JPH0518068B2 - - Google Patents

Info

Publication number
JPH0518068B2
JPH0518068B2 JP59264456A JP26445684A JPH0518068B2 JP H0518068 B2 JPH0518068 B2 JP H0518068B2 JP 59264456 A JP59264456 A JP 59264456A JP 26445684 A JP26445684 A JP 26445684A JP H0518068 B2 JPH0518068 B2 JP H0518068B2
Authority
JP
Japan
Prior art keywords
pattern
address
memory
code
clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59264456A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61142476A (ja
Inventor
Fujio Oonishi
Shuji Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59264456A priority Critical patent/JPS61142476A/ja
Publication of JPS61142476A publication Critical patent/JPS61142476A/ja
Publication of JPH0518068B2 publication Critical patent/JPH0518068B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP59264456A 1984-12-17 1984-12-17 パタ−ン発生器 Granted JPS61142476A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59264456A JPS61142476A (ja) 1984-12-17 1984-12-17 パタ−ン発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59264456A JPS61142476A (ja) 1984-12-17 1984-12-17 パタ−ン発生器

Publications (2)

Publication Number Publication Date
JPS61142476A JPS61142476A (ja) 1986-06-30
JPH0518068B2 true JPH0518068B2 (enrdf_load_stackoverflow) 1993-03-10

Family

ID=17403454

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59264456A Granted JPS61142476A (ja) 1984-12-17 1984-12-17 パタ−ン発生器

Country Status (1)

Country Link
JP (1) JPS61142476A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10392225T5 (de) * 2002-01-18 2005-01-27 Advantest Corp. Prüfvorrichtung

Also Published As

Publication number Publication date
JPS61142476A (ja) 1986-06-30

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