JPS60189932A - 電子ビ−ム露光方法 - Google Patents
電子ビ−ム露光方法Info
- Publication number
- JPS60189932A JPS60189932A JP59046804A JP4680484A JPS60189932A JP S60189932 A JPS60189932 A JP S60189932A JP 59046804 A JP59046804 A JP 59046804A JP 4680484 A JP4680484 A JP 4680484A JP S60189932 A JPS60189932 A JP S60189932A
- Authority
- JP
- Japan
- Prior art keywords
- exposure
- stage
- exposed
- deflection
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010894 electron beam technology Methods 0.000 title claims description 29
- 238000000034 method Methods 0.000 title claims description 19
- 230000005540 biological transmission Effects 0.000 abstract 1
- 230000004044 response Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59046804A JPS60189932A (ja) | 1984-03-12 | 1984-03-12 | 電子ビ−ム露光方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59046804A JPS60189932A (ja) | 1984-03-12 | 1984-03-12 | 電子ビ−ム露光方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60189932A true JPS60189932A (ja) | 1985-09-27 |
JPH047583B2 JPH047583B2 (enrdf_load_stackoverflow) | 1992-02-12 |
Family
ID=12757515
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59046804A Granted JPS60189932A (ja) | 1984-03-12 | 1984-03-12 | 電子ビ−ム露光方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60189932A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62250636A (ja) * | 1986-04-23 | 1987-10-31 | Advantest Corp | 荷電粒子ビ−ム露光装置 |
JPS63283130A (ja) * | 1987-05-15 | 1988-11-21 | Toshiba Mach Co Ltd | 荷電ビ−ム描画方法及び描画装置 |
-
1984
- 1984-03-12 JP JP59046804A patent/JPS60189932A/ja active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62250636A (ja) * | 1986-04-23 | 1987-10-31 | Advantest Corp | 荷電粒子ビ−ム露光装置 |
JPS63283130A (ja) * | 1987-05-15 | 1988-11-21 | Toshiba Mach Co Ltd | 荷電ビ−ム描画方法及び描画装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH047583B2 (enrdf_load_stackoverflow) | 1992-02-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |