JPH0428150B2 - - Google Patents

Info

Publication number
JPH0428150B2
JPH0428150B2 JP59072836A JP7283684A JPH0428150B2 JP H0428150 B2 JPH0428150 B2 JP H0428150B2 JP 59072836 A JP59072836 A JP 59072836A JP 7283684 A JP7283684 A JP 7283684A JP H0428150 B2 JPH0428150 B2 JP H0428150B2
Authority
JP
Japan
Prior art keywords
region
drain
gate
source
igfet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59072836A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59229870A (ja
Inventor
Shikayuki Ochi
Takeaki Okabe
Isao Yoshida
Minoru Nagata
Hideshi Ito
Masatomo Furumi
Masaru Takeuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59072836A priority Critical patent/JPS59229870A/ja
Publication of JPS59229870A publication Critical patent/JPS59229870A/ja
Publication of JPH0428150B2 publication Critical patent/JPH0428150B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/601Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs 
    • H10D30/603Insulated-gate field-effect transistors [IGFET] having lightly-doped drain or source extensions, e.g. LDD IGFETs or DDD IGFETs  having asymmetry in the channel direction, e.g. lateral high-voltage MISFETs having drain offset region or extended drain IGFETs [EDMOS]
JP59072836A 1984-04-13 1984-04-13 大電力用絶縁ゲ−ト電界効果型半導体装置 Granted JPS59229870A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59072836A JPS59229870A (ja) 1984-04-13 1984-04-13 大電力用絶縁ゲ−ト電界効果型半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59072836A JPS59229870A (ja) 1984-04-13 1984-04-13 大電力用絶縁ゲ−ト電界効果型半導体装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP4265177A Division JPS53128281A (en) 1977-04-15 1977-04-15 Insulated gate field effect type semiconductor device for large power

Publications (2)

Publication Number Publication Date
JPS59229870A JPS59229870A (ja) 1984-12-24
JPH0428150B2 true JPH0428150B2 (enrdf_load_stackoverflow) 1992-05-13

Family

ID=13500890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59072836A Granted JPS59229870A (ja) 1984-04-13 1984-04-13 大電力用絶縁ゲ−ト電界効果型半導体装置

Country Status (1)

Country Link
JP (1) JPS59229870A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5093379A (enrdf_load_stackoverflow) * 1973-12-19 1975-07-25

Also Published As

Publication number Publication date
JPS59229870A (ja) 1984-12-24

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