JPH0325229Y2 - - Google Patents

Info

Publication number
JPH0325229Y2
JPH0325229Y2 JP8149085U JP8149085U JPH0325229Y2 JP H0325229 Y2 JPH0325229 Y2 JP H0325229Y2 JP 8149085 U JP8149085 U JP 8149085U JP 8149085 U JP8149085 U JP 8149085U JP H0325229 Y2 JPH0325229 Y2 JP H0325229Y2
Authority
JP
Japan
Prior art keywords
diagnostic
clock
data
circuit
external input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8149085U
Other languages
English (en)
Japanese (ja)
Other versions
JPS61196345U (es
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8149085U priority Critical patent/JPH0325229Y2/ja
Publication of JPS61196345U publication Critical patent/JPS61196345U/ja
Application granted granted Critical
Publication of JPH0325229Y2 publication Critical patent/JPH0325229Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP8149085U 1985-05-30 1985-05-30 Expired JPH0325229Y2 (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8149085U JPH0325229Y2 (es) 1985-05-30 1985-05-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8149085U JPH0325229Y2 (es) 1985-05-30 1985-05-30

Publications (2)

Publication Number Publication Date
JPS61196345U JPS61196345U (es) 1986-12-08
JPH0325229Y2 true JPH0325229Y2 (es) 1991-05-31

Family

ID=30628320

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8149085U Expired JPH0325229Y2 (es) 1985-05-30 1985-05-30

Country Status (1)

Country Link
JP (1) JPH0325229Y2 (es)

Also Published As

Publication number Publication date
JPS61196345U (es) 1986-12-08

Similar Documents

Publication Publication Date Title
JP2628105B2 (ja) 集積回路およびその集積回路をテストする方法
JPS62186629A (ja) 情報授受システム
US4926425A (en) System for testing digital circuits
US4692691A (en) Test system for keyboard interface circuit
JPH0325229Y2 (es)
JPS63503481A (ja) マルチモードカウンタ回路網
US4982403A (en) Electrical circuit testing device and circuit comprising the said device
JPH06311127A (ja) ディジタルデータ調停装置
JPS61155874A (ja) 大規模集積回路の故障検出方法およびそのための装置
US5513187A (en) Process for testing integrated circuits with at least one logic circuit and testable integrated circuit
JP3090053B2 (ja) 回路データ用モニタ装置
JP2877505B2 (ja) Lsi実装ボード及びデータ処理装置
JPH0512063A (ja) 論理回路設計装置
JPS61286770A (ja) 故障診断装置
JPS6379121A (ja) クロツク分配システム
JPS6144342B2 (es)
JPS6225211B2 (es)
JP3125950B2 (ja) 特定用途向け集積回路
JP2815041B2 (ja) Lsi内部状態確認回路
JPH054041Y2 (es)
JPH0746123B2 (ja) 集積回路の試験方式
JPH0748192B2 (ja) 記憶装置
JPS63310211A (ja) クロック障害検出回路
JPH0477685A (ja) Lsiテストモニタ回路
JPH0289300A (ja) 半導体メモリ素子