JPH0388175U - - Google Patents

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Publication number
JPH0388175U
JPH0388175U JP14791989U JP14791989U JPH0388175U JP H0388175 U JPH0388175 U JP H0388175U JP 14791989 U JP14791989 U JP 14791989U JP 14791989 U JP14791989 U JP 14791989U JP H0388175 U JPH0388175 U JP H0388175U
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JP
Japan
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contact
board
contact member
bonding part
shot
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14791989U
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English (en)
Japanese (ja)
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JP2577525Y2 (ja
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Priority to JP1989147919U priority Critical patent/JP2577525Y2/ja
Publication of JPH0388175U publication Critical patent/JPH0388175U/ja
Application granted granted Critical
Publication of JP2577525Y2 publication Critical patent/JP2577525Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1989147919U 1989-12-23 1989-12-23 ショート・オープン検査装置 Expired - Lifetime JP2577525Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989147919U JP2577525Y2 (ja) 1989-12-23 1989-12-23 ショート・オープン検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989147919U JP2577525Y2 (ja) 1989-12-23 1989-12-23 ショート・オープン検査装置

Publications (2)

Publication Number Publication Date
JPH0388175U true JPH0388175U (enrdf_load_stackoverflow) 1991-09-09
JP2577525Y2 JP2577525Y2 (ja) 1998-07-30

Family

ID=31694390

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989147919U Expired - Lifetime JP2577525Y2 (ja) 1989-12-23 1989-12-23 ショート・オープン検査装置

Country Status (1)

Country Link
JP (1) JP2577525Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162430A (ja) * 2001-08-24 2002-06-07 Jsr Corp 回路基板検査用アダプター装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4849473A (enrdf_load_stackoverflow) * 1971-10-22 1973-07-12
JPS5441171U (enrdf_load_stackoverflow) * 1977-08-26 1979-03-19
JPS63275200A (ja) * 1987-05-07 1988-11-11 Fujitsu Ltd 多端子部品の位置合わせ方式

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4849473A (enrdf_load_stackoverflow) * 1971-10-22 1973-07-12
JPS5441171U (enrdf_load_stackoverflow) * 1977-08-26 1979-03-19
JPS63275200A (ja) * 1987-05-07 1988-11-11 Fujitsu Ltd 多端子部品の位置合わせ方式

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002162430A (ja) * 2001-08-24 2002-06-07 Jsr Corp 回路基板検査用アダプター装置

Also Published As

Publication number Publication date
JP2577525Y2 (ja) 1998-07-30

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