JPH0338549B2 - - Google Patents

Description

[Detailed Description of the Invention] [Industrial Application Field] This invention provides a component in which contacts for transmitting signals from a tester are provided on a plurality of lines through which components are moved, and each contact is opened and closed to transmit a test signal to the component. This is about testing equipment.

[Prior Art] Next, the configuration of a component testing device according to the prior art will be explained with reference to FIG. 1 in Figure 1 is a tester, 2A
and 2B are contacts, 3A to 3D are parts such as ICs, and 4A and 4B are lines for moving the parts 3A to 3D. Parts 3A, 3B and parts 3C, 3D
are moved in parallel.

A test signal is applied from the tester 1 to the contacts 2A and 2B. In Figure 1, contacts 2A, 2
B is closed and parts 3A and 3B are being tested, while parts 3C and 3D are on standby.

After testing parts 3A and 3B, open contacts 2A and 2B to free parts 3A and 3B.
Components 3A and 3B are moved to the next process on lines 4A and 4B. Then, the next parts 3C and 3D are moved to the positions of the contacts 2A and 2B, and the contacts 2A and 2B are closed.

Although FIG. 1 shows an example of two lines 4A and 4B, the number of lines may be increased if necessary.

When testing a large number of parts using the conventional apparatus shown in FIG.
sequentially controls the on/off of the signal.

The CPU 5 shown in FIG. 1 is for controlling these, and a flowchart when the conventional device shown in FIG. 1 is controlled by the CPU 5 will be explained with reference to FIG.

In step 11, parts 3A and 3B are placed on line 4.
When A and 4B reach the positions of contacts 2A and 2B, the CPU closes contacts 2A and 2B.
The command comes from 5. In step 12, CPU5
sends a test start signal to tester 1, and the test signal from tester 1 is transmitted from contacts 2A and 2B to component 3.
Added to A and 3B.

In step 13, the test progresses based on the test signal from the tester 1, and the CPU 5 confirms whether or not the test completion signal has been output from the tester 1. Step 14
Now, when the test completion signal is output from the tester 1, a command is issued from the CPU 5 to open the contacts 2A and 2B.

In step 15, the test results of parts 3A and 3B in steps 11 to 14 are checked to see if there are any imperfections, such as data not being obtained due to contact failure of contacts 2A and 2B, and whether to retest. judge whether

In step 16, if a retest is necessary, steps 11 to 14 are repeated again, and the CPU 5 confirms whether the second test has been completed.

In step 17, when steps 11 to 16 are completed, parts 3A and 3B are sent to the next process, and part 3
A command is issued from the CPU 5 to lines 4A and 4B to move C and 3D to the positions of contacts 2A and 2B.

When parts 3C and 3D come to the positions of contacts 2A and 2B, parts 3C and 3D are moved in steps 11 to 16.
3D and then continue testing part 3 by repeating the same procedure.

[Problem to be Solved by the Invention] In step 15, for example, if part 3A does not require retesting but part 3B requires retesting, in FIG. 1 lines 4A and 4B are operated in parallel, so
Step 11 also for parts 3A that do not require retesting.
Repeat steps 16 to 16. Therefore, it takes time to test a large number of parts 3.

The purpose of this invention is to increase the operating rate of tests for parts 3A to 3D by having the CPU 5 control the retest checks for parts 3A and 3B and the movement of parts 3A and 3B by lines 4A and 4B for each part. shall be.

[Means for Solving the Problems] In order to achieve this object, the present invention includes a plurality of lines installed in parallel for moving parts, and a plurality of lines installed in the lines and opened and closed with respect to the parts. The component testing device is composed of a contact, a tester that sends a test signal to the contact, and a CPU that controls the tester, the contact, and the line, and the CPU checks the retest for the component and performs the test. It has a function of controlling the movement of the parts along the lines based on the check results for each part.

[Example] Next, a flowchart of an example according to the present invention will be explained with reference to FIG. Step 21 in Figure 3
Steps 11 to 24 are the same as steps 11 to 14 in FIG. 2, respectively.

In step 25, the test result of the part 3A is checked and it is determined whether to perform the retest. Step 25 is similar to step 15 of FIG. 2, except that step 25 makes a determination regarding portion 3A.

In step 26, the CPU 5 confirms whether the retest has been completed for the part 3A.

In step 27, if there is no need to retest in step 25, or if it is confirmed that the retest has been completed in step 26, the part 3A is sent to the next process and the next part 3C is moved to the position of the contact 2A. A command is issued from CPU5.

In the next steps 28-30, a procedure similar to steps 25-27 is repeated for part 3B. That is, in FIG. 3, when the testing of parts 3A and 3B is completed, it is checked whether retesting is necessary first for part 3A and then for part 3B. Step 30 if you need to retake the test
Then return to step 21. At this time, if only one of them needs to be retested, only the part 3A or 3B that needs to be retested is left and the next part 3C or 3D is moved to the position of the contacts 2A, 2B.

Next, the time chart shown in FIG. 3 will be explained with reference to FIG. 4. _T1 in FIG. 4 corresponds to step 22,
Start testing parts 3A and 3B. T ₂ corresponds to steps 23 and 24 and opens contacts 2A and 2B. Assume that T ₃ corresponds to step 25, and part 3A does not need to be retested. T ₄ is step 28
Therefore, it is assumed that part 3B needs to be retested. _T5 corresponds to step 27, sending part 3A to the next process and sending the next part 3C to contact 2A.
move it to the position. At this time, component 3B remains at contact 2B for retesting. T ₆ is the start of the next test, and parts 3B and 3C are tested.

In other words, parts 3A and 3B are checked individually in steps 25 and 28, and parts that do not require retesting are sent to the next process regardless of the test results of adjacent parts, and parts that require retesting are left in the same position. left behind.

In the next step, if there are any parts that need to be retested, the parts left for retesting and the newly delivered parts are tested.

[Effect of the invention] According to this invention, the CPU 5 is connected to the parts 3A and 3B.
Retest check for lines 4A and 4B
Since the movement of parts 3A and 3B is controlled for each part, it is possible to increase the operating rate of tests for parts 3A to 3D.

[Brief explanation of the drawing]

FIG. 1 is a configuration diagram of a component testing device according to the prior art, FIG. 2 is a flowchart of FIG. 1, FIG. 3 is a flowchart of an embodiment of the present invention, and FIG. 4 is a time chart of FIG. 3. . 1...Tester, 2A, 2B...Contact, 3
A~3D...Parts, 4A, 4B...Line, 5...
…CPU.

Claims (1)

[Scope of Claims] 1. A plurality of lines installed in parallel for moving parts, a plurality of contacts provided on the lines and opened and closed with respect to the parts, and a tester that sends test signals to the contacts, The component testing device is composed of a CPU that controls the tester, the contacts, and the line, and the CPU checks the retest for the component and moves the component through the line based on the check result. A component testing device characterized by having a function of controlling each component.