JPH0411893B2 - - Google Patents
Info
- Publication number
- JPH0411893B2 JPH0411893B2 JP57113308A JP11330882A JPH0411893B2 JP H0411893 B2 JPH0411893 B2 JP H0411893B2 JP 57113308 A JP57113308 A JP 57113308A JP 11330882 A JP11330882 A JP 11330882A JP H0411893 B2 JPH0411893 B2 JP H0411893B2
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- supply voltage
- test mode
- flop
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57113308A JPS593646A (ja) | 1982-06-30 | 1982-06-30 | 集積回路の電源電圧検知リセツト方式 |
| DE8383303140T DE3373759D1 (en) | 1982-06-09 | 1983-06-01 | One-chip semiconductor device incorporating a power-supply-potential detecting circuit with reset function |
| EP83303140A EP0096531B1 (en) | 1982-06-09 | 1983-06-01 | One-chip semiconductor device incorporating a power-supply-potential detecting circuit with reset function |
| US06/502,591 US4551841A (en) | 1982-06-09 | 1983-06-09 | One-chip semiconductor device incorporating a power-supply-potential detecting circuit with reset function |
| IE1358/83A IE54444B1 (en) | 1982-06-09 | 1983-06-09 | One-chip semicunductor device incorporating a power-seuuply-potential detecting circuit with reset function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57113308A JPS593646A (ja) | 1982-06-30 | 1982-06-30 | 集積回路の電源電圧検知リセツト方式 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS593646A JPS593646A (ja) | 1984-01-10 |
| JPH0411893B2 true JPH0411893B2 (enExample) | 1992-03-02 |
Family
ID=14608937
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57113308A Granted JPS593646A (ja) | 1982-06-09 | 1982-06-30 | 集積回路の電源電圧検知リセツト方式 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS593646A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61112427U (enExample) * | 1984-12-20 | 1986-07-16 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5238706B2 (enExample) * | 1972-07-22 | 1977-09-30 |
-
1982
- 1982-06-30 JP JP57113308A patent/JPS593646A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS593646A (ja) | 1984-01-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0056060B1 (en) | Data processing system | |
| JP3520662B2 (ja) | 電子コントロールユニットの監視装置 | |
| EP0377455B1 (en) | Test mode switching system for LSI | |
| US20070294583A1 (en) | Device and Method for Analyzing Embedded Systems for Safety-Critical Computer Systems in Motor Vehicles | |
| US8046648B1 (en) | Method and apparatus for controlling operating modes of an electronic device | |
| US11714122B2 (en) | Semiconductor device and method of testing the same | |
| EP0721163A1 (en) | Information processing apparatus with a mode setting circuit | |
| JPH0411893B2 (enExample) | ||
| KR100253934B1 (ko) | 반도체 집적회로 | |
| JP2504502B2 (ja) | 集積回路カ―ド | |
| JPH02135589A (ja) | Icカードシステム | |
| JPS589965B2 (ja) | マイクロコンピュ−タ出力回路 | |
| JP2003016400A (ja) | 停電検知装置、及びその停電検知装置を備えたカードリーダ | |
| JPS58109957A (ja) | シングルチツプマイクロコンピユ−タシステム | |
| JPS59206951A (ja) | 制御記憶誤り検出回路の診断方式 | |
| JPS6261172B2 (enExample) | ||
| JP2536907B2 (ja) | 動作保証回路を有する診断用回路 | |
| JPS5911452A (ja) | パリテイチエツク回路の試験方式 | |
| JP3008914B2 (ja) | 半導体集積回路 | |
| JPH04252344A (ja) | コンピュータシステム | |
| JP2861001B2 (ja) | 入出力回路 | |
| KR100219567B1 (ko) | 자가 진단 테스트 장치 및 방법 | |
| JPH0320710B2 (enExample) | ||
| JPH08125024A (ja) | オンチップram試験システム | |
| JPS624746B2 (enExample) |