JPH04127547A - Ｌｓｉ実装構造体 - Google Patents

Ｌｓｉ実装構造体

Info

Publication number
JPH04127547A
JPH04127547A JP2249170A JP24917090A JPH04127547A JP H04127547 A JPH04127547 A JP H04127547A JP 2249170 A JP2249170 A JP 2249170A JP 24917090 A JP24917090 A JP 24917090A JP H04127547 A JPH04127547 A JP H04127547A
Authority
JP
Japan
Prior art keywords
wire
pads
lsi
micropins
solder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2249170A
Other languages
English (en)
Inventor
Chikayuki Kato
加藤　周幸
Seiichi Nishino
西野　誠一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2249170A priority Critical patent/JPH04127547A/ja
Publication of JPH04127547A publication Critical patent/JPH04127547A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10—Bump connectors ; Manufacturing methods related thereto
    • H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/11—Manufacturing methods
    • H01L2224/111—Manufacture and pre-treatment of the bump connector preform
    • H01L2224/1111—Shaping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/11—Manufacturing methods
    • H01L2224/111—Manufacture and pre-treatment of the bump connector preform
    • H01L2224/1112—Applying permanent coating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/11—Manufacturing methods
    • H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/11334—Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/11—Manufacturing methods
    • H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/1134—Stud bumping, i.e. using a wire-bonding apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10—Bump connectors; Manufacturing methods related thereto
    • H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161—Disposition
    • H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/013—Alloys
    • H01L2924/0132—Binary Alloys
    • H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341—Surface mounted components
    • H05K3/3421—Leaded components

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はＬＳＩ実装構造体に関する。
〔従来の技術〕
従来のＬＳＩ実装構造体は、第２図に示すように、ＬＳ
Ｉチップ１に設けてＬＳＩチップ１の内部回路と接続す
るパッド６と、パッド６以外のＬＳＩチップ１の表面に
設けた保護膜２と、パッド６に金錫共晶合金層８を用い
て底部を接続した銅又は鉄ニツケル合金からなるマイク
ロピン５と、多層配線基板７の表面にマイクロピン５の
位置に対応して設け、且つ多層配線基板７の配線と接続
した電極３と、電極３の夫々に整合してマイクロピン５
の先端と電極３を接合する半田層４とを有して構成され
る。
〔発明が解決しようとする課題〕
この従来のＬＳＩ実装構造体は、温度変化によるＬＳＩ
チップと多層配線基板との間のストレスを緩和させるマ
イクロピンの形状が非常に複雑であり、機械加工しなけ
ればならないことから、線材を（例えば直径を０．１ｍ
ｍ以下には）細くできず、又、マイクロピンの製造には
金型等が必要になってくることからコストが高くなると
いう問題点があった。
〔課題を解決するための手段〕
本発明のＬＳＩ実装構造体は、ＬＳＩチップと、前記Ｌ
ＳＩチップ上に設けてＬＳＩチップの内部回路に接続し
たパッドと、前記パッド上に接合して設けた一端がボー
ル形状を有し他端を溶断した金属細線からなるマイクロ
ピンと、前記マイクロピンに接合して前記ＬＳＩチップ
を搭載した多層配線基板とを有する。
〔実施例〕
次に、本発明について図面を参照して説明する。
第１図は本発明の一実施例を示すＬＳＩ実装構造体の断
面図である。
第１図に示すように、配線を設けたセラミックやガラス
布エポキシ樹脂等の絶縁基板を積層して設けた多層配線
基板７と、多層配線基板７の表面に設けて配線と接続し
た電極３と、シリコン又は砒化ガリウム基板上に素子及
び配線を設けたＬＳＩチップ１と、ＬＳＩチップ１の表
面に設けて内部配線と接続したパッド６と、パッド６以
外のＬＳＩチップ１の表面に設けた保護膜２と、パッド
６上に半田層４又は金錫共晶合金を用いて一端を接合し
他端を電極３に半田層４を用いて接合することによりＬ
ＳＩチップ１を多層配線基板７上に実装するボール状端
部を有するマイクロピン５を有して構成される。
次に、マイクロピン５の製造方法について説明する。
マイクロピン５は通常ＩＣチップとＩＣパッケージとの
間の電気的接続に使用するボンディング線を用いる０例
えば線径２０〜５０μｍのＡｕ線の一端をボンダーと同
様なメカニズムにより電気トーチを用いＡｕボールをつ
くり、長さを２ｍｍ〜５ｍｍ程度にし他端を溶断する。
その後表面をＳｎ　：　Ｐｂ＝９　：　１の半田層で覆
う。
実装に際しては、パッド６の表面には、Ａｊ用特殊フラ
ックスが塗布されていて、マイクロピン５の表面の半田
層と接続することができる。パッド６はＴｉ−Ｐｔ−Ａ
ｕ層のバンプ構造として、半田層でマイクロピンを立て
る方法もあるがウェーハの歩留りが悪くコストが高くな
るのでパッド６はＡｊ！層にフラックスを塗布するのみ
でも良い、多層配線基板７上の電極３とは共晶半田によ
って接着させる。
本実施例では、マイクロピンの素材にＡｕ線を用いたが
Ｃｕ線を用いれば、約１．５倍の強度が得られ、位置精
度が得られやすいという効果がある。
また、Ａｕ線の代りにＡ、配線を用いても良い。
〔発明の効果〕
以上説明したように本発明は従来のボンダー技術を用い
て金属細線の一端をボール形状にした後他端を溶断し、
その回りを半田で覆ったマイクロピンをＬＳＩチップ回
路表面に形成された金属パッド上に整列させ、半田リフ
ローで接続固定したのでマイクロピンの製造工程が従来
技術の延長上で可能な為安価に出来、又、ボンディング
線の使用実績から線径も３０μｍ、２５μｍとかなり細
い径のビンも可能になり、より高密度配線が可能となる
という効果を有する。又、半田層でマイクロピンの表面
を覆うことから半田のフィレットが出来折曲げ強度が強
くなるという効果を有する。
【図面の簡単な説明】
第１図は本発明の一実施例を示すＬＳＩ実装構造体の断
面図、第２図は従来のＬＳＩ実装構造体の一例を示す断
面図である。 １・・・ＬＳＩチップ、２・・・保護膜、３・・・電極
、４・・・半田層、５・・・マイクロピン、６・・・パ
ッド、７・・・多層配線基板、８・・・金銭共晶合金層
。

Claims (1)

    【特許請求の範囲】
  1. ＬＳＩチップと、前記ＬＳＩチップ上に設けてＬＳＩチ
    ップの内部回路に接続したパッドと、前記パッド上に接
    合して設けた一端がボール形状を有し他端を溶断した金
    属細線からなるマイクロピンと、前記マイクロピンに接
    合して前記ＬＳＩチップを搭載した多層配線基板とを有
    することを特徴とするＬＳＩ実装構造体。
JP2249170A 1990-09-19 1990-09-19 Ｌｓｉ実装構造体 Pending JPH04127547A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2249170A JPH04127547A (ja) 1990-09-19 1990-09-19 Ｌｓｉ実装構造体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2249170A JPH04127547A (ja) 1990-09-19 1990-09-19 Ｌｓｉ実装構造体

Publications (1)

Publication Number Publication Date
JPH04127547A true JPH04127547A (ja) 1992-04-28

Family

ID=17188950

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2249170A Pending JPH04127547A (ja) 1990-09-19 1990-09-19 Ｌｓｉ実装構造体

Country Status (1)

Country Link
JP (1) JPH04127547A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6410854B1 (en) * 1995-11-20 2002-06-25 Koninklijke Philips Electronics N.V. Wire and solder arrangement of ease of wave soldering
US6504105B1 (en) * 1993-10-28 2003-01-07 International Business Machines Corporation Solder ball connections and assembly process
CN105070786A (zh) * 2015-07-28 2015-11-18 昆明物理研究所 一种抗高温氧化的读出电路引出电极及其制备方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6504105B1 (en) * 1993-10-28 2003-01-07 International Business Machines Corporation Solder ball connections and assembly process
US6410854B1 (en) * 1995-11-20 2002-06-25 Koninklijke Philips Electronics N.V. Wire and solder arrangement of ease of wave soldering
US6752310B2 (en) 1995-11-20 2004-06-22 Koninklijke Philips Electronics N.V. Electrically conductive wire
US6902097B2 (en) 1995-11-20 2005-06-07 Koninklijke Philips Electronics N.V. Electrically conductive wire
CN105070786A (zh) * 2015-07-28 2015-11-18 昆明物理研究所 一种抗高温氧化的读出电路引出电极及其制备方法

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