JPH0337682B2 - - Google Patents

Info

Publication number
JPH0337682B2
JPH0337682B2 JP57134792A JP13479282A JPH0337682B2 JP H0337682 B2 JPH0337682 B2 JP H0337682B2 JP 57134792 A JP57134792 A JP 57134792A JP 13479282 A JP13479282 A JP 13479282A JP H0337682 B2 JPH0337682 B2 JP H0337682B2
Authority
JP
Japan
Prior art keywords
light beam
line
lead
along
bend
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57134792A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5870110A (ja
Inventor
Shiii Rangurei Denisu
Teii Buretsuka Toomasu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MAIKURO KONHOONENTO TEKUNOROJII Inc
Original Assignee
MAIKURO KONHOONENTO TEKUNOROJII Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MAIKURO KONHOONENTO TEKUNOROJII Inc filed Critical MAIKURO KONHOONENTO TEKUNOROJII Inc
Publication of JPS5870110A publication Critical patent/JPS5870110A/ja
Publication of JPH0337682B2 publication Critical patent/JPH0337682B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP57134792A 1981-08-03 1982-08-03 リ−ド整列状態検査装置 Granted JPS5870110A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US28992181A 1981-08-03 1981-08-03
US289921 1981-08-03

Publications (2)

Publication Number Publication Date
JPS5870110A JPS5870110A (ja) 1983-04-26
JPH0337682B2 true JPH0337682B2 (enExample) 1991-06-06

Family

ID=23113744

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57134792A Granted JPS5870110A (ja) 1981-08-03 1982-08-03 リ−ド整列状態検査装置

Country Status (1)

Country Link
JP (1) JPS5870110A (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4510806A (en) * 1983-04-27 1985-04-16 Universal Instruments Corporation Gauging method and apparatus for components having leads
JPS6076134A (ja) * 1983-09-30 1985-04-30 Nec Kansai Ltd 軸状部材の外観検査装置
JPS60213041A (ja) * 1984-04-09 1985-10-25 Sanwa Electron Kk Ｉｃのピンの状態検出装置
JPS60229355A (ja) * 1984-04-27 1985-11-14 Sanwa Electron Kk Ｉｃのピンの状態検出方法
JPS60229356A (ja) * 1984-04-27 1985-11-14 Sanwa Electron Kk Ｉｃのピンの曲がり検出方法
JPS6174346A (ja) * 1984-09-19 1986-04-16 Kokusai Syst Sci Kk Ｄｉｐタイプのデバイス検査方法
US4696047A (en) * 1985-02-28 1987-09-22 Texas Instruments Incorporated Apparatus for automatically inspecting electrical connecting pins
JPS61279146A (ja) * 1985-06-05 1986-12-09 Nhk Spring Co Ltd 電子部品の脚片の不良検出装置
JPS61283200A (ja) * 1985-06-10 1986-12-13 国際システムサイエンス株式会社 Ｉｃのピン曲りチエツカ−
DE3689406T2 (de) * 1985-10-11 1994-06-16 Hitachi Keiyo Eng Verfahren zur Plazierung eines oberflächenmontierten Teiles und eine Vorrichtung dazu.
US5189707A (en) * 1985-10-11 1993-02-23 Hitachi, Ltd. Method of loading surface mounted device and an apparatus therefor
JPH0815178B2 (ja) * 1987-02-09 1996-02-14 ダックエンジニアリング株式会社 Ｉｃ外観検査方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5365071A (en) * 1976-11-22 1978-06-10 Nec Corp External lead bend detector of electronic parts
JPS5663275A (en) * 1979-10-30 1981-05-29 Nec Kyushu Ltd Lead testing device for semiconductor device

Also Published As

Publication number Publication date
JPS5870110A (ja) 1983-04-26

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