JPH0480544B2 - - Google Patents
Info
- Publication number
- JPH0480544B2 JPH0480544B2 JP57003584A JP358482A JPH0480544B2 JP H0480544 B2 JPH0480544 B2 JP H0480544B2 JP 57003584 A JP57003584 A JP 57003584A JP 358482 A JP358482 A JP 358482A JP H0480544 B2 JPH0480544 B2 JP H0480544B2
- Authority
- JP
- Japan
- Prior art keywords
- impurity diffusion
- diffusion layer
- floating gate
- gate conductor
- drain
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000009792 diffusion process Methods 0.000 claims description 43
- 239000012535 impurity Substances 0.000 claims description 36
- 239000000758 substrate Substances 0.000 claims description 32
- 239000004020 conductor Substances 0.000 claims description 27
- 230000015654 memory Effects 0.000 claims description 26
- 230000005641 tunneling Effects 0.000 claims description 19
- 239000004065 semiconductor Substances 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 7
- 229910004298 SiO 2 Inorganic materials 0.000 description 44
- 230000005684 electric field Effects 0.000 description 11
- 230000002457 bidirectional effect Effects 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 230000005689 Fowler Nordheim tunneling Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 230000004793 poor memory Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
- H01L29/7881—Programmable transistors with only two possible levels of programmation
- H01L29/7883—Programmable transistors with only two possible levels of programmation charging by tunnelling of carriers, e.g. Fowler-Nordheim tunnelling
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57003584A JPS58121679A (ja) | 1982-01-12 | 1982-01-12 | 半導体不揮発性記憶装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57003584A JPS58121679A (ja) | 1982-01-12 | 1982-01-12 | 半導体不揮発性記憶装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23801193A Division JPH0783067B2 (ja) | 1993-09-24 | 1993-09-24 | 半導体不揮発性記憶装置の書き込み及び消去方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58121679A JPS58121679A (ja) | 1983-07-20 |
JPH0480544B2 true JPH0480544B2 (zh) | 1992-12-18 |
Family
ID=11561497
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57003584A Granted JPS58121679A (ja) | 1982-01-12 | 1982-01-12 | 半導体不揮発性記憶装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58121679A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017011123A (ja) * | 2015-06-23 | 2017-01-12 | ルネサスエレクトロニクス株式会社 | 半導体装置および半導体装置の駆動方法 |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4698787A (en) * | 1984-11-21 | 1987-10-06 | Exel Microelectronics, Inc. | Single transistor electrically programmable memory device and method |
JPH01211979A (ja) * | 1988-02-19 | 1989-08-25 | Toshiba Corp | 不揮発性半導体メモリ |
US5315142A (en) * | 1992-03-23 | 1994-05-24 | International Business Machines Corporation | High performance trench EEPROM cell |
KR960009995B1 (ko) * | 1992-07-31 | 1996-07-25 | 삼성전자 주식회사 | 반도체 장치의 제조 방법 및 그 구조 |
US5424979A (en) * | 1992-10-02 | 1995-06-13 | Matsushita Electric Industrial Co., Ltd. | Non-volatile memory cell |
JP2536413B2 (ja) * | 1993-06-28 | 1996-09-18 | 日本電気株式会社 | 半導体集積回路装置の製造方法 |
JP2573464B2 (ja) * | 1993-10-12 | 1997-01-22 | 株式会社東芝 | 不揮発性半導体記憶装置 |
EP0748521B1 (en) * | 1994-03-03 | 2001-11-07 | Rohm Corporation | Over-erase detection in a low voltage one transistor flash eeprom cell using fowler-nordheim programming and erase |
JP2885134B2 (ja) * | 1995-06-15 | 1999-04-19 | 日本電気株式会社 | 半導体メモリ装置の製造方法 |
JP4605956B2 (ja) | 2001-09-19 | 2011-01-05 | 株式会社リコー | 半導体装置の製造方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55160471A (en) * | 1979-04-26 | 1980-12-13 | Itt | Programmable semiconductor memory cell |
JPS5633882A (en) * | 1979-08-24 | 1981-04-04 | Centre Electron Horloger | Nonnvolatile memory cell |
-
1982
- 1982-01-12 JP JP57003584A patent/JPS58121679A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55160471A (en) * | 1979-04-26 | 1980-12-13 | Itt | Programmable semiconductor memory cell |
JPS5633882A (en) * | 1979-08-24 | 1981-04-04 | Centre Electron Horloger | Nonnvolatile memory cell |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017011123A (ja) * | 2015-06-23 | 2017-01-12 | ルネサスエレクトロニクス株式会社 | 半導体装置および半導体装置の駆動方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS58121679A (ja) | 1983-07-20 |
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