JPH0559578B2 - - Google Patents

Info

Publication number
JPH0559578B2
JPH0559578B2 JP57191911A JP19191182A JPH0559578B2 JP H0559578 B2 JPH0559578 B2 JP H0559578B2 JP 57191911 A JP57191911 A JP 57191911A JP 19191182 A JP19191182 A JP 19191182A JP H0559578 B2 JPH0559578 B2 JP H0559578B2
Authority
JP
Japan
Prior art keywords
etched
silicon
etching
conductive material
material layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57191911A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5982730A (ja
Inventor
Masahiro Shibagaki
Tooru Watanabe
Yukimasa Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57191911A priority Critical patent/JPS5982730A/ja
Publication of JPS5982730A publication Critical patent/JPS5982730A/ja
Publication of JPH0559578B2 publication Critical patent/JPH0559578B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices

Landscapes

  • Drying Of Semiconductors (AREA)
JP57191911A 1982-11-02 1982-11-02 プラズマエツチング方法 Granted JPS5982730A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57191911A JPS5982730A (ja) 1982-11-02 1982-11-02 プラズマエツチング方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57191911A JPS5982730A (ja) 1982-11-02 1982-11-02 プラズマエツチング方法

Publications (2)

Publication Number Publication Date
JPS5982730A JPS5982730A (ja) 1984-05-12
JPH0559578B2 true JPH0559578B2 (https=) 1993-08-31

Family

ID=16282493

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57191911A Granted JPS5982730A (ja) 1982-11-02 1982-11-02 プラズマエツチング方法

Country Status (1)

Country Link
JP (1) JPS5982730A (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6163030A (ja) * 1984-08-20 1986-04-01 Kokusai Electric Co Ltd プラズマエッチング装置の電極温度制御方法
CN110931356B (zh) * 2018-09-19 2023-06-02 中芯国际集成电路制造(上海)有限公司 半导体结构及其制造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56134738A (en) * 1980-03-26 1981-10-21 Toshiba Corp Method of forming pattern
US4343677A (en) * 1981-03-23 1982-08-10 Bell Telephone Laboratories, Incorporated Method for patterning films using reactive ion etching thereof

Also Published As

Publication number Publication date
JPS5982730A (ja) 1984-05-12

Similar Documents

Publication Publication Date Title
CA1160761A (en) Fabrication of microminiature devices using plasma etching of silicon and resultant products
US20230220551A1 (en) Pulsed plasma (dc/rf) deposition of high quality c films for patterning
US6440864B1 (en) Substrate cleaning process
KR100530246B1 (ko) 자체 세정가능한 에칭 공정
KR100738850B1 (ko) 플라즈마 에칭 챔버에 대한 다단계 세정
JPS63238288A (ja) ドライエツチング方法
JPS6252455B2 (https=)
KR20020027520A (ko) 에칭 공정용 측벽 폴리머 형성 가스 첨가제
US10950458B2 (en) Etching method
WO2024024922A1 (ja) 基板処理方法及び基板処理装置
JP4754374B2 (ja) プラズマエッチング方法およびコンピュータ読み取り可能な記憶媒体
EP0133452B1 (en) Reactive ion etching method
JP3086362B2 (ja) プラズマ処理装置
JPH0722393A (ja) ドライエッチング装置及びドライエッチング方法
JPH0559578B2 (https=)
JP4216922B2 (ja) 酸化膜のエッチング方法
JPH07115085A (ja) プラズマ処理方法
JP2761172B2 (ja) プラズマ発生装置
JPS59163827A (ja) プラズマエツチング装置
JP3362093B2 (ja) エッチングダメージの除去方法
JPH0642467B2 (ja) プラズマエツチング方法
JP3086234B2 (ja) 表面処理方法
JP3269411B2 (ja) 半導体装置の製造方法
JP4308018B2 (ja) エッチング方法
JPH07263427A (ja) プラズマエッチング方法