JPS58127178A - Parts tester - Google Patents

Abstract

PURPOSE:To send parts requiring no retesting to the subsequent process irrelevant to the results of adjacent parts by separately controlling the opening or closing of a number of contacts and the operation of a plurality of lines. CONSTITUTION:The opening or closing of contacts 2A and 2B and the operation of lines 4A and 4B are controlled separately. A time T1 indicates the starting of testing parts 3A and 3B corresponding to a certain step. At the subsequent step T2, the contacts 2A and 2B are opened and at the next step T3, the part 3A is checked to ensure that the retesting thereof is not required while at the step T4, the part 3B is checked to ensure that the retesting sthereof is required. At the step T5, the part 3A is sent to the subsequent process and the subsequent part 3C is shifted to the position of the contact 2A. In this case, the part 3B is made to standby as it is for retesting. At the step T6, the parts 3B and 3C are tested. This can raise the operating rate of testings.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a component testing device in which a plurality of lines for moving components are provided with contact lines for transmitting signals from a tester, and each contact is opened and closed to transmit a test signal to the component. It is something.

An example of the configuration of a conventional device is shown in FIG. In the figure, 1 is a tester,
2 and 2B are contacts, and 38 to 3D are parts such as ICs. 4A and 4B are the moving lines for parts 6A to 6D, parts 3A and 6B and parts 6C and 6D.
are moved in parallel.

Contact) Add test No. 48 from Tester 1 to 2A and 2B. In Figure 1, contact 2 is connected to parts 6A and 3B.
Person 2B is closed and testing is in progress, and parts 6C and 3D=z are on standby.

After testing parts 6A and 3B, two contacts and 2B
Open parts 6A and 3B, and line 4A and 4B.
The parts 3A and 6B are then moved to the next process. and,
Move the parts 6C and 311 to the positions of the contacts 2A and 2B, and close the contacts 2 and 2B.

Although FIG. 1 shows an example of two lines 4A and 4B, the number of lines may be increased if necessary.

When testing a large number of parts using the conventional apparatus as shown in FIG.
In many cases, the opening/closing of the contacts 2A and 2B and the on/off of the signal of the tester 1 are all controlled sequentially. CP of the figure
U5 is for controlling these things, and an example of a flowchart when controlling the conventional device shown in FIG. 1 with the CPU 5 is shown in FIG.
As shown in the figure.

In step 11, when parts 6A and 6B come to the position of contacts 2 and 2B by lines 4A and 4B, contact 2
This indicates that the CPU 5 issues a command to close Person 2B.

Step 12 indicates sending a test start signal from the CPU 5 to the tester 1, and the test signal from the tester 1 is applied to the parts 6A and 3B via the contacts 2A and 28.

In step 16, the test progresses according to the test signal from the tester 1, and the CPU checks whether the test completion signal has been output from the tester 1.
5 indicates to confirm.

Step 14 indicates that when the test completion signal is output from the tester 1, a command is issued from the CPU 5 to open the contacts 2/2B.

Step 15 is parts 6A and 6 according to steps 11 to 14.
This indicates that the test result of B is checked to see if there are any imperfections, such as missing data due to poor contact between contacts 2A and 2B, and a decision is made as to whether or not to conduct the test again.

Step 16 indicates that if a retest is necessary, steps 11 to 14 are repeated again, and the CPU 5 confirms whether the second test has been completed.

In step 17, when the work in steps 11 to 16 is completed, parts 6A and 3B are sent to the primary process, and parts 6C and 3D are sent to the primary process.
y2 contacts/CPU to move to position 2B
5 indicates that commands are issued to lines 4A and 4B.

When parts 6C and 3D contact) 2A and 2B, go to steps 11 to 16, f: 9 parts 6C and 3D 2
Then, the same procedure is repeated to continue testing part B.

By the way, in the retest check in step 15, a case may occur in which, for example, part 3A does not need to be retested, but part 6B may need to be retested. In such a case, in the conventional device shown in FIG.
Since part 4B is operated in parallel, steps 11 to 16 are also repeated for part 6A, which does not require retesting. Therefore, there is a problem in that it takes a considerable amount of time to test a large number of parts 6.

This invention is based on the opening/closing of contactors 2A and 2B and the line 4A.
- In order to control the operation of 4B individually, parts that do not require retesting are sent to the next process regardless of the results of neighboring parts.

Next, a 70-chart of an embodiment according to the present invention is shown in FIG. Steps 21-24 in FIG. 6 correspond to steps 11-14 in FIG. 2.

Step 25 indicates checking the test results of the part 6A and determining whether to retest. Step 25 is similar to step 15 in FIG. 2, but the difference is that step 25 makes a determination regarding part 6A.

5- Step 26 indicates that the CPU 5 confirms whether the retest has been completed for the part 3A.

In step 27, if there is no need to retest in step 25, or if it is confirmed that the retest has been completed in step 26, the part 6A is sent to the next process and the next part 3C is contacted) to the position of 2A. This indicates that a command to move is issued from the CPU 5.

The next steps 28 to 60 indicate that the same steps as steps 25 to 27 are followed for part 3B.

That is, in FIG. 6, when the testing of parts 6A and 6B is completed, it is checked whether retesting is necessary first for part 6A and then for part 6B. and,
Step 60 to Step 2 if you need to retake the test
Return to 1. At this time, if only one of them needs to be retested, leave only the part 3A or 3B that needs to be retested and contact the next part 6C or 3D) 2A.
It will be moved to position 2B.

Next, an example of the time chart of FIG. 6 is shown in FIG. 4. T1 in the diagram corresponds to step 22, and parts 3A and 6B
Indicates that the test will start. T2 is step 23.2
4, open 2 contacts/2B. It is assumed that T6 corresponds to step 25 and that part 6A does not need to be retested. It is assumed that T4 corresponds to step 28 and part 3B needs to be retested. T5 corresponds to step 27, in which the part 6A is sent to the next process and the next part 6c is moved to the position of the contact 2A. In this case, part 6B
will remain in the same position for the retest.

T6 is the start of the next test, and parts 6B and 6C are tested.

That is, step 25 and step 2 for retesting.
At step 8, parts 3A and 3B are checked individually, and those that cannot be retested are sent to the next process regardless of the test results of adjacent parts. In the next step, if there are any parts that need to be retested, the remaining parts for retesting and the newly sent parts that do not require retesting are tested.

As mentioned above, the retest check for parts 6A and 6B of this invention and the part 6A according to lines 4A and 4B.
- Since the movement of 6B is individually controlled, there is an effect that the operating rate of the test for parts 6A to 6D can be increased.

[Brief explanation of drawings]

FIG. 1 is a configuration example of a conventional device, FIG. 2 is an example flowchart of FIG. 1, FIG. 6 is a flowchart of an embodiment according to the present invention, and FIG. 4 is an example of a time chart of FIG. 6. 1...Tester, 2A/2B...Contact, 6A-6D...Parts, 4A/4B...
...Line, 5...CPU. Agent Patent Attorney Kinji Omata Figure 1 Figure 2

Claims (1)

[Claims] 1. A plurality of lines (4) installed in parallel for the movement of the component (6); a plurality of contacts (2) provided in each line (41) that open and close with respect to the component +31; a tester (1) that sends a test signal to the contact (2);
In a component testing device that has a tester mountain, each contact Q), and a CPU t51 that controls each line 4), and tests a component t31 moving on each line +41, the following steps are performed: A component testing device characterized in that movement of components (3) through line 4) is individually controlled.