JPH0570931B2 - - Google Patents

Info

Publication number
JPH0570931B2
JPH0570931B2 JP59114562A JP11456284A JPH0570931B2 JP H0570931 B2 JPH0570931 B2 JP H0570931B2 JP 59114562 A JP59114562 A JP 59114562A JP 11456284 A JP11456284 A JP 11456284A JP H0570931 B2 JPH0570931 B2 JP H0570931B2
Authority
JP
Japan
Prior art keywords
polycrystalline silicon
film
silicon film
conductivity type
impurity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59114562A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60258965A (ja
Inventor
Keijiro Uehara
Hisayuki Higuchi
Akio Hayasaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59114562A priority Critical patent/JPS60258965A/ja
Priority to US06/741,525 priority patent/US4640721A/en
Publication of JPS60258965A publication Critical patent/JPS60258965A/ja
Publication of JPH0570931B2 publication Critical patent/JPH0570931B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
    • H01L21/2251—Diffusion into or out of group IV semiconductors
    • H01L21/2254—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
    • H01L21/2257—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides the applied layer being silicon or silicide or SIPOS, e.g. polysilicon, porous silicon
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • H01L21/28525—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table the conductive layers comprising semiconducting material

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Bipolar Transistors (AREA)
  • Weting (AREA)
JP59114562A 1984-06-06 1984-06-06 半導体装置の製造方法 Granted JPS60258965A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP59114562A JPS60258965A (ja) 1984-06-06 1984-06-06 半導体装置の製造方法
US06/741,525 US4640721A (en) 1984-06-06 1985-06-05 Method of forming bipolar transistors with graft base regions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59114562A JPS60258965A (ja) 1984-06-06 1984-06-06 半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JPS60258965A JPS60258965A (ja) 1985-12-20
JPH0570931B2 true JPH0570931B2 (en, 2012) 1993-10-06

Family

ID=14640915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59114562A Granted JPS60258965A (ja) 1984-06-06 1984-06-06 半導体装置の製造方法

Country Status (1)

Country Link
JP (1) JPS60258965A (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2997123B2 (ja) * 1992-04-03 2000-01-11 株式会社東芝 半導体装置の製造方法

Also Published As

Publication number Publication date
JPS60258965A (ja) 1985-12-20

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