JPH0328400Y2 - - Google Patents

Info

Publication number
JPH0328400Y2
JPH0328400Y2 JP8282382U JP8282382U JPH0328400Y2 JP H0328400 Y2 JPH0328400 Y2 JP H0328400Y2 JP 8282382 U JP8282382 U JP 8282382U JP 8282382 U JP8282382 U JP 8282382U JP H0328400 Y2 JPH0328400 Y2 JP H0328400Y2
Authority
JP
Japan
Prior art keywords
ray
shutter
rays
calibration
guide hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8282382U
Other languages
English (en)
Japanese (ja)
Other versions
JPS58184655U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8282382U priority Critical patent/JPS58184655U/ja
Priority to FR8308504A priority patent/FR2528266B1/fr
Priority to DE19833319984 priority patent/DE3319984A1/de
Priority to GB8315135A priority patent/GB2121168B/en
Priority to NL8301987A priority patent/NL8301987A/nl
Publication of JPS58184655U publication Critical patent/JPS58184655U/ja
Priority to US06/780,966 priority patent/US4962517A/en
Priority to HK73390A priority patent/HK73390A/xx
Application granted granted Critical
Publication of JPH0328400Y2 publication Critical patent/JPH0328400Y2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Toxicology (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP8282382U 1982-06-03 1982-06-03 Ｘ線自動較正装置 Granted JPS58184655U (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP8282382U JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置
FR8308504A FR2528266B1 (fr) 1982-06-03 1983-05-24 Dispositif de correction automatique de rayons x
DE19833319984 DE3319984A1 (de) 1982-06-03 1983-06-01 Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet
GB8315135A GB2121168B (en) 1982-06-03 1983-06-02 X-ray device
NL8301987A NL8301987A (nl) 1982-06-03 1983-06-03 Correctie-inrichting voor roentgenstralen.
US06/780,966 US4962517A (en) 1982-06-03 1985-09-25 Automatic X-ray correction device
HK73390A HK73390A (en) 1982-06-03 1990-09-13 X-ray device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8282382U JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置

Publications (2)

Publication Number Publication Date
JPS58184655U JPS58184655U (ja) 1983-12-08
JPH0328400Y2 true JPH0328400Y2 (da) 1991-06-18

Family

ID=13785118

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8282382U Granted JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置

Country Status (6)

Country Link
JP (1) JPS58184655U (da)
DE (1) DE3319984A1 (da)
FR (1) FR2528266B1 (da)
GB (1) GB2121168B (da)
HK (1) HK73390A (da)
NL (1) NL8301987A (da)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3731973A1 (de) * 1987-09-23 1989-04-13 Helmut Fischer Gmbh & Co Vorrichtung zur stabilisierung fuer roentgenfluoreszenzschichtdicken-messgeraete und verfahren hierzu
JPH0744967Y2 (ja) * 1988-11-17 1995-10-11 セイコー電子工業株式会社 蛍光ｘ線膜厚計
FR2721789A1 (fr) * 1994-06-24 1995-12-29 Ge Medical Syst Sa Appareil d'irradiation comprenant des moyens de mesure de l'exposition.
EP0781992B1 (en) * 1995-12-21 2006-06-07 Horiba, Ltd. Fluorescence X-ray analyzer
JP5839284B2 (ja) * 2012-05-01 2016-01-06 アースニクス株式会社 γ線反射型計測装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
DE3062151D1 (en) * 1979-02-09 1983-04-07 Martin Marietta Corp Element analysis unit
JPS5758300U (da) * 1980-09-22 1982-04-06

Also Published As

Publication number Publication date
HK73390A (en) 1990-09-21
FR2528266A1 (fr) 1983-12-09
GB8315135D0 (en) 1983-07-06
JPS58184655U (ja) 1983-12-08
GB2121168B (en) 1986-02-19
FR2528266B1 (fr) 1988-07-08
NL8301987A (nl) 1984-01-02
DE3319984A1 (de) 1983-12-08
GB2121168A (en) 1983-12-14

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