半導体装置、半導体集積回路及び半導体装置の製造方法 |
JP2001144097A (ja) | 1999-11-11 | 2001-05-25 | Nec Corp | 半導体装置 |
US6934136B2 (en) * | 2002-04-24 | 2005-08-23 | Texas Instrument Incorporated | ESD protection of noise decoupling capacitors |
JP2004304136A (ja) * | 2003-04-01 | 2004-10-28 | Oki Electric Ind Co Ltd | 半導体装置 |
JP6099986B2 (ja) * | 2013-01-18 | 2017-03-22 | エスアイアイ・セミコンダクタ株式会社 | 半導体装置 |
JP6099985B2 (ja) * | 2013-01-18 | 2017-03-22 | エスアイアイ・セミコンダクタ株式会社 | 半導体装置 |
JP2016021530A (ja) * | 2014-07-15 | 2016-02-04 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
-
1985
- 1985-03-22 JP JP60057815A patent/JPS61216477A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS61216477A (ja) | 1986-09-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |