JPH056153B2 - - Google Patents
Info
- Publication number
- JPH056153B2 JPH056153B2 JP63026795A JP2679588A JPH056153B2 JP H056153 B2 JPH056153 B2 JP H056153B2 JP 63026795 A JP63026795 A JP 63026795A JP 2679588 A JP2679588 A JP 2679588A JP H056153 B2 JPH056153 B2 JP H056153B2
- Authority
- JP
- Japan
- Prior art keywords
- board
- socket
- contact
- performance
- attachment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 29
- 239000002184 metal Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 229920001971 elastomer Polymers 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 239000000806 elastomer Substances 0.000 description 3
- 241000238631 Hexapoda Species 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63026795A JPH01202676A (ja) | 1988-02-08 | 1988-02-08 | 集積回路測定用接続装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63026795A JPH01202676A (ja) | 1988-02-08 | 1988-02-08 | 集積回路測定用接続装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01202676A JPH01202676A (ja) | 1989-08-15 |
| JPH056153B2 true JPH056153B2 (enExample) | 1993-01-25 |
Family
ID=12203257
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63026795A Granted JPH01202676A (ja) | 1988-02-08 | 1988-02-08 | 集積回路測定用接続装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01202676A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2705332B2 (ja) * | 1991-02-04 | 1998-01-28 | 日立電子エンジニアリング株式会社 | Icデバイスの電気的特性測定装置 |
-
1988
- 1988-02-08 JP JP63026795A patent/JPH01202676A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01202676A (ja) | 1989-08-15 |
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