JPH039427B2 - - Google Patents

Info

Publication number
JPH039427B2
JPH039427B2 JP55063619A JP6361980A JPH039427B2 JP H039427 B2 JPH039427 B2 JP H039427B2 JP 55063619 A JP55063619 A JP 55063619A JP 6361980 A JP6361980 A JP 6361980A JP H039427 B2 JPH039427 B2 JP H039427B2
Authority
JP
Japan
Prior art keywords
clock
output
polyphase
multiphase
dut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP55063619A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56158965A (en
Inventor
Shunichi Usui
Osamu Nishijima
Makoto Yamatani
Reiji Nakao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP6361980A priority Critical patent/JPS56158965A/ja
Publication of JPS56158965A publication Critical patent/JPS56158965A/ja
Publication of JPH039427B2 publication Critical patent/JPH039427B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP6361980A 1980-05-13 1980-05-13 Measuring method for polyphase clock element Granted JPS56158965A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6361980A JPS56158965A (en) 1980-05-13 1980-05-13 Measuring method for polyphase clock element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6361980A JPS56158965A (en) 1980-05-13 1980-05-13 Measuring method for polyphase clock element

Publications (2)

Publication Number Publication Date
JPS56158965A JPS56158965A (en) 1981-12-08
JPH039427B2 true JPH039427B2 (enrdf_load_stackoverflow) 1991-02-08

Family

ID=13234507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6361980A Granted JPS56158965A (en) 1980-05-13 1980-05-13 Measuring method for polyphase clock element

Country Status (1)

Country Link
JP (1) JPS56158965A (enrdf_load_stackoverflow)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1011181B (it) * 1973-04-02 1977-01-20 Nordtool Ab Dispositivo levigatore per fresa
JPS597968B2 (ja) * 1975-06-09 1984-02-22 株式会社東芝 複数デジタル回路の同期方法
JPS5489487A (en) * 1977-12-27 1979-07-16 Fujitsu Ltd Measuring system of semicondcutor integrated circuit device

Also Published As

Publication number Publication date
JPS56158965A (en) 1981-12-08

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