JPH0526542Y2 - - Google Patents
Info
- Publication number
- JPH0526542Y2 JPH0526542Y2 JP1984023489U JP2348984U JPH0526542Y2 JP H0526542 Y2 JPH0526542 Y2 JP H0526542Y2 JP 1984023489 U JP1984023489 U JP 1984023489U JP 2348984 U JP2348984 U JP 2348984U JP H0526542 Y2 JPH0526542 Y2 JP H0526542Y2
- Authority
- JP
- Japan
- Prior art keywords
- cassette
- piece
- grounding
- detection
- detection piece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2348984U JPS60135674U (ja) | 1984-02-21 | 1984-02-21 | 電子ビ−ム描画用試料の導通検査機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2348984U JPS60135674U (ja) | 1984-02-21 | 1984-02-21 | 電子ビ−ム描画用試料の導通検査機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60135674U JPS60135674U (ja) | 1985-09-09 |
| JPH0526542Y2 true JPH0526542Y2 (enrdf_load_stackoverflow) | 1993-07-05 |
Family
ID=30516771
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2348984U Granted JPS60135674U (ja) | 1984-02-21 | 1984-02-21 | 電子ビ−ム描画用試料の導通検査機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60135674U (enrdf_load_stackoverflow) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5651348U (enrdf_load_stackoverflow) * | 1979-09-28 | 1981-05-07 |
-
1984
- 1984-02-21 JP JP2348984U patent/JPS60135674U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60135674U (ja) | 1985-09-09 |
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