JPS58158565A - Inspection of logic circuit - Google Patents

Inspection of logic circuit

Info

Publication number
JPS58158565A
JPS58158565A JP4077882A JP4077882A JPS58158565A JP S58158565 A JPS58158565 A JP S58158565A JP 4077882 A JP4077882 A JP 4077882A JP 4077882 A JP4077882 A JP 4077882A JP S58158565 A JPS58158565 A JP S58158565A
Authority
JP
Japan
Prior art keywords
probe
inspection
logic circuit
internal circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4077882A
Other languages
Japanese (ja)
Inventor
Kiyoshi Numata
Tomonori Saito
Katsuhiko Takeda
Tomoji Sakuyama
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP4077882A priority Critical patent/JPS58158565A/en
Publication of JPS58158565A publication Critical patent/JPS58158565A/en
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits

Abstract

PURPOSE:To obtain an inexpensive apparatus also capable of detecting troubles in a complicated logic circuit by positioning a probe in contact with each node in an internal circuit according to inspection information. CONSTITUTION:The positions of probes P1 and P2 are controlled sequentially corresponding to the sequence of an inspection pattern with a probe position indicating control block 5. The probe P1 is connected to an inspection pattern application block 2 and operates to render the internal circuit 4b of a logic circuit 4 to be tested direct under a specified condition. The probe P2 is connected to a comparison block 3 to function as probe for direct testing without introducing the output of the internal circuit 4b of the logic circuit 4. Thus, this invention enables simultaneous accessing of the internal circuit in cooperation with an inspection from an input/output terminal thereby realizing a high trouble detection capacity with an inexpensive equipment in an inspection of a complicated logic circuit being tested.
JP4077882A 1982-03-17 1982-03-17 Inspection of logic circuit Granted JPS58158565A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4077882A JPS58158565A (en) 1982-03-17 1982-03-17 Inspection of logic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4077882A JPS58158565A (en) 1982-03-17 1982-03-17 Inspection of logic circuit

Publications (1)

Publication Number Publication Date
JPS58158565A true JPS58158565A (en) 1983-09-20

Family

ID=12590079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4077882A Granted JPS58158565A (en) 1982-03-17 1982-03-17 Inspection of logic circuit

Country Status (1)

Country Link
JP (1) JPS58158565A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0196083A2 (en) * 1985-03-26 1986-10-01 Kabushiki Kaisha Toshiba Logic circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0196083A2 (en) * 1985-03-26 1986-10-01 Kabushiki Kaisha Toshiba Logic circuit

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