JPH0480350B2 - - Google Patents

Info

Publication number
JPH0480350B2
JPH0480350B2 JP57200698A JP20069882A JPH0480350B2 JP H0480350 B2 JPH0480350 B2 JP H0480350B2 JP 57200698 A JP57200698 A JP 57200698A JP 20069882 A JP20069882 A JP 20069882A JP H0480350 B2 JPH0480350 B2 JP H0480350B2
Authority
JP
Japan
Prior art keywords
data
memories
test pattern
memory
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57200698A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5990067A (ja
Inventor
Masao Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP57200698A priority Critical patent/JPS5990067A/ja
Priority to US06/551,429 priority patent/US4586181A/en
Publication of JPS5990067A publication Critical patent/JPS5990067A/ja
Publication of JPH0480350B2 publication Critical patent/JPH0480350B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57200698A 1982-11-15 1982-11-15 論理回路試験用パタ−ン発生装置 Granted JPS5990067A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP57200698A JPS5990067A (ja) 1982-11-15 1982-11-15 論理回路試験用パタ−ン発生装置
US06/551,429 US4586181A (en) 1982-11-15 1983-11-14 Test pattern generating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57200698A JPS5990067A (ja) 1982-11-15 1982-11-15 論理回路試験用パタ−ン発生装置

Publications (2)

Publication Number Publication Date
JPS5990067A JPS5990067A (ja) 1984-05-24
JPH0480350B2 true JPH0480350B2 (US07413550-20080819-C00001.png) 1992-12-18

Family

ID=16428745

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57200698A Granted JPS5990067A (ja) 1982-11-15 1982-11-15 論理回路試験用パタ−ン発生装置

Country Status (2)

Country Link
US (1) US4586181A (US07413550-20080819-C00001.png)
JP (1) JPS5990067A (US07413550-20080819-C00001.png)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3513551A1 (de) * 1985-04-16 1986-10-16 Wandel & Goltermann Gmbh & Co, 7412 Eningen Digitaler wortgenerator zur automatischen erzeugung periodischer dauerzeichen aus n-bit-woertern aller wortgewichte und deren permutationen
JPH0760400B2 (ja) * 1986-01-07 1995-06-28 株式会社日立製作所 論理回路の診断方法
JPS62195572A (ja) * 1986-02-21 1987-08-28 Mitsubishi Electric Corp 半導体テスト装置
US4754396A (en) * 1986-03-28 1988-06-28 Tandem Computers Incorporated Overlapped control store
JPH0754345B2 (ja) * 1986-07-30 1995-06-07 株式会社日立製作所 Ｉｃ試験装置
US5050170A (en) * 1986-09-04 1991-09-17 Schlumberger Technologies, Inc. Apparatus for combining signals from first and second information processing elements
US4730318A (en) * 1986-11-24 1988-03-08 International Business Machines Corporation Modular organized storage tester
EP0314250A3 (en) * 1987-10-30 1992-03-04 New Microtime Inc. Video digital analog signal processing and display
US5384912A (en) * 1987-10-30 1995-01-24 New Microtime Inc. Real time video image processing system
US4875210A (en) * 1988-01-06 1989-10-17 Teradyne, Inc. Automatic circuit tester control system
US5321700A (en) * 1989-10-11 1994-06-14 Teradyne, Inc. High speed timing generator
US5073891A (en) * 1990-02-14 1991-12-17 Intel Corporation Method and apparatus for testing memory
CA2092291A1 (en) * 1990-09-24 1992-03-25 Steven G. Morton Sonet signal generating apparatus and method
US5195097A (en) * 1990-10-19 1993-03-16 International Business Machines Corporation High speed tester
DE19781563C2 (de) * 1996-11-29 2001-02-15 Advantest Corp Mustergenerator
US5872797A (en) * 1996-12-02 1999-02-16 International Business Machines Corporation Burn-in signal pattern generator
US6061815A (en) * 1996-12-09 2000-05-09 Schlumberger Technologies, Inc. Programming utility register to generate addresses in algorithmic pattern generator
JPH10319095A (ja) * 1997-05-22 1998-12-04 Mitsubishi Electric Corp 半導体テスト装置
KR100374328B1 (ko) 2000-06-03 2003-03-03 박현숙 칩 설계 검증 및 테스트 장치 및 방법
DE10034854A1 (de) * 2000-07-18 2002-02-14 Infineon Technologies Ag Verfahren und Vorrichtung zur Erzeugung digitaler Signalmuster
JP2003057319A (ja) * 2001-08-10 2003-02-26 Advantest Corp 半導体試験装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4313200A (en) * 1978-08-28 1982-01-26 Takeda Riken Kogyo Kabushikikaisha Logic test system permitting test pattern changes without dummy cycles
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
JPS5914840B2 (ja) * 1979-10-19 1984-04-06 日本電信電話株式会社 半導体メモリ試験用パタ−ン発生装置
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices

Also Published As

Publication number Publication date
US4586181A (en) 1986-04-29
JPS5990067A (ja) 1984-05-24

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