JPS60135674U - 電子ビ−ム描画用試料の導通検査機構 - Google Patents
電子ビ−ム描画用試料の導通検査機構Info
- Publication number
- JPS60135674U JPS60135674U JP2348984U JP2348984U JPS60135674U JP S60135674 U JPS60135674 U JP S60135674U JP 2348984 U JP2348984 U JP 2348984U JP 2348984 U JP2348984 U JP 2348984U JP S60135674 U JPS60135674 U JP S60135674U
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- grounding
- cassette
- sample
- piece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Electron Beam Exposure (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2348984U JPS60135674U (ja) | 1984-02-21 | 1984-02-21 | 電子ビ−ム描画用試料の導通検査機構 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2348984U JPS60135674U (ja) | 1984-02-21 | 1984-02-21 | 電子ビ−ム描画用試料の導通検査機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60135674U true JPS60135674U (ja) | 1985-09-09 |
JPH0526542Y2 JPH0526542Y2 (enrdf_load_stackoverflow) | 1993-07-05 |
Family
ID=30516771
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2348984U Granted JPS60135674U (ja) | 1984-02-21 | 1984-02-21 | 電子ビ−ム描画用試料の導通検査機構 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60135674U (enrdf_load_stackoverflow) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5651348U (enrdf_load_stackoverflow) * | 1979-09-28 | 1981-05-07 |
-
1984
- 1984-02-21 JP JP2348984U patent/JPS60135674U/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5651348U (enrdf_load_stackoverflow) * | 1979-09-28 | 1981-05-07 |
Also Published As
Publication number | Publication date |
---|---|
JPH0526542Y2 (enrdf_load_stackoverflow) | 1993-07-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0521020Y2 (enrdf_load_stackoverflow) | ||
JPS60135674U (ja) | 電子ビ−ム描画用試料の導通検査機構 | |
JPS5874166U (ja) | 電気回路検査用プロ−ブ | |
JPS62188976A (ja) | 回路基板検査機用コンタクトプロ−ブ | |
JPS6217728Y2 (enrdf_load_stackoverflow) | ||
JPS5857960U (ja) | 探傷装置 | |
JPS6241246Y2 (enrdf_load_stackoverflow) | ||
JPS5813473Y2 (ja) | センシングスイッチ装置 | |
JPH09307024A (ja) | チップキャリア | |
JPS61174795A (ja) | 印刷配線板及びそれに取り付けられるチツプ部品の半田付けチエツク方法 | |
JPS63109658U (enrdf_load_stackoverflow) | ||
JPS6092176U (ja) | 導通検査用アダプタ | |
JPS5828360Y2 (ja) | Icクリツプ | |
JPH03245068A (ja) | 端子の検査方法 | |
JPH01173689U (enrdf_load_stackoverflow) | ||
JPH0422335B2 (enrdf_load_stackoverflow) | ||
JPH03105941A (ja) | 混成icの試験装置 | |
JPS5990861U (ja) | プリント配線機器の検査装置 | |
JPS5945574U (ja) | 電子部品の特性測定装置 | |
JPH0259676A (ja) | ボードテスターのプローブ装置 | |
JPS63236977A (ja) | 半導体装置のソケツト | |
JPS5832475U (ja) | ハンドリング装置の電極子 | |
JPS6415174U (enrdf_load_stackoverflow) | ||
JPS6397237U (enrdf_load_stackoverflow) | ||
JPH0233366U (enrdf_load_stackoverflow) |