JPH0434703B2 - - Google Patents

Info

Publication number
JPH0434703B2
JPH0434703B2 JP58252073A JP25207383A JPH0434703B2 JP H0434703 B2 JPH0434703 B2 JP H0434703B2 JP 58252073 A JP58252073 A JP 58252073A JP 25207383 A JP25207383 A JP 25207383A JP H0434703 B2 JPH0434703 B2 JP H0434703B2
Authority
JP
Japan
Prior art keywords
under test
logic circuit
test
logic
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58252073A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60138479A (ja
Inventor
Kenichi Mitsuoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP58252073A priority Critical patent/JPS60138479A/ja
Publication of JPS60138479A publication Critical patent/JPS60138479A/ja
Publication of JPH0434703B2 publication Critical patent/JPH0434703B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58252073A 1983-12-26 1983-12-26 論理回路試験装置 Granted JPS60138479A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58252073A JPS60138479A (ja) 1983-12-26 1983-12-26 論理回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58252073A JPS60138479A (ja) 1983-12-26 1983-12-26 論理回路試験装置

Publications (2)

Publication Number Publication Date
JPS60138479A JPS60138479A (ja) 1985-07-23
JPH0434703B2 true JPH0434703B2 (fr) 1992-06-08

Family

ID=17232170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58252073A Granted JPS60138479A (ja) 1983-12-26 1983-12-26 論理回路試験装置

Country Status (1)

Country Link
JP (1) JPS60138479A (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61133872A (ja) * 1984-12-03 1986-06-21 Fujitsu Ltd 集積回路試験装置
JPH0736300Y2 (ja) * 1987-11-30 1995-08-16 株式会社アドバンテスト タイミング校正装置

Also Published As

Publication number Publication date
JPS60138479A (ja) 1985-07-23

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