JPH0318732B2 - - Google Patents
Info
- Publication number
- JPH0318732B2 JPH0318732B2 JP59222010A JP22201084A JPH0318732B2 JP H0318732 B2 JPH0318732 B2 JP H0318732B2 JP 59222010 A JP59222010 A JP 59222010A JP 22201084 A JP22201084 A JP 22201084A JP H0318732 B2 JPH0318732 B2 JP H0318732B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- alignment
- mask
- image
- imageable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7049—Technique, e.g. interferometric
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59222010A JPS61100931A (ja) | 1984-10-24 | 1984-10-24 | 縮小投影式アライメント方法 |
| US06/684,292 US4668089A (en) | 1983-12-26 | 1984-12-20 | Exposure apparatus and method of aligning exposure mask with workpiece |
| EP84115889A EP0148477B1 (en) | 1983-12-26 | 1984-12-20 | Exposure apparatus and method of aligning exposure mask with workpiece |
| DE8484115889T DE3485022D1 (de) | 1983-12-26 | 1984-12-20 | Belichtungsvorrichtung und verfahren fuer die ausrichtung einer maske mit einem arbeitsstueck. |
| KR1019840008344A KR900001269B1 (ko) | 1983-12-26 | 1984-12-26 | 노출 마스크와 대상물을 얼라인먼트하는 노출장치 및 그 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59222010A JPS61100931A (ja) | 1984-10-24 | 1984-10-24 | 縮小投影式アライメント方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61100931A JPS61100931A (ja) | 1986-05-19 |
| JPH0318732B2 true JPH0318732B2 (enExample) | 1991-03-13 |
Family
ID=16775689
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59222010A Granted JPS61100931A (ja) | 1983-12-26 | 1984-10-24 | 縮小投影式アライメント方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61100931A (enExample) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6146024A (ja) * | 1984-08-10 | 1986-03-06 | Hitachi Ltd | アライメント方法 |
-
1984
- 1984-10-24 JP JP59222010A patent/JPS61100931A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61100931A (ja) | 1986-05-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |