JPH027530B2 - - Google Patents

Info

Publication number
JPH027530B2
JPH027530B2 JP58062052A JP6205283A JPH027530B2 JP H027530 B2 JPH027530 B2 JP H027530B2 JP 58062052 A JP58062052 A JP 58062052A JP 6205283 A JP6205283 A JP 6205283A JP H027530 B2 JPH027530 B2 JP H027530B2
Authority
JP
Japan
Prior art keywords
signal
skew
flip
predetermined value
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58062052A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59186415A (ja
Inventor
Robaato Paamukisuto Suchiibun
Kentaro Takita
Kazumi Hasegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Tektronix Inc
Original Assignee
Sony Tektronix Corp
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp, Tektronix Inc filed Critical Sony Tektronix Corp
Priority to JP58062052A priority Critical patent/JPS59186415A/ja
Priority to US06/594,187 priority patent/US4646297A/en
Publication of JPS59186415A publication Critical patent/JPS59186415A/ja
Publication of JPH027530B2 publication Critical patent/JPH027530B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58062052A 1983-04-08 1983-04-08 スキユ−検出器 Granted JPS59186415A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58062052A JPS59186415A (ja) 1983-04-08 1983-04-08 スキユ−検出器
US06/594,187 US4646297A (en) 1983-04-08 1984-03-28 Skew detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58062052A JPS59186415A (ja) 1983-04-08 1983-04-08 スキユ−検出器

Publications (2)

Publication Number Publication Date
JPS59186415A JPS59186415A (ja) 1984-10-23
JPH027530B2 true JPH027530B2 (enEXAMPLES) 1990-02-19

Family

ID=13188989

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58062052A Granted JPS59186415A (ja) 1983-04-08 1983-04-08 スキユ−検出器

Country Status (2)

Country Link
US (1) US4646297A (enEXAMPLES)
JP (1) JPS59186415A (enEXAMPLES)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4739277A (en) * 1986-03-03 1988-04-19 Tektronix, Inc. Triggered, programmable skew signal generator
US5436908A (en) * 1992-06-17 1995-07-25 National Semiconductor Corporation Common edge output skew detection circuit
JPH06251096A (ja) * 1993-02-24 1994-09-09 Nec Ic Microcomput Syst Ltd タイミング検証回路
FR2710800B1 (fr) * 1993-09-27 1995-12-15 Sgs Thomson Microelectronics Ligne à retard numérique.
FR2711286B1 (fr) * 1993-10-11 1996-01-05 Sgs Thomson Microelectronics Dispositif de surveillance du déphasage entre deux signaux d'horloge.
US5446650A (en) * 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction
US5526286A (en) * 1994-02-16 1996-06-11 Tektronix, Inc. Oversampled logic analyzer
JP3387379B2 (ja) * 1997-09-01 2003-03-17 富士通株式会社 パラレルデータスキュー検出回路
US6374371B1 (en) * 1998-03-18 2002-04-16 Micron Technology, Inc. Method and apparatus for monitoring component latency drifts
KR100305678B1 (ko) * 1998-12-08 2001-11-30 윤종용 반도체장치의테스터
US6304104B1 (en) 1999-09-13 2001-10-16 Rambus, Inc. Method and apparatus for reducing worst case power
WO2002091283A1 (en) * 2001-05-03 2002-11-14 Coreoptics, Inc. Method and apparatus for compensating for timing variances in digital data transmission channels
US7260755B2 (en) * 2005-03-03 2007-08-21 International Business Machines Corporation Skewed inverter delay line for use in measuring critical paths in an integrated circuit
US7352167B2 (en) * 2006-03-24 2008-04-01 Tektronix, Inc. Digital trigger
US11341002B1 (en) 2020-10-01 2022-05-24 Cadence Design Systems, Inc. Differential clock skew detector

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4044329A (en) * 1976-07-02 1977-08-23 Honeywell Information Systems, Inc. Variable cyclic redundancy character detector
JPS5854756A (ja) * 1981-09-28 1983-03-31 Hitachi Ltd 多重伝送システムの信号診断方法およびその診断装置
US4556947A (en) * 1982-08-23 1985-12-03 Motorola, Inc. Bi-directional switching circuit

Also Published As

Publication number Publication date
JPS59186415A (ja) 1984-10-23
US4646297A (en) 1987-02-24

Similar Documents

Publication Publication Date Title
US4878209A (en) Macro performance test
US6996032B2 (en) BIST circuit for measuring path delay in an IC
JPH027530B2 (enEXAMPLES)
US20080061766A1 (en) System and method for testing integrated circuit timing margins
US6865698B2 (en) Method and apparatus for testing semiconductor devices
EP0527366A1 (en) Variable delay circuit
JPH0815380A (ja) 半導体集積回路装置
US6215345B1 (en) Semiconductor device for setting delay time
KR20010024360A (ko) 집적회로 테스터용 포맷 민감성 타이밍 교정
US7216271B2 (en) Testing apparatus and a testing method
US6449738B1 (en) Apparatus for bus frequency independent wrap I/O testing and method therefor
JP2985056B2 (ja) Ｉｃ試験装置
JP2000090693A (ja) メモリ試験装置
US7495429B2 (en) Apparatus and method for test, characterization, and calibration of microprocessor-based and digital signal processor-based integrated circuit digital delay lines
JP3519329B2 (ja) 半導体試験装置
JP3558228B2 (ja) 半導体試験方法およびこれを実施する装置
US11514958B2 (en) Apparatus and method for operating source synchronous devices
JP3060580B2 (ja) メモリ搭載パッケージの検査装置
JP3061650B2 (ja) Ｉｃテスターの発生パルスモニタ回路
JP3165131B2 (ja) 半導体集積回路のテスト方法及びテスト回路
JP2920998B2 (ja) 半導体集積回路
JPH0673227B2 (ja) 磁気デイスク特性測定装置
JPH0325880B2 (enEXAMPLES)
JPH0519024A (ja) 集積回路の試験方式
JPH0536752B2 (enEXAMPLES)