JPH0363213B2 - - Google Patents

Info

Publication number
JPH0363213B2
JPH0363213B2 JP57209673A JP20967382A JPH0363213B2 JP H0363213 B2 JPH0363213 B2 JP H0363213B2 JP 57209673 A JP57209673 A JP 57209673A JP 20967382 A JP20967382 A JP 20967382A JP H0363213 B2 JPH0363213 B2 JP H0363213B2
Authority
JP
Japan
Prior art keywords
sample
data
electronic device
signal
background data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57209673A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5999732A (ja
Inventor
Kyomi Koyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57209673A priority Critical patent/JPS5999732A/ja
Publication of JPS5999732A publication Critical patent/JPS5999732A/ja
Publication of JPH0363213B2 publication Critical patent/JPH0363213B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57209673A 1982-11-30 1982-11-30 電子装置の電位分布測定装置 Granted JPS5999732A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57209673A JPS5999732A (ja) 1982-11-30 1982-11-30 電子装置の電位分布測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57209673A JPS5999732A (ja) 1982-11-30 1982-11-30 電子装置の電位分布測定装置

Publications (2)

Publication Number Publication Date
JPS5999732A JPS5999732A (ja) 1984-06-08
JPH0363213B2 true JPH0363213B2 (enrdf_load_stackoverflow) 1991-09-30

Family

ID=16576708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57209673A Granted JPS5999732A (ja) 1982-11-30 1982-11-30 電子装置の電位分布測定装置

Country Status (1)

Country Link
JP (1) JPS5999732A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9123504B2 (en) 2009-06-30 2015-09-01 Hitachi High-Technologies Corporation Semiconductor inspection device and semiconductor inspection method using the same

Also Published As

Publication number Publication date
JPS5999732A (ja) 1984-06-08

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