JPH0556645B2 - - Google Patents
Info
- Publication number
- JPH0556645B2 JPH0556645B2 JP59079507A JP7950784A JPH0556645B2 JP H0556645 B2 JPH0556645 B2 JP H0556645B2 JP 59079507 A JP59079507 A JP 59079507A JP 7950784 A JP7950784 A JP 7950784A JP H0556645 B2 JPH0556645 B2 JP H0556645B2
- Authority
- JP
- Japan
- Prior art keywords
- mask
- exposure
- semiconductor substrate
- alignment
- alignment method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
- 
        - G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
 
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP59079507A JPS60224224A (ja) | 1984-04-20 | 1984-04-20 | マスクアライメント方法 | 
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP59079507A JPS60224224A (ja) | 1984-04-20 | 1984-04-20 | マスクアライメント方法 | 
Publications (2)
| Publication Number | Publication Date | 
|---|---|
| JPS60224224A JPS60224224A (ja) | 1985-11-08 | 
| JPH0556645B2 true JPH0556645B2 (OSRAM) | 1993-08-20 | 
Family
ID=13691855
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP59079507A Granted JPS60224224A (ja) | 1984-04-20 | 1984-04-20 | マスクアライメント方法 | 
Country Status (1)
| Country | Link | 
|---|---|
| JP (1) | JPS60224224A (OSRAM) | 
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS61166026A (ja) * | 1984-12-19 | 1986-07-26 | Fujitsu Ltd | 位置合わせ方法 | 
| US5451261A (en) * | 1992-09-11 | 1995-09-19 | Matsushita Electric Industrial Co., Ltd. | Metal film deposition apparatus and metal film deposition method | 
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| FR2388371A1 (fr) * | 1977-04-20 | 1978-11-17 | Thomson Csf | Procede d'alignement, dans un photorepeteur, d'une plaquette semi-conductrice et des motifs a y projeter et photorepeteur mettant en oeuvre un tel procede | 
- 
        1984
        - 1984-04-20 JP JP59079507A patent/JPS60224224A/ja active Granted
 
Also Published As
| Publication number | Publication date | 
|---|---|
| JPS60224224A (ja) | 1985-11-08 | 
Similar Documents
| Publication | Publication Date | Title | 
|---|---|---|
| US5885756A (en) | Methods of patterning a semiconductor wafer having an active region and a peripheral region, and patterned wafers formed thereby | |
| JPH0556645B2 (OSRAM) | ||
| JPH07117744B2 (ja) | ダイシングラインの形成方法 | |
| JPS60109228A (ja) | 投影露光装置 | |
| JP3434593B2 (ja) | 半導体装置の製造方法 | |
| JPH01293616A (ja) | 半導体集積回路の製造方法 | |
| JPH01234850A (ja) | 半導体集積回路用フォトマスク | |
| JPH01191416A (ja) | パターン形成方法 | |
| JP2715462B2 (ja) | レチクル及びこれを用いる半導体装置の製造方法 | |
| JPS60221757A (ja) | 露光用マスク | |
| JPS5839015A (ja) | 半導体装置の製造方法 | |
| JPS5931852B2 (ja) | フォトレジスト露光用マスク | |
| JPS5986221A (ja) | 特殊基準マ−クを用いたマスクのアライメント方法 | |
| JPS63275115A (ja) | 半導体装置のパタ−ン形成方法 | |
| JPS6325920A (ja) | 露光方法および装置 | |
| JPH03203313A (ja) | 半導体装置の露光方法 | |
| JPS607120A (ja) | 半導体基板の位置決め方法 | |
| JPS59161033A (ja) | フオトマスク | |
| JPS62247372A (ja) | 縮小投影露光方法 | |
| JPS61256635A (ja) | 半導体装置の製造方法 | |
| JPH04196512A (ja) | 半導体装置の製造方法 | |
| JPH02139912A (ja) | 半導体装置の製造方法 | |
| JPS6084544A (ja) | 縮小投影式露光装置 | |
| JPS6373251A (ja) | マスク | |
| JPH03155612A (ja) | 合わせマーク形成方法 |