JPH01202676A - 集積回路測定用接続装置 - Google Patents
集積回路測定用接続装置Info
- Publication number
- JPH01202676A JPH01202676A JP63026795A JP2679588A JPH01202676A JP H01202676 A JPH01202676 A JP H01202676A JP 63026795 A JP63026795 A JP 63026795A JP 2679588 A JP2679588 A JP 2679588A JP H01202676 A JPH01202676 A JP H01202676A
- Authority
- JP
- Japan
- Prior art keywords
- board
- socket
- contact
- ring
- probes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63026795A JPH01202676A (ja) | 1988-02-08 | 1988-02-08 | 集積回路測定用接続装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63026795A JPH01202676A (ja) | 1988-02-08 | 1988-02-08 | 集積回路測定用接続装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01202676A true JPH01202676A (ja) | 1989-08-15 |
| JPH056153B2 JPH056153B2 (enExample) | 1993-01-25 |
Family
ID=12203257
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63026795A Granted JPH01202676A (ja) | 1988-02-08 | 1988-02-08 | 集積回路測定用接続装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01202676A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04289467A (ja) * | 1991-02-04 | 1992-10-14 | Hitachi Electron Eng Co Ltd | Icデバイスの電気的特性測定装置 |
-
1988
- 1988-02-08 JP JP63026795A patent/JPH01202676A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04289467A (ja) * | 1991-02-04 | 1992-10-14 | Hitachi Electron Eng Co Ltd | Icデバイスの電気的特性測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH056153B2 (enExample) | 1993-01-25 |
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