JPH0426434B2 - - Google Patents

Info

Publication number
JPH0426434B2
JPH0426434B2 JP59213592A JP21359284A JPH0426434B2 JP H0426434 B2 JPH0426434 B2 JP H0426434B2 JP 59213592 A JP59213592 A JP 59213592A JP 21359284 A JP21359284 A JP 21359284A JP H0426434 B2 JPH0426434 B2 JP H0426434B2
Authority
JP
Japan
Prior art keywords
test piece
automatic
test
supply mechanism
sample container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59213592A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6191571A (ja
Inventor
Kazue Inoe
Hiroshi Yamamoto
Hiroshi Hyodo
Shinichi Kishimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Arkray Inc
Original Assignee
Kyoto Daiichi Kagaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyoto Daiichi Kagaku KK filed Critical Kyoto Daiichi Kagaku KK
Priority to JP21359284A priority Critical patent/JPS6191571A/ja
Priority to US06/782,356 priority patent/US4876204A/en
Priority to DE8585112715T priority patent/DE3576857D1/de
Priority to EP85112715A priority patent/EP0180792B2/fr
Priority to CN198585108392A priority patent/CN85108392A/zh
Publication of JPS6191571A publication Critical patent/JPS6191571A/ja
Publication of JPH0426434B2 publication Critical patent/JPH0426434B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G01N2035/00049—Transport arrangements specific to flat sample substrates, e.g. pusher blade for loading/unloading a carousel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00089—Magazines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G01N2035/00118—Test strips, e.g. paper for multiple tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N2035/1025—Fluid level sensing

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP21359284A 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置 Granted JPS6191571A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP21359284A JPS6191571A (ja) 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置
US06/782,356 US4876204A (en) 1984-10-11 1985-10-01 Method and apparatus of automatic continuous analysis using analytical implement
DE8585112715T DE3576857D1 (de) 1984-10-11 1985-10-08 Verfahren und vorrichtung zur automatischen kontinuierlichen analyse unter verwendung eines analysegeraetes.
EP85112715A EP0180792B2 (fr) 1984-10-11 1985-10-08 Procédé et dispositif pour l'analyse automatique et continue à l'aide d'un appareil analytique
CN198585108392A CN85108392A (zh) 1984-10-11 1985-10-09 分析器具的连续自动分析方法及装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21359284A JPS6191571A (ja) 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置

Publications (2)

Publication Number Publication Date
JPS6191571A JPS6191571A (ja) 1986-05-09
JPH0426434B2 true JPH0426434B2 (fr) 1992-05-07

Family

ID=16641746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21359284A Granted JPS6191571A (ja) 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置

Country Status (1)

Country Link
JP (1) JPS6191571A (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5039615A (en) * 1987-04-11 1991-08-13 Kabushiki Kaisha Kyoto Daiichi Kagaku Method for chemically analyzing a test piece
JP2543243B2 (ja) * 1990-09-05 1996-10-16 株式会社京都第一科学 検体自動分析装置
JP2601075B2 (ja) * 1991-10-21 1997-04-16 株式会社日立製作所 試験片を用いる分析方法および分析装置
JP2771367B2 (ja) * 1991-11-14 1998-07-02 株式会社日立製作所 試験片供給装置およびそれを用いた分析装置
JP2812625B2 (ja) * 1992-10-19 1998-10-22 株式会社日立製作所 液体試料自動分析装置
EP2040079B1 (fr) * 2007-09-19 2009-05-20 F. Hoffman-la Roche AG Procédé de marquage destiné au marquage de déchet d'éléments test

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50106692A (fr) * 1974-01-29 1975-08-22
US4204610A (en) * 1976-09-15 1980-05-27 Jacob Schlaepfer & Co. Ag Method of filling blind holes in a stencil
JPS5631538A (en) * 1979-08-20 1981-03-30 Tokico Ltd Method for filling gas in gas spring
JPS5782769A (en) * 1980-11-10 1982-05-24 Hitachi Ltd Automatic analyzing device
JPS581387A (ja) * 1981-06-25 1983-01-06 Sanyo Electric Co Ltd サンプリングクロツク再生回路
JPS59779A (ja) * 1982-06-28 1984-01-05 Nec Corp デ−タ照合システム

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50106692A (fr) * 1974-01-29 1975-08-22
US4204610A (en) * 1976-09-15 1980-05-27 Jacob Schlaepfer & Co. Ag Method of filling blind holes in a stencil
JPS5631538A (en) * 1979-08-20 1981-03-30 Tokico Ltd Method for filling gas in gas spring
JPS5782769A (en) * 1980-11-10 1982-05-24 Hitachi Ltd Automatic analyzing device
JPS581387A (ja) * 1981-06-25 1983-01-06 Sanyo Electric Co Ltd サンプリングクロツク再生回路
JPS59779A (ja) * 1982-06-28 1984-01-05 Nec Corp デ−タ照合システム

Also Published As

Publication number Publication date
JPS6191571A (ja) 1986-05-09

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Legal Events

Date Code Title Description
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