JPH047583B2 - - Google Patents
Info
- Publication number
- JPH047583B2 JPH047583B2 JP59046804A JP4680484A JPH047583B2 JP H047583 B2 JPH047583 B2 JP H047583B2 JP 59046804 A JP59046804 A JP 59046804A JP 4680484 A JP4680484 A JP 4680484A JP H047583 B2 JPH047583 B2 JP H047583B2
- Authority
- JP
- Japan
- Prior art keywords
- subfield
- exposure
- stage
- deflection
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010894 electron beam technology Methods 0.000 claims description 28
- 238000000034 method Methods 0.000 claims description 17
- 238000010586 diagram Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000007493 shaping process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59046804A JPS60189932A (ja) | 1984-03-12 | 1984-03-12 | 電子ビ−ム露光方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59046804A JPS60189932A (ja) | 1984-03-12 | 1984-03-12 | 電子ビ−ム露光方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60189932A JPS60189932A (ja) | 1985-09-27 |
JPH047583B2 true JPH047583B2 (enrdf_load_stackoverflow) | 1992-02-12 |
Family
ID=12757515
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59046804A Granted JPS60189932A (ja) | 1984-03-12 | 1984-03-12 | 電子ビ−ム露光方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60189932A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62250636A (ja) * | 1986-04-23 | 1987-10-31 | Advantest Corp | 荷電粒子ビ−ム露光装置 |
JPH07111945B2 (ja) * | 1987-05-15 | 1995-11-29 | 東芝機械株式会社 | 荷電ビ−ム描画方法及び描画装置 |
-
1984
- 1984-03-12 JP JP59046804A patent/JPS60189932A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60189932A (ja) | 1985-09-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6555833B2 (en) | Charged particle beam lithography apparatus for forming pattern on semi-conductor | |
JPS5693318A (en) | Electron beam exposure device | |
JP3512946B2 (ja) | 電子ビーム描画装置および電子ビーム描画方法 | |
JP2614884B2 (ja) | 電子ビーム露光方法及びその装置 | |
JPH0336299B2 (enrdf_load_stackoverflow) | ||
JPH0691005B2 (ja) | 荷電ビ−ム描画方法 | |
JP3085918B2 (ja) | 荷電ビーム描画方法 | |
JPH047583B2 (enrdf_load_stackoverflow) | ||
JP2744833B2 (ja) | 荷電粒子ビーム描画方法 | |
JPS6219047B2 (enrdf_load_stackoverflow) | ||
JPH0521323A (ja) | 荷電ビーム描画装置 | |
JP3004034B2 (ja) | 荷電ビーム描画方法 | |
JP4266394B2 (ja) | 荷電粒子ビーム露光方法及び装置 | |
JPS5932128A (ja) | 荷電ビ−ム露光装置におけるビ−ム照射位置補正方法 | |
JP2664732B2 (ja) | 荷電ビーム描画方法 | |
JPH09293669A (ja) | 荷電ビーム描画装置および描画方法 | |
JPS6381819A (ja) | 電子ビ−ム露光の制御方式 | |
JPS6244404B2 (enrdf_load_stackoverflow) | ||
JP3313606B2 (ja) | 電子線露光装置及び露光方法 | |
JPH05267142A (ja) | 電子線描画装置 | |
JP2786671B2 (ja) | 荷電ビーム描画方法 | |
JPH07111943B2 (ja) | 電子ビ−ム露光装置 | |
JPS62149126A (ja) | 荷電ビ−ム露光方法 | |
JP2577970B2 (ja) | 荷電ビーム描画方法 | |
JPH036810A (ja) | 荷電粒子ビーム描画方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |