JPH0376021B2 - - Google Patents
Info
- Publication number
- JPH0376021B2 JPH0376021B2 JP57134159A JP13415982A JPH0376021B2 JP H0376021 B2 JPH0376021 B2 JP H0376021B2 JP 57134159 A JP57134159 A JP 57134159A JP 13415982 A JP13415982 A JP 13415982A JP H0376021 B2 JPH0376021 B2 JP H0376021B2
- Authority
- JP
- Japan
- Prior art keywords
- heat treatment
- semiconductor substrate
- treatment chamber
- semiconductor
- metal heat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/322—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections
- H01L21/3221—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Constitution Of High-Frequency Heating (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13415982A JPS5925229A (ja) | 1982-07-30 | 1982-07-30 | 半導体基板の加熱方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13415982A JPS5925229A (ja) | 1982-07-30 | 1982-07-30 | 半導体基板の加熱方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5925229A JPS5925229A (ja) | 1984-02-09 |
JPH0376021B2 true JPH0376021B2 (enrdf_load_stackoverflow) | 1991-12-04 |
Family
ID=15121836
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13415982A Granted JPS5925229A (ja) | 1982-07-30 | 1982-07-30 | 半導体基板の加熱方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5925229A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04127532A (ja) * | 1990-09-19 | 1992-04-28 | Nec Yamagata Ltd | 半導体ウェーハ熱処理方法 |
JP2011134836A (ja) * | 2009-12-24 | 2011-07-07 | Toshiba Corp | 裏面照射型撮像素子の製造方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57178316A (en) * | 1981-04-27 | 1982-11-02 | Hitachi Ltd | Manufacture of semiconductor element and device therefor |
-
1982
- 1982-07-30 JP JP13415982A patent/JPS5925229A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5925229A (ja) | 1984-02-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR0139793B1 (ko) | 막형성 방법 | |
KR100658235B1 (ko) | 대형 유리판의 코팅 및 어닐링 방법 | |
EP0473594B1 (en) | Method for depositing a layer on a substrate and also a processing system for that purpose | |
US5685949A (en) | Plasma treatment apparatus and method | |
KR101188574B1 (ko) | 절연막의 형성 방법 및 반도체 장치의 제조 방법 | |
US20020036066A1 (en) | Method and apparatus for processing substrates | |
JP3023982B2 (ja) | 成膜方法 | |
JPH01185176A (ja) | 静電吸着を用いた処理方法 | |
JP2002505531A5 (enrdf_load_stackoverflow) | ||
JPS5861635A (ja) | 半導体の処理方法 | |
WO2018163386A1 (ja) | 基板処理装置、半導体装置の製造方法およびプログラム | |
JPH10107018A (ja) | 半導体ウェーハの熱処理装置 | |
JP3204836B2 (ja) | プラズマ処理方法およびプラズマ処理装置 | |
JPH07147273A (ja) | エッチング処理方法 | |
JP2001332532A (ja) | レジストアッシング装置及び方法 | |
JP2636817B2 (ja) | 枚葉式薄膜形成法および薄膜形成装置 | |
JPH0376021B2 (enrdf_load_stackoverflow) | ||
EP0741909A1 (en) | Methods for improving semiconductor processing | |
JP2003059861A (ja) | 成膜方法および成膜装置 | |
JP2008283143A (ja) | 処理装置、トランジスタ製造方法 | |
CN113097047B (zh) | 灰化设备及灰化方法 | |
JPS6230686B2 (enrdf_load_stackoverflow) | ||
JPH05259153A (ja) | シリコン酸化膜の製造方法と製造装置 | |
JP2001267250A (ja) | 半導体製造装置 | |
JPS58101478A (ja) | 多結晶シリコン太陽電池の製造方法 |