JPH0479129B2 - - Google Patents
Info
- Publication number
- JPH0479129B2 JPH0479129B2 JP59255589A JP25558984A JPH0479129B2 JP H0479129 B2 JPH0479129 B2 JP H0479129B2 JP 59255589 A JP59255589 A JP 59255589A JP 25558984 A JP25558984 A JP 25558984A JP H0479129 B2 JPH0479129 B2 JP H0479129B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- mark
- polarized light
- wafer
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7065—Production of alignment light, e.g. light source, control of coherence, polarization, pulse length, wavelength
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
-
- H10P95/00—
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Control Of Position Or Direction (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59255589A JPS61134022A (ja) | 1984-12-05 | 1984-12-05 | 位置合せ信号検出装置 |
| US07/319,820 US4937459A (en) | 1984-11-16 | 1989-03-06 | Alignment signal detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59255589A JPS61134022A (ja) | 1984-12-05 | 1984-12-05 | 位置合せ信号検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61134022A JPS61134022A (ja) | 1986-06-21 |
| JPH0479129B2 true JPH0479129B2 (show.php) | 1992-12-15 |
Family
ID=17280821
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59255589A Granted JPS61134022A (ja) | 1984-11-16 | 1984-12-05 | 位置合せ信号検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61134022A (show.php) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5158439B2 (ja) | 2006-04-17 | 2013-03-06 | 株式会社ニコン | 照明光学装置、露光装置、およびデバイス製造方法 |
| JPWO2008007632A1 (ja) | 2006-07-12 | 2009-12-10 | 株式会社ニコン | 照明光学装置、露光装置、およびデバイス製造方法 |
-
1984
- 1984-12-05 JP JP59255589A patent/JPS61134022A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61134022A (ja) | 1986-06-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |