JPH0323707Y2 - - Google Patents
Info
- Publication number
- JPH0323707Y2 JPH0323707Y2 JP1986077757U JP7775786U JPH0323707Y2 JP H0323707 Y2 JPH0323707 Y2 JP H0323707Y2 JP 1986077757 U JP1986077757 U JP 1986077757U JP 7775786 U JP7775786 U JP 7775786U JP H0323707 Y2 JPH0323707 Y2 JP H0323707Y2
- Authority
- JP
- Japan
- Prior art keywords
- input
- gate
- multiplexer
- delay
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 26
- 230000010355 oscillation Effects 0.000 claims description 25
- 238000012937 correction Methods 0.000 claims description 19
- 238000005259 measurement Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Pulse Circuits (AREA)
- Manipulation Of Pulses (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986077757U JPH0323707Y2 (de) | 1986-05-22 | 1986-05-22 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986077757U JPH0323707Y2 (de) | 1986-05-22 | 1986-05-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62188824U JPS62188824U (de) | 1987-12-01 |
JPH0323707Y2 true JPH0323707Y2 (de) | 1991-05-23 |
Family
ID=30926063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986077757U Expired JPH0323707Y2 (de) | 1986-05-22 | 1986-05-22 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0323707Y2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008053914A (ja) * | 2006-08-23 | 2008-03-06 | Advantest Corp | 遅延回路、試験装置、プログラム、半導体チップ、イニシャライズ方法、および、イニシャライズ回路 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6068713A (ja) * | 1983-09-26 | 1985-04-19 | Nec Corp | タイミング調整回路 |
JPS60167519A (ja) * | 1984-02-10 | 1985-08-30 | Hitachi Ltd | 半導体遅延回路 |
-
1986
- 1986-05-22 JP JP1986077757U patent/JPH0323707Y2/ja not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6068713A (ja) * | 1983-09-26 | 1985-04-19 | Nec Corp | タイミング調整回路 |
JPS60167519A (ja) * | 1984-02-10 | 1985-08-30 | Hitachi Ltd | 半導体遅延回路 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008053914A (ja) * | 2006-08-23 | 2008-03-06 | Advantest Corp | 遅延回路、試験装置、プログラム、半導体チップ、イニシャライズ方法、および、イニシャライズ回路 |
Also Published As
Publication number | Publication date |
---|---|
JPS62188824U (de) | 1987-12-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR0184041B1 (ko) | 반도체 시험장치의 측정 신호의 타이밍 교정 방법 및 그 회로 | |
US6469493B1 (en) | Low cost CMOS tester with edge rate compensation | |
EP1000364B1 (de) | Kostengünstiges cmos testgerät mit hoher kanaldichte | |
US5854797A (en) | Tester with fast refire recovery time | |
US5204559A (en) | Method and apparatus for controlling clock skew | |
US4458165A (en) | Programmable delay circuit | |
KR100218125B1 (ko) | 타이밍 신호 발생 회로 | |
JP2000332583A (ja) | 遅延信号生成装置および半導体試験装置 | |
JP4310036B2 (ja) | タイミング信号発生回路、及び、それを備えた半導体検査装置 | |
JPH08505992A (ja) | ジッタを防止したフェイズロックドループの周波数合成用再トリガ・オシレータ | |
TW201021423A (en) | Delay circuit, timing generator using the delay circuit, and test device | |
JPH0323707Y2 (de) | ||
JP2813188B2 (ja) | Ic試験装置 | |
KR19980703081A (ko) | 지연시간 측정방법 및 이 방법의 실시에 사용하는 지연시간측정용 펄스발생장치 | |
WO2006041063A1 (ja) | タイミング発生器、及び試験装置 | |
JPH0812574B2 (ja) | 集積回路装置 | |
JPH06124138A (ja) | クロック調整方式 | |
JP3691112B2 (ja) | 半導体集積回路 | |
JPH082623Y2 (ja) | 遅延量測定回路 | |
JP4412775B2 (ja) | 遅延信号生成装置およびその遅延量を調整する方法 | |
JPS6316712A (ja) | パルス発生器のタイミング自動補正方法 | |
JPH0575447A (ja) | タイミング校正方式 | |
JPH06188700A (ja) | 可変遅延回路の校正方式 | |
JPS62265579A (ja) | テスト回路 | |
JPH0477696A (ja) | 遅延時間測定装置 |