JPH02660B2 - - Google Patents
Info
- Publication number
- JPH02660B2 JPH02660B2 JP54171019A JP17101979A JPH02660B2 JP H02660 B2 JPH02660 B2 JP H02660B2 JP 54171019 A JP54171019 A JP 54171019A JP 17101979 A JP17101979 A JP 17101979A JP H02660 B2 JPH02660 B2 JP H02660B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- threshold value
- width
- comparator
- outputted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17101979A JPS5694248A (en) | 1979-12-28 | 1979-12-28 | Detector for foreign matter on surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17101979A JPS5694248A (en) | 1979-12-28 | 1979-12-28 | Detector for foreign matter on surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5694248A JPS5694248A (en) | 1981-07-30 |
| JPH02660B2 true JPH02660B2 (cg-RX-API-DMAC7.html) | 1990-01-09 |
Family
ID=15915575
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17101979A Granted JPS5694248A (en) | 1979-12-28 | 1979-12-28 | Detector for foreign matter on surface |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5694248A (cg-RX-API-DMAC7.html) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58151544A (ja) * | 1982-03-05 | 1983-09-08 | Nippon Jido Seigyo Kk | 暗視野像による欠陥検査装置 |
| JPS58223328A (ja) * | 1982-06-22 | 1983-12-24 | Toshiba Corp | マスク欠陥検査装置 |
| JPS60209187A (ja) * | 1984-07-17 | 1985-10-21 | Matsushita Graphic Commun Syst Inc | 固体撮像素子の検査装置 |
| DE3929549C1 (en) * | 1989-09-06 | 1991-02-14 | Fa. Carl Zeiss, 7920 Heidenheim, De | Sensitive measurer for light dispersed on optical component - has time-window discriminator blocking detector |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4957887A (cg-RX-API-DMAC7.html) * | 1972-09-30 | 1974-06-05 | ||
| JPS50143590A (cg-RX-API-DMAC7.html) * | 1974-05-08 | 1975-11-19 |
-
1979
- 1979-12-28 JP JP17101979A patent/JPS5694248A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5694248A (en) | 1981-07-30 |
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