JPH0334908Y2 - - Google Patents

Info

Publication number
JPH0334908Y2
JPH0334908Y2 JP1986165081U JP16508186U JPH0334908Y2 JP H0334908 Y2 JPH0334908 Y2 JP H0334908Y2 JP 1986165081 U JP1986165081 U JP 1986165081U JP 16508186 U JP16508186 U JP 16508186U JP H0334908 Y2 JPH0334908 Y2 JP H0334908Y2
Authority
JP
Japan
Prior art keywords
lead frame
inspection
inspection device
contact
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1986165081U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6371534U (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986165081U priority Critical patent/JPH0334908Y2/ja
Priority to US07/082,097 priority patent/US4851902A/en
Priority to GB8722303A priority patent/GB2197948B/en
Publication of JPS6371534U publication Critical patent/JPS6371534U/ja
Application granted granted Critical
Publication of JPH0334908Y2 publication Critical patent/JPH0334908Y2/ja
Priority to SG313/93A priority patent/SG31393G/en
Expired legal-status Critical Current

Links

Landscapes

  • Lead Frames For Integrated Circuits (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1986165081U 1986-10-29 1986-10-29 Expired JPH0334908Y2 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP1986165081U JPH0334908Y2 (fr) 1986-10-29 1986-10-29
US07/082,097 US4851902A (en) 1986-10-29 1987-08-05 Auatomatic inspection system for IC lead frames and visual inspection method thereof
GB8722303A GB2197948B (en) 1986-10-29 1987-09-22 Automatic inspection system for and electro-optic methods of inspection of ic lead frames
SG313/93A SG31393G (en) 1986-10-29 1993-03-22 Automatic inspection system for an electro-optic methods of inspection of ic lead frames

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986165081U JPH0334908Y2 (fr) 1986-10-29 1986-10-29

Publications (2)

Publication Number Publication Date
JPS6371534U JPS6371534U (fr) 1988-05-13
JPH0334908Y2 true JPH0334908Y2 (fr) 1991-07-24

Family

ID=31094793

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986165081U Expired JPH0334908Y2 (fr) 1986-10-29 1986-10-29

Country Status (1)

Country Link
JP (1) JPH0334908Y2 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2769199B2 (ja) * 1989-08-07 1998-06-25 富士通株式会社 半導体装置の製造方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132539A (fr) * 1974-09-06 1976-03-19 Susumu Ito
JPS5415008A (en) * 1977-07-04 1979-02-03 Daishowa Eng Kk Recovery of chemicals solution in waste paper treating procedure
JPS55163869A (en) * 1979-06-08 1980-12-20 Mitoshi Ishii Detection of bent of aligning direction of ic tie bar residue and lead wire
JPS562276B2 (fr) * 1976-09-20 1981-01-19
JPS58214844A (ja) * 1982-05-24 1983-12-14 バリアン・アソシエイツ・インコ−ポレイテツド ウエフアの欠落又は破損を検出する装置
JPS594063A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 多端子リ−ドの検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS562276U (fr) * 1979-06-19 1981-01-10

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132539A (fr) * 1974-09-06 1976-03-19 Susumu Ito
JPS562276B2 (fr) * 1976-09-20 1981-01-19
JPS5415008A (en) * 1977-07-04 1979-02-03 Daishowa Eng Kk Recovery of chemicals solution in waste paper treating procedure
JPS55163869A (en) * 1979-06-08 1980-12-20 Mitoshi Ishii Detection of bent of aligning direction of ic tie bar residue and lead wire
JPS58214844A (ja) * 1982-05-24 1983-12-14 バリアン・アソシエイツ・インコ−ポレイテツド ウエフアの欠落又は破損を検出する装置
JPS594063A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 多端子リ−ドの検査方法

Also Published As

Publication number Publication date
JPS6371534U (fr) 1988-05-13

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