JPH0349160B2 - - Google Patents

Info

Publication number
JPH0349160B2
JPH0349160B2 JP59109463A JP10946384A JPH0349160B2 JP H0349160 B2 JPH0349160 B2 JP H0349160B2 JP 59109463 A JP59109463 A JP 59109463A JP 10946384 A JP10946384 A JP 10946384A JP H0349160 B2 JPH0349160 B2 JP H0349160B2
Authority
JP
Japan
Prior art keywords
circuit
transistor
defective
address
cmp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59109463A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60254499A (ja
Inventor
Masao Nakano
Yoshihiro Takemae
Tomio Nakano
Takeo Tatematsu
Norihisa Tsuge
Junji Ogawa
Takashi Horii
Yasuhiro Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59109463A priority Critical patent/JPS60254499A/ja
Priority to DE3588121T priority patent/DE3588121T2/de
Priority to EP85401065A priority patent/EP0163580B1/en
Priority to US06/739,159 priority patent/US4752914A/en
Priority to KR1019850003795A priority patent/KR900008191B1/ko
Publication of JPS60254499A publication Critical patent/JPS60254499A/ja
Publication of JPH0349160B2 publication Critical patent/JPH0349160B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Semiconductor Memories (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP59109463A 1984-05-31 1984-05-31 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置 Granted JPS60254499A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP59109463A JPS60254499A (ja) 1984-05-31 1984-05-31 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置
DE3588121T DE3588121T2 (de) 1984-05-31 1985-05-30 Halbleiterintegrierte Schaltung mit einer Ersatzredundanzschaltung
EP85401065A EP0163580B1 (en) 1984-05-31 1985-05-30 Semiconductor integrated circuit with redundant circuit replacement
US06/739,159 US4752914A (en) 1984-05-31 1985-05-30 Semiconductor integrated circuit with redundant circuit replacement
KR1019850003795A KR900008191B1 (ko) 1984-05-31 1985-05-31 대치 용장회로를 가진 반도체집적회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59109463A JPS60254499A (ja) 1984-05-31 1984-05-31 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置

Publications (2)

Publication Number Publication Date
JPS60254499A JPS60254499A (ja) 1985-12-16
JPH0349160B2 true JPH0349160B2 (enrdf_load_stackoverflow) 1991-07-26

Family

ID=14510866

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59109463A Granted JPS60254499A (ja) 1984-05-31 1984-05-31 記憶装置の作動状態の検査を行うことができる、冗長機能を有する半導体集積回路装置

Country Status (1)

Country Link
JP (1) JPS60254499A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2922060B2 (ja) * 1992-07-27 1999-07-19 富士通株式会社 半導体記憶装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59107497A (ja) * 1982-12-13 1984-06-21 Hitachi Ltd 冗長回路を備えた半導体記憶装置
JPS59112500A (ja) * 1982-12-18 1984-06-28 Mitsubishi Electric Corp 半導体メモリ装置
JPS59210596A (ja) * 1983-05-13 1984-11-29 Hitachi Ltd 半導体記憶装置

Also Published As

Publication number Publication date
JPS60254499A (ja) 1985-12-16

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