JPH0451172B2 - - Google Patents

Info

Publication number
JPH0451172B2
JPH0451172B2 JP57204053A JP20405382A JPH0451172B2 JP H0451172 B2 JPH0451172 B2 JP H0451172B2 JP 57204053 A JP57204053 A JP 57204053A JP 20405382 A JP20405382 A JP 20405382A JP H0451172 B2 JPH0451172 B2 JP H0451172B2
Authority
JP
Japan
Prior art keywords
radiation
sensitive element
array
element array
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57204053A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5994046A (ja
Inventor
Matsuki Baba
Osamu Yamamoto
Tadaoki Yamashita
Hiroshi Tsutsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57204053A priority Critical patent/JPS5994046A/ja
Publication of JPS5994046A publication Critical patent/JPS5994046A/ja
Publication of JPH0451172B2 publication Critical patent/JPH0451172B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP57204053A 1982-11-19 1982-11-19 放射線受像装置 Granted JPS5994046A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57204053A JPS5994046A (ja) 1982-11-19 1982-11-19 放射線受像装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57204053A JPS5994046A (ja) 1982-11-19 1982-11-19 放射線受像装置

Publications (2)

Publication Number Publication Date
JPS5994046A JPS5994046A (ja) 1984-05-30
JPH0451172B2 true JPH0451172B2 (enrdf_load_stackoverflow) 1992-08-18

Family

ID=16483964

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57204053A Granted JPS5994046A (ja) 1982-11-19 1982-11-19 放射線受像装置

Country Status (1)

Country Link
JP (1) JPS5994046A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0640077B2 (ja) * 1983-10-12 1994-05-25 松下電器産業株式会社 放射線受像方法
JP2526870B2 (ja) * 1986-08-19 1996-08-21 株式会社島津製作所 放射線像撮像装置
JPH07114768B2 (ja) * 1987-04-22 1995-12-13 松下電器産業株式会社 Ｘ線診断装置
JP2869975B2 (ja) * 1988-06-08 1999-03-10 株式会社島津製作所 放射線像受像装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5754061Y2 (enrdf_load_stackoverflow) * 1975-03-31 1982-11-22
JPS5823911B2 (ja) * 1977-02-17 1983-05-18 株式会社東芝 マルチチャネル型半導体放射線検出器
JPS54108681A (en) * 1978-02-15 1979-08-25 Toshiba Corp Radiation pulse counting device
US4255659A (en) * 1978-03-27 1981-03-10 The Regents Of The University Of California Semiconductor radiation detector
JPS5633904U (enrdf_load_stackoverflow) * 1979-08-25 1981-04-02
JPS5663281A (en) * 1979-10-30 1981-05-29 Fuji Electric Co Ltd Radiation dose rate meter
JPS5710390A (en) * 1980-06-23 1982-01-19 Agency Of Ind Science & Technol Methane-fermenting method for thermally decomposed oil of municipal waste

Also Published As

Publication number Publication date
JPS5994046A (ja) 1984-05-30

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