JPH04314355A - Chip carrier and soldering method thereof - Google Patents

Chip carrier and soldering method thereof

Info

Publication number
JPH04314355A
JPH04314355A JP7947891A JP7947891A JPH04314355A JP H04314355 A JPH04314355 A JP H04314355A JP 7947891 A JP7947891 A JP 7947891A JP 7947891 A JP7947891 A JP 7947891A JP H04314355 A JPH04314355 A JP H04314355A
Authority
JP
Japan
Prior art keywords
chip carrier
positioning
preliminary solder
pad
pads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7947891A
Other languages
Japanese (ja)
Inventor
Hironobu Ikeda
博伸 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP7947891A priority Critical patent/JPH04314355A/en
Publication of JPH04314355A publication Critical patent/JPH04314355A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/1401Structure
    • H01L2224/1403Bump connectors having different sizes, e.g. different diameters, heights or widths
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To prevent short-circuitting and opening due to positional displacement by providing a lower surface with a plurality of positioning pads each being greater than a connection pad in its area. CONSTITUTION:A pad 4 is provided on the lower surface of a chip carrier 1 and a positioning pad 2 is provided at four corners, and further the area of the positioning pad 2 is formed to be greater than the area of the pad 4. For this, a preliminary solder for the positioning pad 2 is made higher than a preliminary solder 5a of the pad 4. Then, the tip end of positioning pad 2 of the chip carrier 1 is superimposed so as to ride on a conductor circuit 6 of a substrate 7. Thereupon, it becomes unnecessary to position the preliminary solder 5a of the pad 4 of the chip carrier 1 with the conductor circuit 8.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、電子装置等に使用され
るチップキャリア及びチップキャリアを基板に半田付け
する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chip carrier used in electronic devices and a method for soldering a chip carrier to a substrate.

【0002】0002

【従来の技術】図4(a),(b),(c)は従来のチ
ップキャリアとその半田付け方法の各工程を示す断面図
である。
2. Description of the Related Art FIGS. 4(a), 4(b), and 4(c) are cross-sectional views showing each step of a conventional chip carrier and its soldering method.

【0003】図4(a)に示すように、チップキャリア
21の下面には同じ形状のパッド22が格子状に設けて
あり、パッド22に予備半田23を設け、基板26には
チップキャリア21のパッド22と対応する位置に導体
回路24を設け、図4(b)に示すように位置合わせマ
ーク25を目印にして、基板26の導体回路24に、チ
ップキャリア21のパッド22の予備半田23を重ね合
わせて加熱リフローし、冷却すると、図4(c)に示す
ように予備半田23は半田27に変わり、半田付けが終
了する。
As shown in FIG. 4(a), pads 22 of the same shape are provided in a grid pattern on the lower surface of the chip carrier 21, preliminary solder 23 is provided on the pads 22, and the pads 22 of the chip carrier 21 are provided on the substrate 26. A conductor circuit 24 is provided at a position corresponding to the pad 22, and the preliminary solder 23 of the pad 22 of the chip carrier 21 is applied to the conductor circuit 24 of the substrate 26, using the alignment mark 25 as a guide, as shown in FIG. 4(b). When they are stacked, heated, reflowed, and cooled, the preliminary solder 23 changes to solder 27, as shown in FIG. 4(c), and the soldering is completed.

【0004】0004

【発明が解決しようとする課題】上述した従来のチップ
キャリア及びその半田付け方法では、チップキャリアの
位置決め時にチップキャリア21の総てのパッド22の
予備半田23が、基板26の導体回路24上に乗ってい
る必要があり、チップキャリア21のパッド22及び基
板26の導体回路24の大きさやピッチが微細になれば
なるほど位置決め時に発生するずれの許容できる範囲に
余裕がなくなり、ずれの許容値を越えた状態で実装した
場合にオープンやショートが発生するという欠点がある
[Problems to be Solved by the Invention] In the conventional chip carrier and its soldering method described above, when positioning the chip carrier, the preliminary solder 23 of all the pads 22 of the chip carrier 21 is not deposited onto the conductor circuit 24 of the substrate 26. As the size and pitch of the pads 22 of the chip carrier 21 and the conductor circuits 24 of the substrate 26 become finer, there will be less margin in the allowable range for misalignment that occurs during positioning, and the tolerance for misalignment will be exceeded. It has the disadvantage that opens and shorts may occur if it is mounted in a closed state.

【0005】[0005]

【課題を解決するための手段】本発明のチップッキャリ
アは、外部との接続回路として複数の接続用パッドを下
面に有するチップキャリアにおいて、前記接続用パッド
より面積の大きい複数の位置決め用パッドを下面に有す
る。
[Means for Solving the Problems] A chip carrier of the present invention is a chip carrier having a plurality of connection pads on the bottom surface as a connection circuit with the outside, and a plurality of positioning pads having a larger area than the connection pads. Has it on the bottom surface.

【0006】また、本発明の半田付け方法は、チップキ
ャリアの下面に設けた外部との接続回路としての複数の
接続用パッドおよびこの接続用パッドより面積の大きい
複数の位置決め用パッドの全てに同種類の予備半田を設
ける第1の工程と、この第1の工程の後に前記接続用パ
ッドに対応して接続用導体回路が設けられ前記位置決め
用パッドに対応して前記接続用導体回路より面積の大き
い位置決め用導体回路が設けられた基板上に前記位置決
め用パッドに設けられた予備半田の先端が前記位置決め
用導体回路に乗るように前記チップキャリアを位置決め
する第2の工程と、この第2の工程の後に予備半田の加
熱リフローを行う第3の工程と、この第3の工程の後に
前記チップキャリアの上面から荷重を加える第4の工程
とを有する。
Furthermore, the soldering method of the present invention applies the same to all of the plurality of connection pads provided on the bottom surface of the chip carrier as external connection circuits and the plurality of positioning pads having a larger area than the connection pads. A first step of providing different kinds of preliminary solder, and after this first step, a connecting conductor circuit is provided corresponding to the connecting pad, and a connecting conductor circuit having an area smaller than the connecting conductor circuit corresponding to the positioning pad is provided. a second step of positioning the chip carrier on a substrate provided with a large positioning conductor circuit so that the tip of the preliminary solder provided on the positioning pad rests on the positioning conductor circuit; After the step, there is a third step of heating and reflowing the preliminary solder, and a fourth step of applying a load from the upper surface of the chip carrier after the third step.

【0007】さらに、本発明の半田付け方法は、チップ
キャリアの下面に設けた外部との接続回路としての複数
の接続用パッドに高融点の予備半田を設け、前記チップ
キャリアの下面に設けた前記接続用パッドより面積の大
きい複数の位置決め用パッドに低融点の予備半田を設け
る第1の工程と、この第1の工程の後に前記接続用パッ
ドに対応して接続用導体回路が設けられ前記位置決め用
パッドに対応して前記接続用導体回路より面積の大きい
位置決め用導体回路が設けられた基板上に前記位置決め
用パッドに設けられた予備半田の先端が前記位置決め用
導体回路に乗るように前記チップキャリアを位置決めす
る第2の工程と、この第2の工程の後に前記チップキャ
リアの位置決め用パッドに設けられた予備半田が溶融し
、前記接続用パッドに設けられた予備半田が溶融しない
温度で加熱リフローを行なう第3の工程と、この第3の
工程の後に、前記チップキャリアの上面から荷重を加え
る第4の工程と、この第4の工程の後に前記接続用全パ
ッドに設けられた予備半田が溶融する温度で加熱リフロ
ーする第5の工程とを有する。
Furthermore, in the soldering method of the present invention, a high melting point preliminary solder is provided on a plurality of connection pads as external connection circuits provided on the bottom surface of the chip carrier, and A first step of providing preliminary solder with a low melting point to a plurality of positioning pads having a larger area than the connection pads, and after this first step, connection conductor circuits are provided corresponding to the connection pads and the positioning is performed. Place the chip on a substrate on which a positioning conductor circuit having a larger area than the connection conductor circuit is provided corresponding to the connection pad so that the tip of the preliminary solder provided on the positioning pad rests on the positioning conductor circuit. a second step of positioning the carrier; and after this second step, heating at a temperature that melts the preliminary solder provided on the positioning pads of the chip carrier and does not melt the preliminary solder provided on the connection pads; a third step of performing reflow, a fourth step of applying a load from the top surface of the chip carrier after this third step, and a preliminary solder provided on all of the connection pads after this fourth step. and a fifth step of heating and reflowing the material at a temperature at which it melts.

【0008】[0008]

【実施例】次に本発明について、図面を参照して説明す
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained with reference to the drawings.

【0009】図1は、特許請求の範囲第1項記載のチッ
プキャリアの斜視図である。図1に示すチップキャリア
1の下面にはパッド4が設けてあり、四隅には位置決め
パッド2が設けてある。位置決めパッド2の面積は、パ
ッド4の面積より大きく作られている。
FIG. 1 is a perspective view of a chip carrier according to claim 1. Pads 4 are provided on the lower surface of the chip carrier 1 shown in FIG. 1, and positioning pads 2 are provided at the four corners. The area of the positioning pad 2 is made larger than the area of the pad 4.

【0010】図2は、特許請求範囲の請求項2記載のチ
ップキャリアの半田付け方法の工程を段階的に示す断面
図である。
FIG. 2 is a cross-sectional view showing step-by-step the steps of the chip carrier soldering method according to claim 2 of the present invention.

【0011】図2(a)に示すように、チップキャリア
1の下面の位置決めパッド2とパッド4には、それぞれ
予備半田3aと予備半田5aが設けてある。予備半田3
aと予備半田5aには、Sn /Pb (63/37w
t%)等の同種類の半田が用いられる。位置決めパッド
2の面積は、パッド4の面積より大きいため、位置決め
パッド2の予備半田3aは、パッド4の予備半田5aよ
り高くなる。チップキャリア1を実装する基板7には、
チップキャリア1の位置決めパッド2とパッド4に対応
する位置それぞれに導体回路6と導体回路8が設けてあ
り、チップキャリア1と同様に、基板7の導体回路6の
面積は、導体回路8の面積より大きく設けてある。
As shown in FIG. 2(a), preliminary solder 3a and preliminary solder 5a are provided on the positioning pads 2 and pads 4 on the lower surface of the chip carrier 1, respectively. Preliminary solder 3
a and the preliminary solder 5a are Sn/Pb (63/37w
The same type of solder such as t%) is used. Since the area of the positioning pad 2 is larger than the area of the pad 4, the preliminary solder 3a of the positioning pad 2 is higher than the preliminary solder 5a of the pad 4. The substrate 7 on which the chip carrier 1 is mounted includes
A conductor circuit 6 and a conductor circuit 8 are provided at positions corresponding to the positioning pads 2 and pads 4 on the chip carrier 1, respectively.Similar to the chip carrier 1, the area of the conductor circuit 6 on the substrate 7 is equal to the area of the conductor circuit 8. It is set larger.

【0012】次に、図2(b)に示すようにチップキャ
リア1の位置決めパッド2の予備半田3aの先端が、基
板7の導体回路6に乗るように重ね合わせるが、この時
チップキャリア1のパッド4の予備半田5aと、基板7
の導体回路8とを位置合わせする必要はない。基板7の
導体回路6の面積は、導体回路8の面積より大きく設け
ているため位置合わせ時のずれの許容値が大きく、チッ
プキャリア1の位置合わせは容易に行なうことができる
Next, as shown in FIG. 2(b), the tip of the preliminary solder 3a of the positioning pad 2 of the chip carrier 1 is overlapped so that it rests on the conductor circuit 6 of the substrate 7. Preliminary solder 5a of pad 4 and board 7
It is not necessary to align the conductor circuits 8 of Since the area of the conductor circuit 6 on the substrate 7 is larger than the area of the conductor circuit 8, the tolerance for deviation during alignment is large, and the alignment of the chip carrier 1 can be easily performed.

【0013】次に加熱リフロー、例えば予備半田にSn
 /Pb (63/37wt%)を使用している場合は
230℃加熱を行なうことによって、図2(c)に示す
ように予備半田3aは溶融して半田9aに変わり、チッ
プキャリア1の位置決めパッド2と、基板7の導体回路
6が接続される。この時、溶融した半田9aの表面張力
により、チップキャリア1と基板7の正確な位置合わせ
が自動的に行なわれる。
Next, heating reflow is performed, for example, Sn is added to the preliminary solder.
/Pb (63/37wt%), by heating at 230°C, the preliminary solder 3a melts and turns into solder 9a, as shown in FIG. 2 and the conductor circuit 6 of the substrate 7 are connected. At this time, the chip carrier 1 and the substrate 7 are automatically aligned accurately due to the surface tension of the melted solder 9a.

【0014】更に図2(d)示すように、この状態でチ
ップキャリア1の上面より荷重Aを加えることによって
、チップキャリア1のパッド4の予備半田5aが、基板
7の導体回路8と接続され半田10aに変わる。
Furthermore, as shown in FIG. 2(d), by applying a load A from the top surface of the chip carrier 1 in this state, the preliminary solder 5a of the pad 4 of the chip carrier 1 is connected to the conductor circuit 8 of the substrate 7. Change to solder 10a.

【0015】最後に、冷却、洗浄を行なうことにより、
全工程を完了する。
Finally, by cooling and washing,
Complete the entire process.

【0016】図3は、特許請求範囲の請求項3記載チッ
プキャリアの半田付け方法の工程を段階的に示す断面図
である。
FIG. 3 is a cross-sectional view showing step-by-step the steps of a method for soldering a chip carrier according to claim 3 of the present invention.

【0017】図3(a)に示すように、チップキャリア
1の下面の位置決めパッド2とパッド4には、それぞれ
予備半田3bと予備半田5bが設けてる。予備半田3b
には、予備半田5bの融点より低い半田材料を使用する
。例えば、予備半田3bにSn /Pb /Bi (4
3/43/14wt%)を使用し、予備半田5bにSn
 /Pb (63/37wt%)を使用する。位置決め
パッド2の面積は、パッド4の面積より大きいため、位
置決めパッド2の予備半田3bは、パッド4の予備半田
5bより高くなる。チップキャリア1に実装する基板7
には、チップキャリア1の位置決めパッド2とパッド4
に対応する位置に導体回路6と導体回路8が設けてあり
、チップキャリア1と同様に、基板7の導体回路6の面
積は、導体回路8の面積より大きく設けてある。
As shown in FIG. 3(a), preliminary solder 3b and preliminary solder 5b are provided on the positioning pads 2 and pads 4 on the lower surface of the chip carrier 1, respectively. Preliminary solder 3b
For this purpose, a solder material having a melting point lower than that of the preliminary solder 5b is used. For example, the preliminary solder 3b contains Sn /Pb /Bi (4
3/43/14wt%), and Sn was used as the preliminary solder 5b.
/Pb (63/37wt%) is used. Since the area of the positioning pad 2 is larger than the area of the pad 4, the preliminary solder 3b of the positioning pad 2 is higher than the preliminary solder 5b of the pad 4. Substrate 7 mounted on chip carrier 1
The positioning pads 2 and 4 of the chip carrier 1 are
A conductor circuit 6 and a conductor circuit 8 are provided at positions corresponding to the chip carrier 1, and the area of the conductor circuit 6 on the substrate 7 is larger than the area of the conductor circuit 8, similarly to the chip carrier 1.

【0018】次に、図3(b)に示すようにチップキャ
リア1の位置決めパッド2の予備半田3bの先端が、基
板7の導体回路6に乗るように重ね合わせるが、この時
チップキャリア1のパッド4の予備半田5bと、基板7
の導体回路8とを位置合わせする必要はない。基板7の
導体回路6の面積は、導体回路8の面積より大きく設け
ているため位置合わせ時のずれの許容値が大きく、チッ
プキャリア1の位置合わせは容易に行なうことができる
Next, as shown in FIG. 3(b), the tip of the preliminary solder 3b of the positioning pad 2 of the chip carrier 1 is overlapped so that it rests on the conductor circuit 6 of the substrate 7. Preliminary solder 5b of pad 4 and board 7
It is not necessary to align the conductor circuits 8 of Since the area of the conductor circuit 6 on the substrate 7 is larger than the area of the conductor circuit 8, the tolerance for deviation during alignment is large, and the alignment of the chip carrier 1 can be easily performed.

【0019】次に予備半田3bが溶融し、予備半田5b
を溶融しない温度で加熱リフロー、例えば予備半田3b
にSn /Pb /Bi (43/43/14wt%)
を使用し、予備半田5bにSn /Pb (63/37
wt%)を使用する場合は175℃加熱を行なうことに
よって、図3(c)に示すように予備半田3bは溶融し
て半田9bに変わり、チップキャリア1の位置決めパッ
ド2と、基板7の導体回路6が接続される。この時溶融
した半田9bの表面張力により、チップキャリア1と基
板7の位置合わせが自動的に行なわれる。
Next, the preliminary solder 3b is melted, and the preliminary solder 5b is melted.
Heating reflow at a temperature that does not melt the material, e.g. preliminary solder 3b
Sn/Pb/Bi (43/43/14wt%)
using Sn/Pb (63/37
wt%), by heating to 175°C, the preliminary solder 3b melts and turns into solder 9b, as shown in FIG. Circuit 6 is connected. At this time, the chip carrier 1 and the substrate 7 are automatically aligned due to the surface tension of the melted solder 9b.

【0020】次に図3(d)に示すように、チップキャ
リア1の上面より荷重Aを加えることによって、チップ
キャリア1のパッド4の予備半田5bの先端が、基板7
の導体回路8と接触する。
Next, as shown in FIG. 3(d), by applying a load A from the top surface of the chip carrier 1, the tips of the preliminary solder 5b of the pads 4 of the chip carrier 1 touch the substrate 7.
contact with the conductor circuit 8.

【0021】次に予備半田5bが溶融する温度で加熱リ
フロー、例えば予備半田5bにSn /Pb (63/
37wt%)を使用する場合は230℃加熱を行なうこ
とによって、予備半田5bは半田10bに変わり、チッ
プキャリア1のパッド4と基板7の導体回路8が接続さ
れる。
Next, the preliminary solder 5b is heated and reflowed at a temperature that melts it, for example, the preliminary solder 5b is coated with Sn/Pb (63/
37 wt%), by heating at 230° C., the preliminary solder 5b is changed to solder 10b, and the pads 4 of the chip carrier 1 and the conductive circuits 8 of the substrate 7 are connected.

【0022】最後に、冷却、洗浄を行なうことにより、
全工程を完了する。
Finally, by cooling and washing,
Complete the entire process.

【0023】[0023]

【発明の効果】本発明のチップキャリア及び半田付け方
法は、容易でかつ短時間のチップキャリアを基板上に位
置合わせすることができ、加熱リフロー時においても位
置ずれによるショート、オープンのない安定した半田付
けができる効果がある。
Effects of the Invention: The chip carrier and soldering method of the present invention can easily and quickly align the chip carrier on the substrate, and the chip carrier can be stably aligned without short circuits or open circuits due to misalignment even during heating reflow. It has the effect of soldering.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明のチップキャリアの一実施例を示す斜視
図である。
FIG. 1 is a perspective view showing an embodiment of a chip carrier of the present invention.

【図2】本発明の半田付け方法の一実施例を段階的に示
す断面図である。
FIG. 2 is a cross-sectional view showing step-by-step an embodiment of the soldering method of the present invention.

【図3】本発明の半田付け方法の他の実施例を段階的に
示す断面図である。
FIG. 3 is a cross-sectional view showing step-by-step another embodiment of the soldering method of the present invention.

【図4】従来のチップキャリアの半田付け方法を示す縦
断面図である。
FIG. 4 is a vertical cross-sectional view showing a conventional chip carrier soldering method.

【符号の説明】[Explanation of symbols]

1,21    チップキャリア 2    位置決めパッド 3a,3b,5a,5b,23    予備半田4,2
2    パッド 6,8,24    導体回路 7,26    基板 9a,9b,10a,10b,27    半田25 
   位置合わせマーク
1, 21 Chip carrier 2 Positioning pads 3a, 3b, 5a, 5b, 23 Preliminary solder 4, 2
2 Pads 6, 8, 24 Conductor circuits 7, 26 Boards 9a, 9b, 10a, 10b, 27 Solder 25
alignment mark

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】  外部との接続回路として複数の接続用
パッドを下面に有するチップキャリアにおいて、前記接
続用パッドより面積の大きい複数の位置決め用パッドを
下面に有することを特徴とするチップキャリア。
1. A chip carrier having a plurality of connection pads on a lower surface as a connection circuit with the outside, the chip carrier having a plurality of positioning pads on the lower surface having a larger area than the connection pads.
【請求項2】  チップキャリアの下面に設けた外部と
の接続回路としての複数の接続用パッドおよびこの接続
用パッドより面積の大きい複数の位置決め用パッドの全
てに同種類の予備半田を設ける第1の工程と、この第1
の工程の後に前記接続用パッドに対応して接続用導体回
路が設けられ前記位置決め用パッドに対応して前記接続
用導体回路より面積の大きい位置決め用導体回路が設け
られた基板上に前記位置決め用パッドに設けられた予備
半田の先端が前記位置決め用導体回路に乗るように前記
チップキャリアを位置決めする第2の工程と、この第2
の工程の後に予備半田の加熱リフローを行う第3の工程
と、この第3の工程の後に前記チップキャリアの上面か
ら荷重を加える第4の工程とを有するチップキャリアの
半田付け方法。
2. A first method in which preliminary solder of the same type is applied to all of a plurality of connection pads provided on the lower surface of the chip carrier as external connection circuits and a plurality of positioning pads having a larger area than the connection pads. This process and this first
After the process, a connecting conductor circuit is provided corresponding to the connecting pad, and a positioning conductor circuit having a larger area than the connecting conductor circuit is provided corresponding to the positioning pad. a second step of positioning the chip carrier so that the tip of the preliminary solder provided on the pad rests on the positioning conductor circuit;
A method for soldering a chip carrier, comprising: a third step of heating and reflowing preliminary solder after the step; and a fourth step of applying a load from the upper surface of the chip carrier after the third step.
【請求項3】  チップキャリアの下面に設けた外部と
の接続回路としての複数の接続用パッドに高融点の予備
半田を設け、前記チップキャリアの下面に設けた前記接
続用パッドより面積の大きい複数の位置決め用パッドに
低融点の予備半田を設ける第1の工程と、この第1の工
程の後に前記接続用パッドに対応して接続用導体回路が
設けられ前記位置決め用パッドに対応して前記接続用導
体回路より面積の大きい位置決め用導体回路が設けられ
た基板上に前記位置決め用パッドに設けられた予備半田
の先端が前記位置決め用導体回路に乗るように前記チッ
プキャリアを位置決めする第2の工程と、この第2の工
程の後に前記チップキャリアの位置決め用パッドに設け
られた予備半田が溶融し、前記接続用パッドに設けられ
た予備半田が溶融しない温度で加熱リフローを行なう第
3の工程と、この第3の工程の後に前記チップキャリア
の上面から荷重を加える第4の工程と、この第4の工程
の後に前記接続用パッドに設けられた予備半田が溶融す
る温度で加熱リフローする第5の工程とを有するチップ
キャリアの半田付け方法。
3. Preliminary solder with a high melting point is provided on a plurality of connection pads provided on the bottom surface of the chip carrier as connection circuits with the outside, and the plurality of connection pads having a larger area than the connection pads provided on the bottom surface of the chip carrier are provided with high melting point preliminary solder. a first step of applying low-melting-point preliminary solder to the positioning pads; and after this first step, connecting conductor circuits are provided corresponding to the connection pads; a second step of positioning the chip carrier on a substrate on which a positioning conductor circuit having a larger area than the positioning conductor circuit is provided so that the tip of the preliminary solder provided on the positioning pad is on the positioning conductor circuit; After this second step, a third step of performing heating reflow at a temperature where the preliminary solder provided on the positioning pads of the chip carrier is melted and the preliminary solder provided on the connection pads is not melted. , after this third step, a fourth step of applying a load from the top surface of the chip carrier; and after this fourth step, a fifth step of heating and reflowing at a temperature that melts the preliminary solder provided on the connection pads. A method for soldering a chip carrier, comprising the steps of:
JP7947891A 1991-04-12 1991-04-12 Chip carrier and soldering method thereof Pending JPH04314355A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7947891A JPH04314355A (en) 1991-04-12 1991-04-12 Chip carrier and soldering method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7947891A JPH04314355A (en) 1991-04-12 1991-04-12 Chip carrier and soldering method thereof

Publications (1)

Publication Number Publication Date
JPH04314355A true JPH04314355A (en) 1992-11-05

Family

ID=13691005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7947891A Pending JPH04314355A (en) 1991-04-12 1991-04-12 Chip carrier and soldering method thereof

Country Status (1)

Country Link
JP (1) JPH04314355A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09284005A (en) * 1996-04-15 1997-10-31 Saitama Nippon Denki Kk Dielectric filter
JPH1041426A (en) * 1996-07-19 1998-02-13 Nec Corp Ball grid array package mounting structure and ball grid array package
JPH11160584A (en) * 1997-12-01 1999-06-18 Kyocera Corp Optical package and optical module using the same
US6116922A (en) * 1999-02-02 2000-09-12 Hon Hai Precision Ind. Co., Ltd. Electrical connector
US6316735B1 (en) * 1996-11-08 2001-11-13 Ricoh Company, Ltd. Semiconductor chip mounting board and a semiconductor device using same board
US6927491B1 (en) 1998-12-04 2005-08-09 Nec Corporation Back electrode type electronic part and electronic assembly with the same mounted on printed circuit board
JP2015179794A (en) * 2013-05-30 2015-10-08 京セラサーキットソリューションズ株式会社 wiring board
JP2015179800A (en) * 2013-05-30 2015-10-08 京セラサーキットソリューションズ株式会社 wiring board
JP2018060835A (en) * 2016-09-30 2018-04-12 日亜化学工業株式会社 Semiconductor device package and semiconductor device using the same
DE102011016361B4 (en) 2010-04-07 2022-01-20 Maxim Integrated Products, Inc. Wafer-level chip-scale package device with bump units configured to reduce stress-related failures

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892231A (en) * 1981-11-28 1983-06-01 Mitsubishi Electric Corp Bonding for semiconductor element
JPS6273639A (en) * 1985-09-26 1987-04-04 Fujitsu Ltd Method of mounting semiconductor chip
JPH02164045A (en) * 1988-12-19 1990-06-25 Fujitsu Ltd Packaging of solder bump component
JPH0371649A (en) * 1989-08-11 1991-03-27 Hitachi Ltd Semiconductor integrated circuit and manufacture thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892231A (en) * 1981-11-28 1983-06-01 Mitsubishi Electric Corp Bonding for semiconductor element
JPS6273639A (en) * 1985-09-26 1987-04-04 Fujitsu Ltd Method of mounting semiconductor chip
JPH02164045A (en) * 1988-12-19 1990-06-25 Fujitsu Ltd Packaging of solder bump component
JPH0371649A (en) * 1989-08-11 1991-03-27 Hitachi Ltd Semiconductor integrated circuit and manufacture thereof

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09284005A (en) * 1996-04-15 1997-10-31 Saitama Nippon Denki Kk Dielectric filter
JPH1041426A (en) * 1996-07-19 1998-02-13 Nec Corp Ball grid array package mounting structure and ball grid array package
US6316735B1 (en) * 1996-11-08 2001-11-13 Ricoh Company, Ltd. Semiconductor chip mounting board and a semiconductor device using same board
JPH11160584A (en) * 1997-12-01 1999-06-18 Kyocera Corp Optical package and optical module using the same
US6927491B1 (en) 1998-12-04 2005-08-09 Nec Corporation Back electrode type electronic part and electronic assembly with the same mounted on printed circuit board
US6116922A (en) * 1999-02-02 2000-09-12 Hon Hai Precision Ind. Co., Ltd. Electrical connector
DE102011016361B4 (en) 2010-04-07 2022-01-20 Maxim Integrated Products, Inc. Wafer-level chip-scale package device with bump units configured to reduce stress-related failures
JP2015179794A (en) * 2013-05-30 2015-10-08 京セラサーキットソリューションズ株式会社 wiring board
JP2015179800A (en) * 2013-05-30 2015-10-08 京セラサーキットソリューションズ株式会社 wiring board
JP2018060835A (en) * 2016-09-30 2018-04-12 日亜化学工業株式会社 Semiconductor device package and semiconductor device using the same

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