JPH0451443Y2 - - Google Patents
Info
- Publication number
- JPH0451443Y2 JPH0451443Y2 JP1987012076U JP1207687U JPH0451443Y2 JP H0451443 Y2 JPH0451443 Y2 JP H0451443Y2 JP 1987012076 U JP1987012076 U JP 1987012076U JP 1207687 U JP1207687 U JP 1207687U JP H0451443 Y2 JPH0451443 Y2 JP H0451443Y2
- Authority
- JP
- Japan
- Prior art keywords
- coil
- flanges
- electromagnet
- bobbin
- coils
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 24
- 239000004020 conductor Substances 0.000 claims description 6
- 230000001681 protective effect Effects 0.000 claims description 6
- 238000003780 insertion Methods 0.000 claims description 5
- 230000037431 insertion Effects 0.000 claims description 5
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- 238000004804 winding Methods 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 2
- 230000000694 effects Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
Landscapes
- Electromagnets (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987012076U JPH0451443Y2 (US06252093-20010626-C00008.png) | 1987-01-29 | 1987-01-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987012076U JPH0451443Y2 (US06252093-20010626-C00008.png) | 1987-01-29 | 1987-01-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63119203U JPS63119203U (US06252093-20010626-C00008.png) | 1988-08-02 |
JPH0451443Y2 true JPH0451443Y2 (US06252093-20010626-C00008.png) | 1992-12-03 |
Family
ID=30799872
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987012076U Expired JPH0451443Y2 (US06252093-20010626-C00008.png) | 1987-01-29 | 1987-01-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0451443Y2 (US06252093-20010626-C00008.png) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5180960A (ja) * | 1975-01-08 | 1976-07-15 | Myazaki Seisakusho Kk | Denjishakuyokoirusochi no seizohoho |
JPS5615765U (US06252093-20010626-C00008.png) * | 1979-07-16 | 1981-02-10 | ||
JPS5631847U (US06252093-20010626-C00008.png) * | 1979-08-17 | 1981-03-28 | ||
JPS6116652U (ja) * | 1984-07-05 | 1986-01-30 | 富士通株式会社 | メモリデ−タ表示試験器 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5629937Y2 (US06252093-20010626-C00008.png) * | 1977-01-28 | 1981-07-16 | ||
JPS5863711U (ja) * | 1981-10-26 | 1983-04-28 | 株式会社日立製作所 | ソレノイド |
-
1987
- 1987-01-29 JP JP1987012076U patent/JPH0451443Y2/ja not_active Expired
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5180960A (ja) * | 1975-01-08 | 1976-07-15 | Myazaki Seisakusho Kk | Denjishakuyokoirusochi no seizohoho |
JPS5615765U (US06252093-20010626-C00008.png) * | 1979-07-16 | 1981-02-10 | ||
JPS5631847U (US06252093-20010626-C00008.png) * | 1979-08-17 | 1981-03-28 | ||
JPS6116652U (ja) * | 1984-07-05 | 1986-01-30 | 富士通株式会社 | メモリデ−タ表示試験器 |
Also Published As
Publication number | Publication date |
---|---|
JPS63119203U (US06252093-20010626-C00008.png) | 1988-08-02 |
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